Twin cell architecture for integrated circuit dynamic random access memory (DRAM) devices and those devices incorporating embedded DRAM
View Patent ↗A twin cell architecture for dynamic random access memory (DRAM) devices and those devices incorporating embedded DRAM utilizing an open bitline configuration is disclosed. The twin cell architecture disclosed has significant advantages over conventional designs in terms of power, radiation hardness and speed and does not require intermediate supply voltage bitline precharge while allowing for 6F2 memory cell layouts.
1. An integrated circuit device including a memory array comprising:
at least one sense amplifier;
at least one complementary bitline pair, a first bitline of said pair extending distally from said at least one sense amplifier in a first direction and a second bitline of said pair extending distally from said at least one sense amplifier in a second opposite direction;
a plurality of associated wordline pairs disposed orthogonally to said first and second bitlines, a first wordline of said wordline pairs intersecting said first bitline and a second wordline of said wordline pairs intersecting said second bitline;
a memory cell coupled to each of said first and second wordlines of said wordline pairs at an intersection with each of said first and second bitlines respectively,
wherein said first and second wordlines of said wordline pairs are coupled together,
wherein said memory cells comprise 1T/1C memory cells and wherein predetermined partial logic level ones and zeroes are stored in said capacitors of said 1T/1C memory cells to increase the tRC speed of said device.
2. The integrated circuit device of claim 1 wherein said first wordline of said wordline pairs is located remotely from said at least one sense amplifier and said second wordline of said wordline pairs is located proximately to said at least one sense amplifier.
3. The integrated circuit device of claim 1 wherein said first and second wordlines of said wordline pairs are located proximately to said at least one sense amplifier.
4. The integrated circuit device of claim 1 comprising a plurality of said sense amplifiers, each associated with at least one of said complementary bitline pairs.
5. The integrated circuit device of claim 1 comprising an open bitline configuration having two of said memory cells per bit.
6. The integrated circuit device of claim 1 further comprising a precharge of said bitlines to a level of substantially half of a supply voltage level and a transition of said wordlines to a level higher than said supply voltage level.
7. The integrated circuit device of claim 1 further comprising a precharge of said bitlines to a level of substantially half of a supply voltage level and a transition of said wordlines to a level substantially equal to said supply voltage level.
8. The integrated circuit device of claim 1 further comprising a precharge of said bitlines to a level of substantially circuit ground and a transition of said wordlines to a level substantially equal to said supply voltage level.
9. The integrated circuit device of claim 1 further comprising a precharge of said bitlines to a level of substantially a supply voltage level and a transition of said wordlines to a level also substantially a supply voltage level.
10. The integrated circuit device of claim 1 wherein said memory array is capable of operation with a non-pumped supply voltage level.
11. An integrated circuit device including a memory array comprising:
at least one sense amplifier coupled to first and second complementary bitlines extending outwardly in opposite directions there from;
first through n wordline pairs, a first wordline of each of said wordline pairs being disposed orthogonally to said first bitline and a second wordline of said wordline pairs being disposed orthogonally to said second bitline; and
at least one memory cell coupled to said first and second complementary bitlines at a point of intersection with each of said first and second wordlines of said wordline pairs respectively,
wherein said first and second wordlines of said wordline pairs are coupled together,
wherein said memory cells comprise 1T/1C memory cells and wherein predetermined partial logic level ones, and zeroes are stored in said capacitors of said 1T/1C memory cells to increase the tRC speed of said device.
12. The integrated circuit device of claim 11 wherein said first wordline of said wordline pairs is located remotely from said at least one sense amplifier and said second wordline of said wordline pairs is located proximately to said at least one sense amplifier.
13. The integrated circuit device of claim 11 wherein said first and second wordlines of said wordline pairs are located proximately to said at least one sense amplifier.
14. The integrated circuit device of claim 11 comprising a plurality of said sense amplifiers, each associated with at least one of said complementary bitline pairs.
15. The integrated circuit device of claim 11 comprising an open bitline configuration having two of said memory cells per bit.
16. The integrated circuit device of claim 11 further comprising a precharge of said bitlines to a level of substantially half of a supply voltage level and a transition of said wordlines to a level higher than said supply voltage level.
