IP Library Granted Patent US 8,612,919
Granted Patent B2
US 8,612,919 · App. 11/986,564 · Granted Dec 17, 2013

Model-based design verification

Inventors: Fedor G. Pikus (Beaverton, OR); David A. Abercrombie (Sherwood, OR)
Assignee: Mentor Graphics Corporation
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Quick Facts
Patent No.
US 8,612,919
App. No.
11/986,564
Granted
Dec 17, 2013
Kind
B2
Abstract

An analog design-rule-check tool analyzes a microdevice design, such as an integrated circuit design, to identify occurrences of geometric elements that share a specified relationship. When the tool identifies such an occurrence of these geometric elements, it will associate or “cluster” these geometric elements together into an identifiable unit. For specified “clusters” of geometric elements, the analog design-rule-check tool will then determine the value of a measurement or measurements required by a user. Once the analog design-rule-check tool has determined the necessary measurement values, it will use those values to evaluate the function describing a model.

Claims (48)

1. A method of processing microdevice layout design data, comprising:

with a computer, analyzing microdevice layout design data to identify instances of a first type of geometric element, identify instances of a second type of geometric element, and for identified instances of the first type of geometric element,

determine if the identified instance of the first type of geometric element shares the defined relationship with one or more instances of the second type of geometric element, and

when the instance of the first type of geometric element shares a defined relationship with one or more instances of the second type of geometric element in the microdevice layout design data, then creating a cluster data object associating the instance of the first type of geometric element with the one or more instances of the second type of geometric element.

2. The method recited in claim 1 , further comprising

receiving measurement input data defining a measurement obtained from one or more characteristics of the first type of geometric element or the second type of geometric element; and

for a cluster data object, determining a value of the measurement from one or more instances of the geometric elements in the cluster data object.

3. The method recited in claim 1 , wherein the relationship is selected from the group consisting of: intersecting, overlapping, abutting, electrically connected, inside of a bounding box, and a combination thereof.

4. The method recited in claim 1 , wherein:

the first type of geometric element is occurrences of a category of geometric elements having one or more specified attributes, or

the second type of geometric element is occurrences of a category of geometric elements having one or more specified attributes.

5. The method recited in claim 1 , further comprising:

receiving third feature input data identifying a third type of geometric element in the layout design data;

receiving second relationship input data defining a relationship between occurrences of the first type of geometric element and the third type of geometric element, or between occurrences of the second type of geometric element and the third type of geometric element;

analyzing microdevice layout design data to

identify instances of the third type of geometric element, and

for identified instances of the third type of geometric element,

determine if the identified instance of the third type of geometric element shares the defined relationship with one or more instances of geometric elements included in a cluster data object, and

if the instance of the third type of geometric element shares the defined relationship with one or more instances of geometric element in the cluster data object, then associate the instance of the third type of geometric element with the cluster data object.

6. A computer-readable storage medium having stored thereon a set of program instructions that are executable by a computer to perform the method recited in claim 1 .

7. A method of verifying a microdevice layout design, comprising:

with a computer, analyzing a microdevice layout design to identify instances of a first type of geometric element;

for identified instances of the first type of geometric element,

determining if the instance of the first type of geometric element shares a defined relationship with one or more instances of a second type of geometric element occurring in the microdevice layout design, and

if the instance of the first type of geometric element shares the defined relationship with one or more instances of the second type of geometric element, then associating the instance of the first type of geometric element with the one or more instances of the second type of geometric element;

for a specified instance of the first type of geometric element associated with one or more instances of the second type of geometric element, using a computer to determine a value of a measurement using one or more characteristics of the specified instance of the first type of geometric element or one or more instances of the second type of geometric element associated therewith;

using a computer to evaluate a model function using the value of the measurement determined for the specified instance of the first type of geometric element; and

characterizing the microdevice layout design based upon the evaluation of the model function.

8. The method recited in claim 7 , further comprising, for the specified instance of the first type of geometric element, adding a property data object to the microdevice layout design affiliating the determined value with the specified instance of the first type of geometric element.

9. The method recited in claim 7 , further comprising, for the specified instance of the first type of geometric element, determining a value of a second measurement using one or more second characteristics of the instance of the first type of geometric element or one or more of the instances of the second type of geometric element associated therewith.

10. The method recited in claim 7 , wherein:

the one or more characteristics are of an occurrence of the first type of geometric element relative to one or more occurrences of the second type of geometric element, or

the one or more characteristics are of one or more occurrences of the second type of geometric element relative to an occurrence of the first type of geometric element.

11. The method recited in claim 7 , further comprising separately evaluating the model function for each of a plurality of specified instances of the first type of geometric element, using the value of the measurement determined for that specified instance of the first type of geometric element.

12. The method recited in claim 7 , wherein the model function is a non-mathematical function.

13. The method recited in claim 7 , wherein the relationship is selected from the group consisting of: intersecting, overlapping, abutting, electrically connected, inside of a bounding box and a combination thereof.

14. The method recited in claim 7 , wherein

the first type of geometric element is occurrences of a category of geometric elements having one or more specified attributes, or

the second type of geometric element is occurrences of a category of geometric elements having one or more specified attributes.

15. The method recited in claim 7 , further comprising:

modifying the microdevice layout design based upon the evaluation of the model function.

16. A computer-readable storage medium having stored thereon a set of program instructions that are executable by a computer to perform the method comprising:

analyzing a microdevice layout design to identify instances of a first type of geometric element;

for identified instances of the first type of geometric element,

determining if the instance of the first type of geometric element shares a defined relationship with one or more instances of a second type of geometric element occurring in the microdevice layout design, and

if the instance of the first type of geometric element shares the defined relationship with one or more instances of the second type of geometric element, then associating the instance of the first type of geometric element with the one or more instances of the second type of geometric element;

for a specified instance of the first type of geometric element associated with one or more instances of the second type of geometric element, determining a value of a measurement using one or more characteristics of the specified instance of the first type of geometric element associated or one or more instances of the second type of geometric element associated therewith; and

evaluating a model function using the value of the measurement determined for the specified instance of the first type of geometric element.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Jun 2, 2021
From: MENTOR GRAPHICS CORPORATION; SIEMENS INDUSTRY SOFTWARE INC.
To: SIEMENS INDUSTRY SOFTWARE INC.
Reel/Frame 056510/0240 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 19, 2008
From: PIKUS, FEDOR G., MR.; ABERCROMBIE, DAVID A., MR.
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 020829/0046 →
Continuity (2)
Provisional Application 60866579 · Nov 20, 2006
Related Publication 20080189667A1 · Aug 7, 2008