X-ray fluorescence apparatus

1. An X-ray fluorescence apparatus comprising:

a sample holder ( 30 ) for holding a sample;

an X-ray source ( 2 ) for directing X-rays onto the sample in the sample holder;

a silicon drift detector ( 8 ) for detecting X-ray intensity as a function of energy;

an analyzer crystal ( 6 , 10 ) for directing X-rays from the sample onto the detector ( 8 );

a processor arranged to take a signal from the detector ( 8 ) and to output a processed X-ray intensity; and

a driver for varying a configuration of at least one of the sample, the source, the analyzer crystal or the detector to select a measurement energy at which X-rays from the sample are directed by the analyzer crystal onto the detector;

wherein the processor is arranged to output an X-ray spectrum of a peak at a peak energy, by:

measuring a measured X-ray spectrum of the peak;

measuring an X-ray spectrum of a Bragg-reflected background peak at least one measurement energy and output energy, the measurement energy and output energy being the same energy spaced from the peak energy;

using the measured X-ray spectrum of the Bragg-reflected background peak to estimate an X-ray spectrum of the Bragg-reflected background peak at the peak energy; and

outputting a corrected peak X-ray intensity of the peak by subtracting the estimated X-ray spectrum of the Bragg-reflected background peak from the measured X-ray spectrum of the peak.

2. The X-ray fluorescence apparatus of claim 1 , wherein the detector ( 8 ) is a multi-segment silicon drift detector ( 34 ).

3. The X-ray fluorescence apparatus of claim 1 , wherein the detector ( 8 ) includes a scintillator crystal ( 80 ) mounted on the detector ( 34 ).

4. The X-ray fluorescence apparatus of claim 1 , wherein the driver includes control electronics ( 36 ) and a drive ( 33 ) adapted to rotate the crystal ( 6 ) to scan the measurement energy.

5. An X-ray fluorescence apparatus comprising:

a sample holder ( 30 ) for holding a sample;

an X-ray source ( 2 ) for directing X-rays onto the sample in the sample holder;

a silicon drift detector ( 8 ) for detecting X-ray intensity as a function of energy;

an analyzer crystal ( 6 , 10 ) for directing X-rays from the sample onto the detector ( 8 );

a processor arranged to take a signal from the detector ( 8 ) and to output a processed X-ray intensity; and

a driver for varying a configuration of at least one of the sample, the source, the analyzer crystal or the detector to select a measurement energy at which X-rays from the sample are directed by the analyzer crystal onto the detector;

wherein the processor is arranged to output an X-ray spectrum of a peak at a peak energy, by:

measuring a measured X-ray spectrum of the peak;

measuring an X-ray spectrum of a higher order Bragg-reflected background peak or scattered tube lines;

using the measured X-ray spectrum of the higher order Bragg-reflected background peak or scattered tube lines to estimate an X-ray spectrum of the Bragg-reflected background peak at the peak energy; and

outputting a corrected peak X-ray intensity of the peak by subtracting the estimated X-ray spectrum of the Bragg-reflected background peak from the measured X-ray spectrum of the peak.

6. The X-ray fluorescence apparatus of claim 5 , wherein the detector ( 8 ) is a multi-segment silicon drift detector ( 34 ).

7. The X-ray fluorescence apparatus of claim 5 , wherein the detector ( 8 ) includes a scintillator crystal ( 80 ) mounted on the detector ( 34 ).

8. The X-ray fluorescence apparatus of claim 5 , wherein the driver includes control electronics ( 36 ) and a drive ( 33 ) adapted to rotate the crystal ( 6 ) to scan the measurement energy.

