IP Library Granted Patent US 9,547,094
Granted Patent B2
US 9,547,094 · App. 14/624,005 · Granted Jan 17, 2017

X-ray analysis apparatus

Inventors: Jeroen Rinsema (Enschede, NL); Mark Alexander Pals (Enschede, NL)
Assignee: PANALYTICAL B.V.
G01T7/08B25J9/0093G01N23/207G01N23/223Y10S901/15
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Quick Facts
Patent No.
US 9,547,094
App. No.
14/624,005
Granted
Jan 17, 2017
Kind
B2
Abstract

X-ray analysis of a primary sample such as a flexible sheet 60 uses apparatus having a primary sample holder such as a material feed-through system 20 for moving the flexible sheet through the apparatus. An X-ray analysis head 6 containing an X-ray source and an X-ray detector is mounted on a robot arm 4 . The robot arm moves in three dimensions so that the analysis head can be brought into position to measure the flexible sheet as it is being brought through the apparatus by the material feed-through system.

Claims (18)

1. Apparatus for X-ray analysis of a sample comprising:

a primary sample holder for holding the sample;

an X-ray analysis head containing an X-ray source and an X-ray detector, and

a robot arm mounted on the apparatus, the X-ray analysis head being mounted on the robot arm, the robot arm being arranged to move the X-ray analysis head both linearly in three dimensions and rotationally so that the analysis head is brought into position to measure the sample;

wherein the primary sample holder is a material feed-through system for moving a flexible sheet through the apparatus.

2. Apparatus according to claim 1 wherein the feed-through system comprises a measurement support pair of rollers for supporting the flexible sheet during measurement.

3. Apparatus according to claim 2 further comprising additional guide rollers for guiding the flexible sheet through the apparatus.

4. Apparatus according to claim 1 further comprising a housing for containing the robot arm and part of the material feed-through system for supporting the flexible sheet for measurement.

5. Apparatus according to claim 1 wherein the robot arm is a six-axis robot arm arranged to move the X-ray analysis head in three linear directions and to rotate the X-ray analysis head about three orthogonal axes.

6. Apparatus according to claim 1 further comprising a fixed sample mounting additional to the primary sample holder.

7. Apparatus according to claim 6 wherein the fixed sample mounting is in the form of a demountable frame.

8. Apparatus according to claim 1 further comprising a location sensor on the robot arm and/or X-ray analysis head for measuring the position of the arm for locating the X-ray analysis head during measurement.

9. Apparatus according to claim 8 wherein the location sensor is a distance sensor for measuring the position of the arm to the flexible sheet or to an additional sample.

10. Apparatus according to claim 1 further comprising a video camera mounted on the robot arm and/or X-ray analysis head for locating the X-ray analysis head during measurement.

11. Apparatus according to any claim 1 wherein the X-ray analysis head is an X-ray fluorescence head.

12. Apparatus according to any claim 1 wherein the X-ray analysis head is an X-ray diffraction head.

13. A method of operation of apparatus according to claim 1 including passing a flexible sheet along the material feed-through system and measuring the composition of the flexible sheet using the X-ray analysis head.

14. A method of operation according to claim 13 further comprising measuring the composition of a reference sample using the X-ray analysis head.

Assignments (2)
CHANGE OF NAME Recorded Jan 15, 2018
From: PANALYTICAL B.V.
To: MALVERN PANALYTICAL B.V.
Reel/Frame 045765/0354 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2015
From: RINSEMA, JEROEN; PALS, MARK ALEXANDER
To: PANALYTICAL B.V.
Reel/Frame 035904/0875 →
Priority Claims (1)
EP 14155632 · Feb 18, 2014 · regional
Continuity (1)
Related Publication 20150234060A1 · Aug 20, 2015