IP Library Granted Patent US 7,977,948
Granted Patent B2
US 7,977,948 · App. 11/959,922 · Granted Jul 12, 2011

Sensor device and method thereof

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Quick Facts
Patent No.
US 7,977,948
App. No.
11/959,922
Granted
Jul 12, 2011
Kind
B2
Abstract

A sensor device determines a value based on a sensed parameter by applying a voltage across two voltage terminals of a sensor. In response, the sensor provides an electrical signal representative of a sensed parameter to a controller via a pair of conductors. The controller samples the electrical signal to determine the value. In addition, the controller alternates the polarity of the voltage applied to the voltage terminals, thereby reducing the risk of damage to the conductors due to ion drift.

Claims (59)

1. A method, comprising:

sampling a signal provided by a sensor via a pair of conductors during a first phase of a first sampling period to obtain a first sample, the signal representative of a sensed parameter;

sampling the signal during a second phase of the first sampling period to obtain a second sample;

applying a first voltage of a first polarity across first and second voltage supply terminals of the sensor for the first phase;

applying a second voltage of a second polarity across the first and second voltage supply terminals for the second phase;

applying a third voltage having a magnitude substantially equal to zero across the first and second voltage supply terminals during a third phase of the first sampling period, the third phase between the first and second phases; and

determining a first value based on the first sample and the second sample, the first value representative of the sensed parameter during the first sampling period.

2. The method of claim 1 , wherein the second phase is after the first, and further comprising:

sampling the signal during a third phase of a second sampling period to obtain a third sample, the second sampling period after the first;

sampling the signal during a fourth phase of the second sampling period to obtain a fourth sample, the fourth phase after the third;

applying a third voltage of the second polarity across the first and second voltage supply terminals of the sensor for the third phase;

applying a fourth voltage of the first polarity across the first and second voltage supply terminals of the sensor during the fourth phase; and

determining a second value based on the third sample and the fourth sample, the second value representative of the sensed parameter during the second sampling period.

3. The method of claim 1 , wherein the second sampling period succeeds the first sampling period.

4. The method of claim 1 , wherein the pair of conductors are bond wires.

5. The method of claim 1 , wherein a magnitude of the first voltage is substantially equal to a magnitude of the second voltage.

6. The method of claim 1 , wherein the sensor comprises a plurality of resistive elements, a resistive value of each of the plurality of resistive elements varying based on the sensed parameter.

7. The method of claim 1 , wherein the sensed parameter is pressure.

8. The method of claim 1 , wherein the pair of conductors are in an electrically conductive environment during the first sampling period.

9. A method, comprising:

applying a first voltage to a first voltage supply terminal of a sensor for a first phase of a sampling period and a second voltage to a second voltage supply terminal of the sensor for the first phase, a voltage difference between the first voltage and the second voltage having a first polarity;

receiving a signal indicative of a sensed parameter via a pair of conductors;

sampling the signal during the first phase of the sampling period to obtain a first sample;

applying a third voltage to the first voltage supply terminal for a second phase of the sampling period and a fourth voltage to the second voltage supply terminal for the second phase, a difference between the third voltage and the fourth voltage having a second polarity opposite to the first polarity;

applying a fifth voltage to the first voltage supply terminal and to the second voltage supply terminal during a third phase, the third phase between the first phase and the second phase;

sampling the signal during the second phase of the sampling period to obtain a second sample; and

determining a value representative of the sensed parameter during the sampling period based on the first and second samples.

10. The method of claim 9 , wherein the fourth voltage is substantially the same as the first voltage and the third voltage is substantially the same as the second voltage.

11. A device comprising:

a sensor comprising:

a first voltage supply terminal;

a second voltage supply terminal;

a first output coupled to a first conductor, the first output configured to provide a first voltage based on a sensed parameter;

a second output coupled to a second conductor, the second output configured to provide a second voltage based on the sensed parameter; and

a sampling module comprising a first input coupled to the first conductor and a second input coupled to the second conductor, the sampling module configured to:

sample a signal during a first phase of a first sampling period to obtain a first sample, the signal based on a difference between the first voltage and the second voltage;

sample the signal during a second phase of the first sampling period to obtain a second sample; and

determine a first value based on the first sample and the second sample, the first value representative of the sensed parameter during the first sampling period; and

a voltage control module configured to apply a voltage of a first polarity across the first and second voltage supply terminals for the first phase, and to apply a voltage of a second polarity across the first and second voltage supply terminals during the second phase and to apply a voltage across the first and second voltage supply terminals having a substantially zero magnitude during a third phase, the third phase between the first and second phases.

12. The device of claim 11 , wherein the second phase is after the first and wherein:

the sampling module is further configured to:

sample the signal during a third phase of a second sampling period to obtain a third sample;

sample the signal during a fourth phase of the second sampling period to obtain a fourth sample, the fourth phase after the third; and

determine a second value based on the third sample and the fourth sample, the second value representative of the sensed parameter during the second sampling period; and

the voltage control module is further configured to apply a voltage of the second polarity across the first and second voltage supply terminals for the third phase, and to apply a voltage of the second polarity across the first and second voltage supply terminals for the fourth phase.

13. The device of claim 11 , wherein the sampling module further comprises:

a differential amplifier comprising a first input coupled to the first output of the sensor, a second output coupled to the second output of the sensor, and an output; and

an analog-to-digital converter comprising an input coupled to the output of the differential amplifier and an output configured to provide a digital value based on a voltage at the input.

14. The device of claim 11 , wherein the voltage control module comprises:

a first switch comprising a first input configured to receive a first reference voltage, a second input configured to receive a second reference voltage, a control input, and an output coupled to the first voltage supply terminal of the sensor, the output configured to selectively provide the first reference voltage or the second reference voltage based on a signal received at the control input;

a second switch comprising a first input configured to receive the first reference voltage, a second input configured to receive the second reference voltage, a control input, and an output coupled to the second voltage supply terminal of the sensor, the output configured to selectively provide the first reference voltage or the second reference voltage based on a signal received at the control input;

a control module comprising an output coupled to the control input of the first switch and to the control input of the second switch, the control module configured to provide a control signal at the output so that the first voltage is applied to the first voltage terminal during the first period and the second voltage is applied to the second voltage terminal during the first period.

15. The device of claim 11 , wherein the first voltage terminal and the second voltage terminal comprise bond pads of an integrated circuit device.

16. The device of claim 11 , wherein the sensor is in an electrically conductive environment during the first sampling period.

17. The device of claim 11 , wherein the sensor further comprises:

a first resistive element comprising a first terminal coupled to the first voltage supply terminal and a second terminal coupled to the first output;

a second resistive element comprising a first terminal coupled to the first output and a second terminal coupled to the second voltage supply terminal;

a third resistive element comprising a first terminal coupled to the second voltage supply terminal and a second terminal coupled to the second output; and

a fourth resistive element comprising a first terminal coupled to the second output and a second terminal coupled to the first voltage supply terminal.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
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From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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