Patent Assignment
Reel/Frame 045765/0354
Change of Name
Recorded: 2018-01-15
Pages: 4
Assignor
PANALYTICAL B.V.
Executed: 2017-11-21
Assignee
MALVERN PANALYTICAL B.V.
LELYWEG 1, 7602 EA, P O BOX 13, ALMELO, 7600 AA, NETHERLANDS
Covered Properties
(46)
Method of and Apparatus for X-Ray Fluorescent Analysis of Thin Layers
Patent:
6,173,037 →
Application:
09/351,381 →
Apparatus for X-Ray Analysis in Grazing Exit Conditions
Patent:
6,263,042 →
Application:
09/406,285 →
X-Ray Irradiation Apparatus Including an X-Ray Source Provided with a Capillary Optical System.
Patent:
6,233,306 →
Application:
09/414,461 →
X-Ray Diffraction Apparatus with an X-Ray Optical Reference Channel
Patent:
6,310,937 →
Application:
09/426,522 →
X-ray tube
Patent:
6,359,968 →
Application:
09/501,895 →
Method of Determining an Intrinsic Spectrum from a Measured Spectrum
Patent:
6,370,490 →
Application:
09/592,059 →
Method of and Device for Fluorescent X-Ray Analysis of a Sample
Patent:
6,370,220 →
Application:
09/691,809 →
Monochromatic X-Ray Source
Patent:
6,560,313 →
Application:
09/713,877 →
Crystal Structure Analysis Method
Device and Method for the Inspection of the Condition of a Sample
X-Ray Diffractometer
Determination of Material Parameters
X-Ray Optical System
Examination of Material Samples
X-Ray Diffraction Apparatus and Method
Diffractometer
Apparatus and Method for Correcting for Aberrations
X-Ray Instrument
X-Ray Diffraction Equipment for X-Ray Scattering
Imaging Detector
Patent:
7,538,328 →
Application:
12/041,148 →
X-Ray Fluorescence Apparatus
Imaging Detector
X-Ray Detection in Packaging
X-Ray Source with Metal Wire Cathode
X-Ray Diffraction and Fluorescence
Bead Furnace
Diffractometer
X-Ray Diffraction and Computed Tomography
X-Ray Shutter Arrangement
Microdiffraction
Sample Holder
Diffraction Imaging
X-Ray Apparatus
Method of Making a Standard
X-ray Analysis Apparatus
Quantitative X-Ray Analysis - Ratio Correction
Quantitative X-ray Analysis - Matrix thickness correction
Quantitative X-Ray Analysis - Multi Optical Path Instrument
Preparation of samples for XRF using flux and platinum crucible
X-Ray Tube Anode Arrangement
Sample Holder for X-Ray Analysis
Conical Collimator for X-ray Measurements
Computed Tomography
X-Ray Analysis of Drilling Fluid
Pressed Powder Sample Measurements Using X-ray Fluorescence
Application:
15/608,533 →
Publication:
US 2018/0348150
High resolution X-ray Diffraction Method and Apparatus
Application:
62/469,244 →
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 27, 1999
From: BROUWER, PETER N.
To: U.S. PHILIPS CORPORATION
Reel/Frame 010189/0613 →
Assignment of Assignor's Interest
Oct 7, 1999
From: VAN SPRANG, HENDRIK A.
To: U.S. PHILIPS CORPORATION
Reel/Frame 010305/0810 →
Assignment of Assignor's Interest
Oct 26, 1999
From: VAN DEN HOOGENHOF, WALTHERUS W.
To: U.S. PHILIPS CORPORATION
Reel/Frame 010346/0663 →
Assignment of Assignor's Interest
Oct 26, 1999
From: DEN HARTOG, SANDER G.; DE BOKX, PIETER K.
