IP Library Granted Patent US 8,117,524
Granted Patent B2
US 8,117,524 · App. 12/047,856 · Granted Feb 14, 2012

Data recovery circuit

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Quick Facts
Patent No.
US 8,117,524
App. No.
12/047,856
Granted
Feb 14, 2012
Kind
B2
Abstract

A data recovery circuit for recovering data from a parity error without entirely rewriting the data. A write circuit is connected to memory regions including an actual data region and a copy region. A first parity generation circuit writes actual data with even parity to the actual data region. A second parity generation circuit writes backup data of the actual data with odd parity to the copy region. A read circuit reads data from the actual data region and the copy region. An even parity checker detects a parity error in the actual data based on the data read from the actual data region. An odd parity checker checks whether the data read from the copy region is backup data.

Claims (53)

1. A data recovery circuit for generating backup data of actual data with a plurality of memory regions, the data recovery circuit comprising:

a write circuit coupled to the plurality of memory regions including:

a first parity generation circuit which writes the actual data with even parity to an actual data region defined by one of the plurality of memory regions; and

a second parity generation circuit which writes the backup data with odd parity to at least one copy region defined by at least another one of the plurality of memory regions, wherein instead of the backup data, the second parity generation circuit is capable of writing any other actual data with even parity to the at least one copy region; and

a read circuit connected to the plurality of memory regions to read data from the actual data region and the at least one copy region, the read circuit including:

an even parity checker which detects a parity error in the actual data based on the data read from the actual data region; and

at least one odd parity checker which checks whether the data read from the at least one copy region is the backup data.

2. The data recovery circuit according to claim 1 , wherein the second parity generation circuit writes the backup data or the other actual data to the at least one copy region in accordance with a backup control signal.

3. The data recovery circuit according to claim 1 , wherein the read circuit further includes:

an address holding register which stores an address of the actual data at which the parity error is detected; and

a backup data storage register which holds the backup data of the actual data in which the parity error is detected.

4. The data recovery circuit according to claim 1 , wherein:

the first parity generation circuit writes the actual data to the actual data region based on a first address signal; and

the second parity generation circuit writes the backup data to the at least one copy region based on a second address signal that differs from the first address signal.

5. The data recovery circuit according to claim 4 , wherein the write circuit further includes:

an address generation circuit which generates the second address signal based on the first address signal so that the actual data is sequentially written to the actual data region from a lower rank address of the actual data region and the backup data is sequentially written to the copy region from an upper rank address of the copy region.

6. The data recovery circuit according to claim 1 , wherein:

the at least one copy region includes a first copy region and a second copy region;

the second parity generation circuit writes the backup data with odd parity to the first copy region and the second copy region in parallel; and

the read circuit further includes a selection unit which selects either one of the backup data read from the first copy region and the backup data read from the second copy region.

7. The data recovery circuit according to claim 6 , wherein:

the first parity generation circuit writes the actual data to the actual data region based on a first address signal; and

the second parity generation circuit writes the backup data to the first copy region and the second copy region based on a second address signal that differs from the first address signal.

8. The data recovery circuit according to claim 6 , wherein the read circuit further includes:

an address holding register which stores an address of the actual data at which the parity error is detected; and

a backup data storage register which holds backup data of the actual data in which the parity error is detected.

9. The data recovery circuit according to claim 1 , wherein the read circuit further includes:

a replacement circuit which replaces the actual data in which the parity error is detected with the backup data.

10. The data recovery circuit according to claim 9 , wherein the read circuit further includes:

a backup data storage register which holds backup data of the actual data in which the parity error is detected; and

a backup address holding register which holds an address of the backup data.

11. A method for generating backup data of actual data with a plurality of memory regions, the method comprising:

writing the actual data with even parity to an actual data region defined by one of the plurality of memory regions;

writing the backup data with odd parity or any other actual data with even parity to at least one copy region defined by at least another one of the plurality of memory regions;

reading data from the actual data region and the at least one copy region;

detecting a parity error in the actual data based on the data read from the actual data region; and

checking whether the data read from the at least one copy region is the backup data.

12. The method according to claim 11 , further comprising:

storing an address of the actual data at which the parity error is detected; and

holding backup data of the actual data in which the parity error is detected.

13. The method according to claim 11 , wherein:

said writing the actual data includes writing the actual data to the actual data region based on a first address signal; and

said writing the backup data includes writing the backup data to the at least one copy region based on a second address signal that differs from the first address signal.

14. The method according to claim 11 , wherein:

the at least one copy region includes a first copy region and a second copy region; and

said writing the backup data includes writing the backup data with even parity to the first copy region and the second copy region in parallel;

the method further comprising:

selecting either one of the backup data read from the first copy region and the backup data read from the second copy region.

15. The method according to claim 11 , further comprising:

replacing the actual data in which the parity error is detected with the backup data.

16. The method according to claim 15 , further comprising:

holding backup data of the actual data in which the parity error has been detected; and

holding an address of the backup data.

Assignments (9)
SECURITY INTEREST Recorded Feb 25, 2025
From: CARBYNE, INC.; CARBYNE LTD
To: FIRST-CITIZENS BANK & TRUST COMPANY
Reel/Frame 070318/0053 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2016
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MONTEREY RESEARCH, LLC
Reel/Frame 040911/0238 →
PARTIAL RELEASE OF SECURITY INTEREST IN PATENTS Recorded Aug 11, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 039708/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036051/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Dec 30, 2014
From: BARCLAYS BANK PLC
To: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
Reel/Frame 034715/0305 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2013
From: FUJITSU SEMICONDUCTOR LIMITED
To: SPANSION LLC
Reel/Frame 031205/0461 →
CHANGE OF NAME Recorded Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024748/0328 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021977/0219 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 13, 2008
From: NARITOMI, HIROSHI; ISOBE, HAYATO
To: FUJITSU LIMITED
Reel/Frame 020648/0377 →