Compressing test responses using a compactor
View Patent ↗The present disclosure describes embodiments of a compactor for compressing test results in an integrated circuit and methods for using and designing such embodiments. The disclosed compactors can be utilized, for example, as part of any scan-based design. Moreover, any of the disclosed compactors can be designed, simulated, and/or verified in a computer-executed application, such as an electronic-design-automation (“EDA”) software tool. Embodiments of a method for diagnosing faults in the disclosed compactor embodiments are also described.
1. An apparatus for compressing test responses in an integrated circuit, comprising:
a plurality of memory elements; and
an injector network comprising combinational logic, the injector network having injector-network outputs and injector-network inputs,
each injector-network output being coupled to a respective one of the memory elements,
each injector-network input being logically coupled to two or more injector-network outputs according to a respective injector polynomial, the respective injector polynomial being selected to prevent one, two, and odd-numbered error masking in the memory elements.
2. The apparatus of claim 1 , wherein two or more of the memory elements are further coupled in series via feedback-free logic.
3. The apparatus of claim 2 , wherein the feedback-free logic is configured to combine serially shifted values from the two or more memory elements with respective values from the injector-network outputs.
4. The apparatus of claim 1 , wherein the two or more memory elements are configured to output a series of output values over a fixed period of clock cycles, and wherein the series of output values is associated with a test value.
5. The apparatus of claim 1 , wherein the plurality of memory elements are serially connected to one another via logic that includes at least one feedback loop.
6. The apparatus of claim 1 , wherein the plurality of memory elements form a multiple input signature register (MISR).
7. The apparatus of claim 6 , wherein the injector network prevents MISR cancellation in the MISR when two errors are injected during a same cycle and reduces MISR cancellation when other even-numbered errors are injected during the same cycle.
8. The apparatus of claim 1 , further comprising a bypass network coupled between the injector-network inputs and scan-chain outputs.
9. The apparatus of claim 1 , further comprising a selector circuit coupled between the injector-network inputs and scan-chain outputs, the selector circuit being operable to mask one or more of the scan-chain outputs.
10. The apparatus of claim 1 , further comprising at least one serial-input-parallel-output register coupled between at least one scan-chain and two or more of the injector-network inputs.
11. The apparatus of claim 1 , further comprising at least one scan chain having multiple outputs coupled to one or more of the injector-network inputs.
12. The apparatus of claim 1 , further comprising means for diagnosing output values output from the plurality of memory elements.
13. A computer-readable medium storing computer-executable instructions for causing a computer system to design an apparatus, the apparatus comprising:
a plurality of memory elements; and
an injector network comprising combinational logic, the injector network having injector-network outputs and injector-network inputs,
each injector-network output being coupled to a respective one of the memory elements,
each injector-network input being logically coupled to two or more injector-network outputs according to a respective injector polynomial, the respective injector polynomial being selected to prevent one, two, and odd-numbered error masking in the memory elements.
14. The computer-readable medium of claim 13 , wherein two or more of the memory elements of the apparatus are further coupled in series via feedback-free logic.
15. The computer-readable medium of claim 13 , wherein the two or more memory elements of the apparatus are configured to output a series of output values over a fixed period of clock cycle, and wherein the series of output values is associated with a test value.
16. The computer-readable medium of claim 13 , wherein the plurality of memory elements of the apparatus are serially connected to one another via logic that includes at least one feedback loop.
17. The computer-readable medium of claim 13 , wherein the plurality of memory elements of the apparatus form a multiple input signature register (MISR).
18. The computer-readable medium of claim 13 , wherein the apparatus further comprises a bypass network coupled between the injector-network inputs and scan-chain outputs.
19. The computer-readable medium of claim 13 , wherein the apparatus further comprises a selector circuit coupled between the injector-network inputs and scan-chain outputs, the selector circuit being operable to mask one or more of the scan-chain outputs.
20. The computer-readable medium of claim 13 , wherein the apparatus further comprises at least one serial-input-parallel-output register coupled between at least one scan-chain and two or more of the injector-network inputs.
21. The computer-readable medium of claim 13 , wherein the apparatus further comprises at least one scan chain having multiple outputs coupled to one or more of the injector-network inputs.
22. A computer-readable medium storing a design database that includes design information for an apparatus, the apparatus comprising:
a plurality of memory elements; and
an injector network comprising combinational logic, the injector network having injector-network outputs and injector-network inputs,
each injector-network output being coupled to a respective one of the memory elements,
each injector-network input being logically coupled to two or more injector-network outputs according to a respective injector polynomial, the respective injector polynomial being selected to prevent one, two, and odd-numbered error masking in the memory elements.
23. The computer-readable medium of claim 22 , wherein two or more of the memory elements of the apparatus are further coupled in series via feedback-free logic.
24. The computer-readable medium of claim 22 , wherein the two or more memory elements of the apparatus are configured to output a series of output values over a fixed period of clock cycle, and wherein the series of output values is associated with a test value.
25. The computer-readable medium of claim 22 , wherein the plurality of memory elements of the apparatus are serially connected to one another via logic that includes at least one feedback loop.
26. The computer-readable medium of claim 22 , wherein the plurality of memory elements of the apparatus form a multiple input signature register (MISR).
27. The computer-readable medium of claim 22 , wherein the apparatus further comprises a bypass network coupled between the injector-network inputs and scan-chain outputs.
28. The computer-readable medium of claim 22 , wherein the apparatus further comprises a selector circuit coupled between the injector-network inputs and scan-chain outputs, the selector circuit being operable to mask one or more of the scan-chain outputs.
29. The computer-readable medium of claim 22 , wherein the apparatus further comprises at least one serial-input-parallel-output register coupled between at least one scan-chain and two or more of the injector-network inputs.
30. The computer-readable medium of claim 22 , wherein the apparatus further comprises at least one scan chain having multiple outputs coupled to one or more of the injector-network inputs.