X-ray diffraction equipment for X-ray scattering
An X-ray scattering chamber 12 includes a housing 14 that may be mounted in X-ray diffraction equipment between an X-ray source 2 and an X-ray detector 4, for example on goniometer arm 6 . The housing 14 includes sample holder 16 and beam conditioning optics 22,24 , but the system also makes use of primary optics 10 outside the housing. The equipment is suitable for SAXS and/or SAXS-WAXS.
1. An X-ray diffractometer, comprising:
an X-ray source for directing incident x-rays to a sample measurement position;
an X-ray detector for detecting output x-rays from the sample measurement position;
a goniometer for adjusting the position of at least one of the source, detector and the sample; and
an detachable x-ray scattering chamber including:
a gas-tight housing having an x-ray input window for receiving incident x-rays from the x-ray source and an x-ray output window for passing the scattered x-rays to the x-ray detector;
at least one beam conditioner between the x-ray input window and sample measurement position for conditioning the incident beam and at least a beam stop between the sample measurement position and the x-ray output window; and
mounting means for detachably mounting the chamber in position.
2. An X-ray diffractometer according to claim 1 comprising a plurality of exchangeable sample holders, including
a first sample holder for holding a sample at the sample measurement position with the x-ray scattering chamber detached; and
a second sample holder attached to the x-ray scattering chamber for holding a sample in the x-ray scattering chamber at the sample measurement position with the x-ray scattering chamber attached.
3. An X-ray diffractometer according to claim 1 wherein the detector is mounted on the goniometer.
4. An X-ray diffractometer according to claim 1 wherein beam-conditioners in the x-ray scattering chamber between the input window and the sample measurement position includes at least one slit.
5. An X-ray diffractometer according to claim 1 wherein the X-ray scattering chamber is shaped to provide a path for X-rays scattered by a sample in the measurement position by an angle up to a predetermined angle, where the predetermined angle is in the range 10° to 140°.
6. An X-ray diffractometer according to claim 1 further comprising primary beam optics between the X-ray source and the X-ray scattering chamber.
7. An X-ray diffractometer according to claim 6 wherein the primary beam optics includes an x-ray mirror and/or a crystal monochromator.
8. An X-ray scattering chamber, adapted to be mounted in an X-ray diffractometer including an X-ray source, an X-ray detector, and a goniometer for adjusting the position of at least one of the source and detector around the sample measurement position, the X-ray scattering chamber comprising:
a mount for reproducible placement and removal of the chamber;
a gas-tight housing having an x-ray input window for receiving x-rays from the x-ray source and an x-ray output window for passing the scattered output x-rays to the x-ray detector; and
at least one beam conditioner between the x-ray input window and sample measurement position for conditioning the incident beam and at least one beam stop between the sample measurement position and the x-ray output window for conditioning the output x-rays.
9. An X-ray scattering chamber according to claim 8 for carrying out measurements wherein the beam conditioner is adapted to cooperate with the beam stop to stop x-rays not scattered by a sample at the sample measurement position from reaching the detector.
10. An X-ray scattering chamber according to claim 8 wherein the X-ray scattering chamber is shaped to provide a path for X-rays scattered by a sample in the measurement position by an angle up to a predetermined angle, where the predetermined angle is in the range 10° to 140°.
11. An X-ray scattering chamber according to claim 8 further comprising a sample holder in the form of a flow-through tube.
12. A method of operation of an X-ray scattering chamber having a mount for reproducible placement and removal of the chamber;
a gas-tight housing having an x-ray input window for receiving x-rays from the x-ray source and an x-ray output window for passing the scattered output x-rays to the x-ray detector; and
at least one beam conditioner between the x-ray input window and sample measurement position for conditioning the incident beam and at least one beam stop between the sample measurement position and the x-ray output window for conditioning the output x-rays;
including:
detachably mounting the X-ray scattering chamber in the X-ray diffraction equipment;
carrying out measurements on a sample with the x-ray scattering camera attached
detaching the X-ray scattering chamber from the X-ray diffraction equipment.