IP Library › Patent Application 12021616
Patent Application
App. No. 12/021,616

METHODS AND APPARATUS FOR DATA ANALYSIS

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Quick Facts
Patent No.
US None
App. No.
12/021,616
Abstract

A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.

Claims (5)

1 . A test system, comprising:

a tester configured to test a set of components and generate test data for the set of components; and

a diagnostic system configured to receive the test data from the tester and automatically analyze the test data to identify a problem in a process for fabricating the components, wherein the diagnostic system is configured to recognize a pattern in the test data and match the recognized pattern with the problem.

2 . (canceled)

3 . (canceled)

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 8, 2009
From: MIGUELANEZ, EMILIO; GORIN, JACKY; BUXTON, PAUL; SCOTT, MICHAEL J.; TABOR, ERIC PAUL
To: TEST ADVANTAGE, INC.
Reel/Frame 023345/0150 →