IP Library Granted Patent US 7,680,248
Granted Patent B2
US 7,680,248 · App. 11/972,352 · Granted Mar 16, 2010

X-ray tube and X-ray analyzing apparatus

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Quick Facts
Patent No.
US 7,680,248
App. No.
11/972,352
Granted
Mar 16, 2010
Kind
B2
Abstract

To be able to achieve further small-sized formation and light-weighted formation and to promote a sensitivity by further efficiently detecting a fluorescent X-ray or the like in an X-ray tube and an X-ray analyzing apparatus, there are provided a vacuum cabinet 2 inside of which is brought into a vacuum state and which includes a window portion 1 formed by an X-ray transmitting film through which an X-ray can be transmitted, an electron beam source 3 installed at inside of the vacuum cabinet 2 for emitting an electron beam e, a target T generating a primary X-ray X 1 by being irradiated with the electron beam e and installed at inside of the vacuum cabinet 2 to be able to emit the primary X-ray X 1 to an outside sample S by way of the window portion 1 , and an X-ray detecting element 4 arranged at inside of the vacuum cabinet 2 to be able to detect a fluorescent X-ray and a scattered X-ray X 2 emitted from the sample S and incident from the window portion 1 for outputting a signal including energy information of the fluorescent X-ray and the scattered X-ray X 2.

Claims (29)

1. An X-ray tube comprising:

a vacuum cabinet inside of which is brought into a vacuum state and which includes a window portion formed by an X-ray transmitting film through which an X-ray is transmitted;

an electron beam source installed at inside of the vacuum cabinet for emitting an electron beam;

a target for generating a primary X-ray by being irradiated with the electron beam and installed at inside of the vacuum cabinet to be able to emit the primary X-ray to an outside sample by way of the window portion, wherein at least one of the target and the window portion is set to a ground potential or a plus potential; and

an X-ray detecting element arranged at inside of the vacuum cabinet for detecting a fluorescent X-ray and a scattered X-ray emitted from the sample and incident from the window portion for outputting a signal including energy information of the fluorescent X-ray and the scattered X-ray.

2. The X-ray tube according to claim 1 , wherein the target is arranged proximate to or brought into contact with the window portion; and

wherein a light receiving face of the X-ray detecting element is arranged at a surrounding of the target.

3. The X-ray tube according to claim 1 , wherein the X-ray detecting element includes a transmission hole which is arranged at a region between the electron beam source and the target and through which the electron beam is transmitted.

4. The X-ray tube according to claim 1 , wherein a shutter extractable and retractable to and from a path of the electron beam is provided between the electron beam source and the target.

5. The X-ray tube according to claim 1 , wherein a shield member for shielding a radiation heat from the electron beam source is arranged between the electron beam source and the X-ray detecting element.

6. An X-ray analyzing apparatus comprising:

a X-ray tube comprising:

a vacuum cabinet inside of which is brought into a vacuum state and which includes a window portion formed by an X-ray transmitting film through which an X-ray is transmitted;

an electron beam source installed at inside of the vacuum cabinet for emitting an electron beam;

a target for generating a primary X-ray by being irradiated with the electron beam and installed at inside of the vacuum cabinet to be able to emit the primary X-ray to an outside sample by way of the window portion; and

an X-ray detecting element arranged at inside of the vacuum cabinet for detecting a fluorescent X-ray and a scattered X-ray emitted from the sample and incident from the window portion for outputting a signal including energy information of the fluorescent X-ray and the scattered X-ray;

an analyzer for analyzing the signal; and

a display portion for displaying a result of analysis of the analyzer.

7. The X-ray analyzing apparatus according to claim 6 , wherein the analyzer and the display portion are provided in the vacuum cabinet to constitute a portable type.

8. An X-ray tube comprising:

a vacuum cabinet inside of which is brought into a vacuum state and which includes a window portion formed by an X-ray transmitting film through which an X-ray is transmitted;

an electron beam source installed at inside of the vacuum cabinet for emitting an electron beam;

a target for generating a primary X-ray by being irradiated with the electron beam and installed at inside of the vacuum cabinet to be able to emit the primary X-ray to an outside sample by way of the window portion; and

an X-ray detecting element arranged at inside of the vacuum cabinet for detecting a fluorescent X-ray and a scattered X-ray emitted from the sample and incident from the window portion for outputting a signal including energy information of the fluorescent X-ray and the scattered X-ray, wherein the X-ray detecting element comprises a transmission hole which is arranged at a region between the electron beam source and the target and through which the electron beam is transmitted.

9. The X-ray tube according to claim 8 , wherein the target is arranged proximate to or brought into contact with the window portion; and

wherein a light receiving face of the X-ray detecting element is arranged at a surrounding of the target.

10. The X-ray tube according to claim 8 , wherein at least one of the target and the window portion is set to a ground potential or a plus potential.

11. The X-ray tube according to claim 8 , wherein a shutter extractable and retractable to and from a path of the electron beam is provided between the electron beam source and the target.

12. The X-ray tube according to claim 8 , wherein a shield member for shielding a radiation heat from the electron beam source is arranged between the electron beam source and the X-ray detecting element.

Assignments (2)
CHANGE OF NAME Recorded Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2008
From: MATOBA, YOSHIKI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 020705/0536 →