IP Library Granted Patent US 7,795,113
Granted Patent B2
US 7,795,113 · App. 11/963,487 · Granted Sep 14, 2010

Method for bonding a die or substrate to a carrier

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,795,113
App. No.
11/963,487
Granted
Sep 14, 2010
Kind
B2
Abstract

A method is disclosed for bonding two elements by means of a bonding agent such as a glue layer, wherein the bonding agent is removable, and wherein between the bonding agent and at least one element, a sacrificial layer is applied which is selectively removable with respect to that element. According to embodiments, the elements comprise a die or a substrate bonded to a carrier wafer. The nature and type of the die or substrate and of the carrier can vary within the scope of embodiments of the invention. Also disclosed is a composite substrate obtainable by methods of the invention.

Claims (18)

1. A method for bonding and releasing a first element to and from a second element, the method comprising:

providing a first element having a main surface;

providing a sacrificial layer on the main surface of the first element, the sacrificial layer being selectively removable with respect to the first element;

providing a second element having a main surface;

applying a removable attachment layer on top of the sacrificial layer or on top of the main surface of the second element;

bonding the first element to the second element by contacting one element to the removable attachment layer present on the other element, thereby obtaining a composite substrate;

subjecting the composite substrate to a temperature increase, wherein the first and second elements are released or become easily releasable due to a phase change of the removable attachment layer; and

removing the sacrificial layer by an etching agent or a solvent after the release of the first and second elements, thereby also removing residues left from the removable attachment layer.

2. The method according to claim 1 , wherein the first element is a die or substrate, and the second element is a carrier wafer.

3. The method according to claim 1 , wherein the sacrificial layer is removable by selective etching with respect to the first element.

4. The method according to claim 1 , wherein the sacrificial layer is soluble in a solvent.

5. The method according to claim 1 , wherein the sacrificial layer is isotropically etchable.

6. The method according to claim 1 , wherein the removable attachment layer is removable through its decomposition from a solid to a non-solid state, wherein the decomposition is obtained by a thermal process or by illumination.

7. The method according to claim 1 , further comprising providing an etch-stop layer on the main surface of the first element, wherein the sacrificial layer is applied over the etch-stop layer.

8. The method according to claim 1 , further comprising planarizing the removable attachment layer before bonding.

9. The method according to claim 1 , further comprising thinning the first element after bonding the first element to the second element.

10. The method according to claim 9 , wherein the thinning is performed by chemical mechanical polishing, grinding or etching.

11. The method according to claim 9 , wherein the first element is a die or substrate, and wherein the die or substrate has a thickness greater than about 50 μm before thinning and less than about 50 μm after thinning.

Assignments (2)
"IMEC" IS AN ALTERNATIVE OFFICIAL NAME FOR "INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW" Recorded Apr 7, 2010
From: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW
To: IMEC
Reel/Frame 024200/0675 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2008
From: SWINNEN, BART; BEYNE, ERIC
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW (IMEC)
Reel/Frame 020620/0430 →