System and methods to determine and monitor changes in microstructural properties
View Patent ↗A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.
1. A system for determining and monitoring microstructure properties of a specimen, comprising:
a transducer holder including a top surface and a bottom surface;
a plurality of guides coupled to the transducer holder, wherein at least one of the guides is angularly positioned within the transducer holder with respect to the top surface;
a plurality of transducers each positioned within a corresponding guide within the transducer holder;
a voltage source configured to excite the transducers for transmitting multiple ultrasonic waves to a location on the specimen, wherein each transducer is configured to receive a scattered ultrasonic signal from the specimen in response to the transmitted ultrasonic waves using a pulse-echo technique;
a digital signal processor configured to digitize the scattered ultrasonic signal received by each transducer; and
a computer including a processor and a database, wherein the processor is configured to calculate a spatial variance value from the scattered ultrasonic signals as a function of spatial position, wherein the processor is configured to compare the spatial variance value to a theoretical spatial variance value stored in the database to assess a change in the microstructure properties of the specimen.
2. The system of claim 1 , further comprising a navigation device configured to determine position information of the ultrasonic waves at specific time intervals.
3. The system of claim 1 , wherein the database is configured to store the spatial variance values.
4. The system of claim 1 , wherein at least one of the guides is oriented at an angle of between about 0 degrees to 33 degrees.
5. The system of claim 1 , wherein the microstructure properties of the specimen are selected from the group of material properties including grain size, grain elongation, texture, and porosity.
6. The system of claim 1 , wherein the scattered ultrasonic signal received by each transducer comprises both longitudinal and shear waves.
7. The system of claim 1 , wherein the processor is further configured to calculate the spatial variance value from the scattered ultrasonic signals as a function of time.
8. A system for determining and monitoring microstructure properties of a specimen, comprising:
a plurality of transducers each configured to transmit and receive ultrasonic waves;
a means for coupling the transducers to a specimen, wherein said means is configured to orient at least one of the transducers at an angle relative to the specimen;
a voltage source configured to excite the transducers for transmitting multiple ultrasonic waves to a location on the specimen, wherein each transducer is configured to receive a scattered ultrasonic signal from the specimen in response to the transmitted ultrasonic waves; and
a processor configured to calculate a spatial variance value from the scattered ultrasonic signals as a function of spatial position and to compare the spatial variance value to one or more reference spatial values over time to assess a change in the microstructure properties of the specimen.
9. The system of claim 8 , further comprising a navigation device configured to determine position information of the ultrasonic waves at specific time intervals.
10. The system of claim 8 , further comprising a database configured to store the spatial variance values.
11. The system of claim 8 , wherein the at least one transducer is oriented at an angle of between about 0 degrees to 33 degrees.
12. The system of claim 8 , wherein the microstructure properties of the specimen are selected from the group of material properties including grain size, grain elongation, texture, and porosity.
13. The system of claim 8 , wherein the scattered ultrasonic signal received by each transducer comprises both longitudinal and shear waves.
14. The system of claim 8 , wherein the processor is further configured to calculate the spatial variance value from the scattered ultrasonic signals as a function of time.
15. The system of claim 8 , wherein the specimen is a rail, and wherein the means for coupling the transducers to the rail is configured to move along the rail.
16. A method for ultrasonic inspection of a specimen, comprising:
transmitting ultrasonic waves from a plurality of transducers to a location on a specimen;
receiving a scattered ultrasonic signal on each transducer in response to the transmitted ultrasonic waves;
digitizing the scattered ultrasonic signal received by each transducer;
determining a spatial variance value from the scattered ultrasonic signals as a function of spatial position;
comparing the spatial variance value to a reference spatial variance value to assess a change in the microstructure properties of the specimen.
17. The method of claim 16 , wherein transmitting the ultrasonic waves to a location on the specimen comprises transmitting a first ultrasonic wave from a first transducer oriented at a first angle and transmitting a second ultrasonic wave from a second transducer oriented at a second angle different from the first angle.
18. The method of claim 16 , further comprising determining position information of the ultrasonic waves at specific time intervals.
19. The method of claim 16 , further comprising analyzing the microstructure properties of the specimen by analyzing at least one material property from the group of material properties including grain size, grain elongation, texture, and porosity.
20. The method of claim 16 , further comprising determining the spatial variance value from the scattered ultrasonic signals as a function of time.