9. A method of carrying out X-ray fluorescence measurements, comprising:

directing X-rays onto a sample;

measuring an intensity of X-rays incident on a detector as a function of energy;

directing X-rays emitted by the sample off an analyzer crystal ( 6 ) onto the detector ( 8 );

varying the configuration of the sample, a source, the analyzer crystal, or the detector to select a measurement energy at which X-rays from the sample are directed by the analyzer crystal onto the detector;

selecting X-rays in a narrow energy range around an output energy and outputting the intensity of X-rays in the narrow energy range, the narrow energy range having a width less than 0.4 keV for an output energy below 1 keV, a width less than 1 keV for an output energy from 1 keV to 5 keV, a width less than 2 keV for an output energy from 5 keV to 10 keV, or a width less than 5 keV for an output energy above 10 keV; and

calculating an intensity of a peak at a peak energy, by:

measuring a measured X-ray spectrum of the peak;

measuring an X-ray spectrum of a Bragg-reflected background peak at least one measurement energy and output energy, the measurement energy and output energy being the same energy spaced from the peak energy;

using the measured X-ray spectrum of the Bragg-reflected background peak to estimate an X-ray spectrum of the Bragg-reflected background peak at the peak energy; and

outputting a corrected peak X-ray intensity of the peak by subtracting the estimated X-ray spectrum of the Bragg-reflected background peak from the measured X-ray spectrum of the peak.

10. The method according to claim 9 , wherein varying the configuration includes rotating the analyzer crystal and detector ( 8 ).

11. The method according to claim 9 , wherein as the measurement energy varies, the output energy varies to stay the same as the measurement energy.

12. The method according to claim 9 , further comprising additionally outputting the measured X-ray intensity at predetermined fixed output energies as the measurement energy varies.

13. The method according to claim 9 , further comprising outputting the X-ray intensity as three dimensional plot as a function of measurement energy and of the output energy.

14. The method according to claim 9 , wherein:

the step of measuring the intensity of X-rays includes outputting from the detector the measured X-ray intensity as a function of energy to a processor ( 36 ); and

the step of selecting X-rays in a narrow energy range includes selecting the narrow energy range in the processor ( 36 ).

15. A method of carrying out X-ray fluorescence measurements, comprising:

directing X-rays onto a sample;

measuring an intensity of X-rays incident on a detector as a function of energy;

directing X-rays emitted by the sample off an analyzer crystal ( 6 ) onto the detector ( 8 );

varying the configuration of the sample, a source, the analyzer crystal, or the detector to select a measurement energy at which X-rays from the sample are directed by the analyzer crystal onto the detector;

selecting X-rays in a narrow energy range around an output energy and outputting the intensity of X-rays in the narrow energy range, the narrow energy range having a width less than 0.4 keV for an output energy below 1 keV, a width less than 1 keV for an output energy from 1 keV to 5 keV, a width less than 2 keV for an output energy from 5 keV to 10 keV, or a width less than 5 keV for an output energy above 10 keV; and

calculating an intensity of a peak at a peak energy, by:

measuring a measured X-ray spectrum of the peak;

measuring an X-ray spectrum of a higher order Bragg-reflected background peak or scattered tube lines;

using the measured X-ray spectrum of the higher order Bragg-reflected background peak or scattered tube lines to estimate an X-ray spectrum of the Bragg-reflected background peak at the peak energy; and

outputting a corrected peak X-ray intensity of the peak by subtracting the estimated X-ray spectrum of the Bragg-reflected background peak from the measured X-ray spectrum of the peak.

16. The method according to claim 15 , wherein varying the configuration includes rotating the analyzer crystal and detector ( 8 ).

17. The method according to claim 15 , wherein as the measurement energy varies, the output energy varies to stay the same as the measurement energy.

18. The method according to claim 15 , further comprising additionally outputting the measured X-ray intensity at predetermined fixed output energies as the measurement energy varies.

19. The method according to claim 15 , further comprising outputting the X-ray intensity as three dimensional plot as a function of measurement energy and of the output energy.

20. The method according to claim 15 , wherein:

the step of measuring the intensity of X-rays includes outputting from the detector the measured X-ray intensity as a function of energy to a processor ( 36 ); and

the step of selecting X-rays in a narrow energy range includes selecting the narrow energy range in the processor ( 36 ).