IP Library › Granted Patent US 7,846,753
Granted Patent B2
US 7,846,753 · App. 12/058,059 · Granted Dec 7, 2010

Vertical light emitting diode and method of making a vertical light emitting diode

Assignee: Hong Kong Applied Science and Technology Research Institute
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Quick Facts
Patent No.
US 7,846,753
App. No.
12/058,059
Granted
Dec 7, 2010
Kind
B2
Abstract

A vertical gallium-nitrate-based LED and method of making a vertical gallium-nitrate-based LED using a stop layer is provided. Embodiments of the present invention use mechanical thinning and a plurality of superhard stop points to remove epitaxial layers with a high level of certainty. According one embodiment, the method of making a vertical LED includes forming a plurality of layers on a sapphire substrate, forming a plurality of stop points in the plurality of layers, removing the sapphire substrate and part of a u-GaN layer using mechanical thinning, wherein the mechanical thinning stops at an end of the plurality of stop points, selectively etching the u-GaN layer and exposing at least a part of the highly doped stop layer, and forming an n-electrode on the highly doped stop layer.

Claims (20)

1. A method of making a vertical GaN-based LED, the method comprising:

providing a sapphire substrate;

sequentially forming a u-GaN layer, a highly doped stop layer, an n-type GaN layer, an active layer, and a p-type GaN layer on the sapphire substrate, wherein the u-GaN layer, a highly doped stop layer, an n-type GaN layer, an active layer, and a p-type GaN layer are a plurality of layers;

forming a plurality of stop points in the plurality of layers;

forming a conductive substrate on the p-type GaN layer;

removing the sapphire substrate using mechanical thinning;

removing a part of the u-GaN layer using mechanical thinning, wherein the mechanical thinning stops at an end of the plurality of stop points;

selectively etching the u-type GaN layer and exposing at least a part of the highly doped stop layer;

removing the u-type GaN layer; and

forming an n-electrode on the highly doped stop layer.

2. The method of claim 1 , wherein the step of selectively etching the u-GaN layer is high selective photoelectrochemical (PEC) etching.

3. The method of claim 1 , wherein the hardness of the plurality of stop points is greater than the hardness of the sapphire substrate.

4. The method of claim 1 , wherein the highly doped stop layer is one or more layers of AlInGaN.

5. The vertical GaN-based LED of claim 4 , wherein the composition of the AlInGaN is Al x In y Ga (1-x-y) N.

6. The vertical GaN-based LED of claim 5 , wherein x is less than or equal to approximately 0.35 and y is less than or equal to approximately 0.1.

7. The vertical GaN-based LED of claim 1 , wherein the highly doped stop layer is one or more layers of AlGaN.

8. The vertical GaN-based LED of claim 7 , wherein the composition of AlGaN is Al x Ga (1-x) N.

9. The vertical GaN-based LED of claim 8 , wherein x is less than or equal to approximately 0.35.

10. The vertical GaN-based LED of claim 1 , wherein the highly doped stop layer is a AlN/GaN super lattice structure.

11. The vertical GaN-based LED of claim 10 , wherein the AlN/GaN super lattice structure includes two or more pairs of AlN and GaN layers.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 3, 2008
From: CHU, HUNG SHEN; CAI, YONG
To: HONG KONG APPLIED SCIENCE AND TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 021627/0883 →
Continuity (2)
Continuation In Part 1189146600 · Aug 10, 2007
Related Publication 20090039383A1 · Feb 12, 2009