IP Library Granted Patent US 7,641,405
Granted Patent B2
US 7,641,405 · App. 12/031,677 · Granted Jan 5, 2010

Substrate processing apparatus with integrated top and edge cleaning unit

Assignee: Sokudo Co., Ltd.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,641,405
App. No.
12/031,677
Granted
Jan 5, 2010
Kind
B2
Abstract

A substrate processing apparatus arranged adjacent to an exposure device includes a processing section that subjects a substrate to processing and an interface provided adjacent to one end of the processing section configured to transfer and receive the substrate between the processing section and the exposure device. The processing section includes a photosensitive film formation unit configured to form a photosensitive film composed of a photosensitive material on the substrate that has not been subjected to exposure processing by the exposure device, a top surface and edge cleaning unit configured to clean a top surface and an edge of the substrate, and a development unit configured to subject the substrate to development processing after the exposure processing by the exposure device.

Claims (19)

1. A substrate processing apparatus that is arranged adjacent to an exposure device, the substrate processing apparatus comprising:

a processing section that subjects a substrate to processing; and

an interface provided adjacent to one end of the processing section configured to transfer and receive the substrate between the processing section and the exposure device, wherein the processing section includes:

a photosensitive film formation unit configured to form a photosensitive film composed of a photosensitive material on the substrate that has not been subjected to exposure processing by the exposure device;

a top surface and edge cleaning unit configured to clean a top surface and an edge of the substrate; and

a development unit configured to subject the substrate to development processing after the exposure processing by the exposure device, wherein

the top surface and edge cleaning unit includes a brush configured to be brought into contact with the edge of the substrate to clean the edge of the substrate.

2. The substrate processing apparatus of claim 1 wherein the top surface and edge cleaning unit is configured to clean the top surface and the edge of the substrate after the formation of the photosensitive film by the photosensitive film formation unit and before the exposure processing by the exposure device.

3. The substrate processing apparatus of claim 1 wherein the top surface and edge cleaning unit is configured to clean the top surface and the edge of the substrate concurrently.

4. The substrate processing apparatus of claim 3 wherein the top surface and edge cleaning unit is configured to clean the top surface and the edge of the substrate simultaneously.

5. The substrate processing apparatus of claim 1 wherein the processing section further includes an anti-reflection film formation unit that is configured to form an anti-reflection film on the substrate before the formation of the photosensitive film by the photosensitive film formation unit.

6. The substrate processing apparatus of claim 1 wherein the processing section further includes a protective film formation unit that is configured to form a protective film for protecting the photosensitive film after the formation of the photosensitive film by the photosensitive film formation unit and before the exposure processing by the exposure device.

7. The substrate processing apparatus of claim 1 wherein the processing section further includes a protective film removal unit that is configured to remove a protective film after the exposure processing by the exposure device and before the development processing by the development unit.

8. The substrate processing apparatus of claim 1 wherein the processing section further includes a reversing unit that is configured to reverse one surface and the other surface of the substrate and a back surface cleaning unit that cleans a back surface of the substrate reversed by the reversing unit.

9. The substrate processing apparatus of claim 1 wherein the processing section further includes:

a first processing unit comprising the photosensitive film formation unit and a first transport unit that transports the substrate;

a second processing unit comprising the top surface and edge cleaning unit and a second transport unit that transports the substrate, wherein the second processing unit is arranged adjacent to the interface; and

a third processing unit comprising the development unit and a third transport unit that transports the substrate.

10. The substrate processing apparatus of claim 1 wherein the interface comprises a cleaning/drying unit that is configured to clean and dry the substrate after the exposure processing by the exposure device and an interface unit that transports the substrate.

Assignments (2)
CHANGE OF NAME Recorded Nov 5, 2014
From: SOKUDO CO., LTD.
To: SCREEN SEMICONDUCTOR SOLUTIONS CO., LTD.
Reel/Frame 034150/0849 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2008
From: FUKUTOMI, YOSHITERU
To: SOKUDO CO., LTD.
Reel/Frame 020516/0098 →
Priority Claims (1)
JP 2007-034200 · Feb 15, 2007 · national
Continuity (1)
Related Publication 20080198342A1 · Aug 21, 2008