17. The integrated circuit device of claim 11 further comprising a precharge of said bitlines to a level of substantially half of a supply voltage level and a transition of said wordlines to a level substantially equal to said supply voltage level.
18. The integrated circuit device of claim 11 further comprising a precharge of said bitlines to a level of substantially circuit ground and a transition of said wordlines to a level substantially equal to said supply voltage level.
19. The integrated circuit device of claim 11 further comprising a precharge of said bitlines to a level of substantially a supply voltage level and a transition of said wordlines to a level also substantially a supply voltage level.
20. The integrated circuit device of claim 11 wherein said memory array is capable of operation with a non-pumped supply voltage level.
21. An integrated circuit device comprising:
a plurality of sense amplifiers;
a like plurality of complementary bitline pairs, a respective one of said plurality complementary bitline pairs being coupled to each one of said plurality of sense amplifiers in an open bitline configuration; and
wherein said complementary bitlines extend outward in opposite directions there from;
a plurality of wordlines disposed orthogonally to said complementary bitline pairs; and
at least two memory cells coupled to each of said plurality of wordlines and each of said complementary bitline pairs,
a first memory cell being coupled to a first wordline, a second memory cell being coupled to a second wordline, and said first and second wordlines being coupled together,
wherein said memory cells comprise 1T/1C memory cells and wherein predetermined partial logic level ones and zeroes are stored in said capacitors of said 1T/1C memory cells to increase the tRC speed of said device.
22. The integrated circuit device of claim 21 wherein each of said memory cells comprises a 1T/1C memory cell.
23. An integrated circuit device comprising:
a sense amplifier;
a first bitline extending from said sense amplifier in a first direction;
a complementary second bitline extending from said sense amplifier in a second opposite direction;
1 through n wordlines disposed orthogonally to each of said first and second bitlines; and
a memory cell coupled to each of said wordlines and each of said first and second bitlines,
wherein a first memory cell is coupled to a first wordline associated with the first bitline,
a second memory cell is coupled to a second wordline associated with the second bitline, and said first and second wordlines are coupled together,
wherein said memory cells comprise 1T/1C memory cells and wherein predetermined partial logic level ones and zeroes are stored in said capacitors of said 1T/1C memory cells to increase the tRC speed of said device.
24. The integrated circuit device of claim 1 wherein said first and second wordlines of said wordline pairs are activated substantially concurrently.
25. The integrated circuit device of claim 11 wherein said first and second wordlines of said wordline pairs are activated substantially concurrently.
26. The integrated circuit device of claim 1 wherein said memory cells comprise 1T/1C memory cells and wherein predetermined partial logic level ones and zeroes are used to develop bit line signals to increase the t RC speed of said device.
27. The integrated circuit device of claim 1 wherein said memory cells comprise 1T/1C memory cells and wherein a bit line signal thereof is purposely not fully developed to increase the t RC speed of said device.
28. The integrated circuit device of claim 11 wherein said memory cells comprise 1T/1C memory cells and wherein predetermined partial logic level ones and zeroes are used to develop bit line signals to increase t RC speed of said device.
29. The integrated circuit device of claim 11 wherein said memory cells comprise 1T/1C memory cells and wherein a bit line signal thereof is purposely not fully developed to increase the t RC speed of said device.
30. The integrated circuit device of claim 21 wherein said memory cells comprise 1T/1C memory cells and wherein predetermined partial logic level ones and zeroes are used to develop bit line signals to increase t RC speed of said device.
31. The integrated circuit device of claim 21 wherein said memory cells comprise 1T/1C memory cells and wherein a bit line signal thereof is purposely not fully developed to increase the t RC speed of said device.
32. The integrated circuit device of claim 23 wherein said memory cells comprise 1T/1C memory cells and wherein predetermined partial logic level ones and zeroes are used to develop bit line signals to increase t RC speed of said device.
33. The integrated circuit device of claim 23 wherein said memory cells comprise 1T/1C memory cells and wherein a bit line signal thereof is purposely not fully developed to increase the t RC speed of said device.