IP Library Granted Patent US 7,532,304
Granted Patent B2
US 7,532,304 · App. 12/010,705 · Granted May 12, 2009

Lithographic apparatus and device manufacturing method

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,532,304
App. No.
12/010,705
Granted
May 12, 2009
Kind
B2
Abstract

Liquid is supplied to a space between the projection system of a lithographic apparatus and a substrate. A flow of gas towards a vacuum inlet prevents the humid gas from escaping to other parts of the lithographic apparatus. This may help to protect intricate parts of the lithographic apparatus from being damaged by the presence of humid gas.

Claims (49)

1. A lithographic apparatus, comprising:

an illumination system configured to condition a beam of radiation;

a support structure configured to hold a patterning device, the patterning device configured to pattern the beam of radiation according to a desired pattern;

a substrate table configured to hold a substrate;

a projection system configured to project the patterned beam onto a target portion of the substrate;

a liquid supply system configured to at least partly fill a space between the projection system and the substrate with a liquid; and

a gas flow port configured to create a flow of gas to at least remove humid gas in a space above and in contact with the liquid, the flow of gas not crossing a path of the patterned beam.

2. The apparatus according to claim 1 , wherein the gas flow port comprises a vacuum inlet.

3. The apparatus according to claim 2 , wherein the vacuum inlet removes gas in contact with the liquid.

4. The apparatus according to claim 2 , wherein the vacuum inlet also removes a contaminant from gas in contact with the liquid.

5. The apparatus according to claim 2 , wherein the vacuum inlet has an annular shape, the projection system being arranged at the center of the annular shape.

6. The apparatus according to claim 1 , wherein the gas flow port comprises a passage through which the flow of gas flows.

7. The apparatus according to claim 6 , wherein the passage is formed at least partly by the projection system and the gas flow port.

8. The apparatus according to claim 7 , further comprising a cover, the cover forming a part of the passage, the cover being joined to the projection system by a seal.

9. The apparatus according to claim 8 , wherein the seal is flexible.

10. The apparatus according to claim 8 , wherein the seal comprises glue.

11. The apparatus according to claim 1 , wherein the liquid supply system further comprises a liquid confinement structure extending along at least a part of the boundary of the space between the projection system and the substrate.

12. The apparatus according to claim 11 , wherein the gas flow port is arranged so that the flow of gas is at least partly between the liquid confinement structure and the projection system.

13. The apparatus according to claim 11 , wherein the liquid confinement structure further comprises a gas seal inlet configured to form a gas seal between the liquid confinement structure and a surface of the substrate.

14. The apparatus according to claim 13 , wherein the liquid confinement structure is mounted onto a base frame.

15. The apparatus according to claim 14 , wherein the liquid confinement structure is movable relative to the base frame in Z, Rx and Ry directions and fixed in all other directions.

16. A device manufacturing method, comprising:

providing a liquid to a space between a projection system and a substrate;

flowing a gas in a space above and in contact with the liquid to at least remove humid gas in the space; and

projecting a patterned beam of radiation using the projection system onto a target portion of the substrate through the liquid,

wherein the flow of gas does not cross a path of the patterned beam.

17. The method according to claim 16 , comprising using a vacuum inlet to create the flowing gas.

18. The method according to claim 17 , comprising using the vacuum inlet to remove gas in contact with the liquid.

19. The method according to claim 17 , wherein the vacuum inlet has an annular shape, the projection system being arranged at the center of the annular shape.

20. The method according to claim 16 , comprising flowing the gas through a passage, the passage formed at least partly by the projection system and a device used to create the flowing gas.

21. The method according to claim 20 , wherein a cover forms a part of the passage, the cover being joined to the projection system by a seal.

22. The method according to claim 21 , wherein the seal is flexible.

23. The method according to claim 16 , wherein providing the liquid comprises providing the liquid to the space between the projection system and the substrate using a liquid confinement structure extending along at least a part of the boundary of the space between the projection system and the substrate.

24. The method according to claim 23 , wherein flowing the gas comprises flowing the gas between the liquid confinement structure and the projection system.

25. The method according to claim 23 , further comprising forming a gas seal between the liquid confinement structure and a surface of the substrate.

26. The method according to claim 23 , wherein the liquid confinement structure is mounted onto a base frame.

27. The method according to claim 26 , wherein the liquid confinement structure is movable relative to the base frame in Z, Rx and Ry directions and fixed in all other directions.

28. A lithographic apparatus, comprising:

an illumination system configured to condition a beam of radiation;

a support structure configured to hold a patterning device, the patterning device configured to pattern the beam of radiation according to a desired pattern;

a substrate table configured to hold a substrate;

a projection system configured to project the patterned beam onto a target portion of the substrate;

a liquid supply system configured to at least partly fill a space between the projection system and the substrate with a liquid;

a gas flow port configured to create a flow of gas to at least remove humid gas in a space above and in contact with the liquid, the flow of gas not crossing a path of the patterned beam; and

a passage through which the flow of gas flows formed at least partly by the projection system and the gas flow port.

29. The apparatus according to claim 28 , wherein the gas flow port comprises a vacuum inlet.

30. The apparatus according to claim 29 , wherein the vacuum inlet has an annular shape, the projection system being arranged at the center of the annular shape.

31. The apparatus according to claim 28 , wherein the liquid supply system further comprises a liquid confinement structure extending along at least a part of the boundary of the space between the projection system and the substrate.

32. The apparatus according to claim 31 , wherein the gas flow port is arranged so that the flow of gas is at least partly between the liquid confinement structure and the projection system.

Assignments (2)
A MODIFYING CONVERSION Recorded Jan 18, 2011
From: CARL ZEISS SMT AG
To: CARL ZEISS SMT GMBH
Reel/Frame 025763/0367 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 29, 2008
From: WURMBRAND, ANDREAS; GELLRICH, BERNARD; HOOGENDAM, CHRISTIAAN ALEXANDER; LOOPSTRA, ERIK ROELOF; STREEFKERK, BOB
To: ASML NETHERLANDS B.V.; CARL ZEISS SMT AG
Reel/Frame 020500/0329 →