To: U.S. PHILIPS CORPORATION
Reel/Frame 010331/0297 →
Assignment of Assignor's Interest
Apr 25, 2000
From: HARDING, GEOFFREY
To: U.S. PHILIPS CORPORATION
Reel/Frame 010771/0671 →
Assignment of Assignor's Interest
Sep 19, 2000
From: REEFMAN, DERK; REY, WILLIAM JACQUES JEAN; JANSSEN, AUGUSTUS JOSEPHUS ELIZABETH MARIA
To: U.S. PHILIPS CORPORATION
Reel/Frame 011154/0018 →
Assignment of Assignor's Interest
Jan 22, 2001
From: STOOP, MARINUS GERARDUS MARIA
To: U.S. PHILIP CORPORATION
Reel/Frame 011502/0725 →
Assignment of Assignor's Interest
Mar 26, 2001
From: HARDING, GEOFFREY; ULMER, BERND
To: U.S. PHILIPS CORPORATION
Reel/Frame 011651/0996 →
Assignment of Assignor's Interest
Dec 13, 2001
From: FEWSTER, PAUL F.; ANDREW, NORMAN L.
To: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 012397/0450 →
Assignment of Assignor's Interest
Feb 19, 2002
From: SAITO, KEISUKE
To: U.S. PHILIPS CORPORATION
Reel/Frame 012638/0864 →
Assignment of Assignor's Interest
Feb 27, 2002
From: DE BOER, DIRK KORNELIS GERHARDUS; VAN LOENEN, EVERT JAN
To: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 012655/0089 →
Assignment of Assignor's Interest
Jun 25, 2002
From: FEWSTER, PAUL F.; TYE, GARETH A.
To: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 013050/0436 →
Assignment of Assignor's Interest
Jan 21, 2003
From: U.S. PHILIPS CORPORATION
To: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 013676/0618 →
Assignment of Assignor's Interest
Jul 14, 2003
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: PANALYTICAL B.V.
Reel/Frame 014250/0677 →
Assignment of Assignor's Interest
Jul 14, 2003
From: U.S. PHILIPS CORPORATION
To: PANALYTICAL B.V.
Reel/Frame 014259/0628 →
Assignment of Assignor's Interest
Jun 8, 2004
From: DE LANGE, ROELOF; VREBOS, BRUNO A.R.
To: PANALYTICAL B.V.
Reel/Frame 015535/0194 →
Assignment of Assignor's Interest
Jul 13, 2004
From: VAN DEN HOOGENHOF, WALTHERUS W.; VAN SPRANG, HENDRIK A.
To: PANALYTICAL B.V.
Reel/Frame 015663/0788 →
Assignment of Assignor's Interest
May 17, 2005
From: LISCHKA, KLAUS; KHARCHENKO, ALEXANDER
To: PANALYTICAL B.V.
Reel/Frame 016022/0776 →
Assignment of Assignor's Interest
Apr 28, 2006
From: KOGAN, VLADIMIR
To: PANALYTICAL B.V.
Reel/Frame 017545/0964 →
Assignment of Assignor's Interest
Jun 1, 2006
From: MEIER, ROGER; GEHRKE, SEBASTIAN; WIRTH, KARL-ERNST
To: PANALYTICAL B.V.
Reel/Frame 017709/0394 →
Assignment of Assignor's Interest
May 31, 2007
From: FEWSTER, PAUL FREDERICK
To: PANALYTICAL B.V.
Reel/Frame 019363/0294 →
Assignment of Assignor's Interest
Feb 6, 2008
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: PANALYTICAL BV
Reel/Frame 020468/0262 →
Assignment of Assignor's Interest
Feb 6, 2008
From: U.S. PHILIPS CORPORATION
To: PANALYTICAL BV
Reel/Frame 020468/0250 →
Assignment of Assignor's Interest
Feb 7, 2008
From: KOGAN, VLADIMIR
To: PANALYTICAL B.V.
Reel/Frame 020474/0353 →
Assignment of Assignor's Interest
Apr 21, 2009
From: BETHKE, KLAUS
To: PANALYTICAL B.V.
Reel/Frame 022571/0040 →