Generation of simulated errors for high-level system validation
View Patent ↗This invention relates to error simulation for system validation. Errors can be simulated by modifying data presented to the processor as well as generating interrupts consistent with the modified data in the ASIC hardware. Modify logic may be added to the ASIC so when the microprocessor attempts to read a specific address, the modify logic may mask one or more of the data bits returned by the requested address. Address, bit mask, and force value data may be stored in registers to determine which address may be modified, the bit location to be modified, and the value that bit location should be changed to. Selection logic may then determine whether data from the modify logic or the unmodified value from an attached device should be sent to the ASIC interface and on to the microprocessor. A timer may also be used to decouple the setup from the test.
1. An apparatus comprising:
a register configured for storing error data;
switch logic coupled to a storage and configured for requesting a read value from the storage; and
modify logic coupled to the register and the switch logic, and configured for modifying the requested read value by the error data to produce simulated errors for validation testing.
2. The apparatus of claim 1 , wherein the register is further configured for storing address data, the apparatus further comprising comparison logic coupled to the register configured for comparing the stored address data with a requested address.
3. The apparatus of claim 2 , further comprising selection logic coupled to the modify logic and the comparison logic and configured for selecting the modified read value or the requested read value depending on the comparison of the stored address data and the requested address.
4. The apparatus of claim 2 , further comprising interrupt logic coupled to the comparison logic and configured for sending an interrupt signal indicating an event occurrence.
5. The apparatus of claim 4 , further comprising a delay timer coupled to the interrupt logic to delay the interrupt signal by a predetermined delay time.
6. The apparatus of claim 1 , further comprising a switch enclosure.
7. The apparatus of claim 6 , further comprising a storage area network incorporating the switch enclosure.
8. The apparatus of claim 4 , further comprising termination logic coupled to the interrupt logic and configured to terminate the modify logic and clear the interrupt signal.
9. The apparatus of claim 1 , further comprising enable logic coupled to the modify logic and configured for enabling and disabling the modify logic.
10. The apparatus of claim 1 , further comprising register enable logic coupled to the register and configured for controlling a number of actively usable register entries of the register.
11. The apparatus of claim 1 , further comprising iteration logic coupled to the modify logic and configured to control a number of iterations of the modify logic.
12. An apparatus comprising:
a bit mask register configured for storing a bit location to be masked;
a force value register configured for storing a desired error value for the bit location to be masked;
switch logic coupled to a storage and configured for requesting a read value from the storage; and
modify logic coupled to the bit mask register, the force value register, and the switch logic, and configured for modifying the requested read value by the desired error value at the bit location to be masked.
13. The apparatus of claim 12 , further comprising:
an address register configured for storing address data for a desired location to simulate an error, wherein the modify logic is further coupled to the address register; and
comparison logic coupled to the address register and configured for comparing the stored address data with a requested address.
14. The apparatus of claim 13 , further comprising selection logic coupled to the comparison logic and the modify logic and configured for selecting the modified read value or the requested read value depending on the comparison of the stored address data and the requested address.
15. The apparatus of claim 13 , further comprising interrupt logic coupled to the comparison logic and configured for sending an interrupt signal indicating an event occurrence.
16. The apparatus of claim 15 , further comprising a delay timer coupled to the interrupt logic to delay the interrupt signal by a predetermined delay time.
17. The apparatus of claim 15 , further comprising termination logic coupled to the interrupt logic and configured to terminate the modify logic and clear the interrupt signal.
18. The apparatus of claim 12 , further comprising enable logic coupled to the modify logic and configured for enabling and disabling the modify logic.
19. The apparatus of claim 13 , further comprising address enable logic coupled to the address register and configured for controlling a number of different addresses stored in the address register.
20. The apparatus of claim 12 , further comprising iteration logic coupled to the modify logic and configured to control a number of iterations of the modify logic.
21. The apparatus of claim 12 , further comprising a switch enclosure.
22. The apparatus of claim 21 , further comprising a storage area network incorporating the switch enclosure.
23. A method comprising:
receiving an input address and error data;
requesting a read value from a storage at a read address;
comparing the read address to the input address; and
based on the comparison, modifying the requested read value with the error data to produce simulated errors for validation testing.
24. The method of claim 23 , wherein the error data includes a bit mask value and a forced value.
25. The method of claim 24 , further comprising masking a bit location of the requested read value indicated by the bit mask value with the forced value.
26. The method of claim 23 , further comprising generating an interrupt signal to alert a system of an event occurrence.
27. The method of claim 26 , further comprising waiting a delay time before the interrupt signal is generated.
28. The method of claim 23 , further comprising storing the input address and the error data in registers.
29. The method of claim 23 , further comprising enabling a test mode.