IP Library Granted Patent US 7,972,952
Granted Patent B2
US 7,972,952 · App. 12/095,175 · Granted Jul 5, 2011

Compound semiconductor light-emitting device and method for manufacturing the same

Assignee: Showa Denko K.K.
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Quick Facts
Patent No.
US 7,972,952
App. No.
12/095,175
Granted
Jul 5, 2011
Kind
B2
Abstract

A compound semiconductor light-emitting device which includes an n-type semiconductor layer, a light-emitting layer and a p-type semiconductor layer, that are made of a compound semiconductor, formed on a substrate, the n-type semiconductor layer and the p-type semiconductor layer are stacked so as to interpose the light-emitting layer therebetween, a first conductive transparent electrode and a second conductive electrode. The first conductive transparent electrode is made of an IZO film containing an In 2 O 3 crystal having a bixbyite structure. Also discussed is a method of manufacturing the device.

Claims (6)

1. A method for manufacturing a compound semiconductor light-emitting device, which comprises steps (a) to (c) shown below:

(a) a step of manufacturing a semiconductor wafer by stacking an n-type semiconductor layer, a light-emitting layer and a p-type semiconductor layer, that are made of a gallium nitride-based compound semiconductor, on a substrate, the n-type semiconductor layer and the p-type semiconductor layer being stacked so as to interpose the light-emitting layer therebetween,

(b) a step of stacking an amorphous IZO film on the p-type semiconductor layer, and

(c) a step of crystallizing the amorphous IZO film, wherein the step of crystallizing the amorphous IZO film is performed by a heat treatment at a temperature of from 700° C. to 900° C. in an O 2 free atmosphere.

2. The method for manufacturing a compound semiconductor light-emitting device according to claim 1 , wherein the step of stacking an amorphous IZO film on the p-type semiconductor layer is performed by a sputtering method.

3. The method for manufacturing a compound semiconductor light-emitting device according to claim 1 , wherein the heat treatment is performed in an N 2 gas atmosphere or in a mixed gas atmosphere of N 2 and H 2 .

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2012
From: SHOWA DENKO KABUSHIKI KAISHA
To: TOYODA GOSEI CO., LTD.
Reel/Frame 029489/0249 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 28, 2008
From: FUKUNAGA, NAOKI; SHINOHARA, HIRONAO
To: SHOWA DENKO K.K.
Reel/Frame 021008/0569 →
Priority Claims (1)
JP 2006-333582 · Dec 11, 2006 · national
Continuity (1)
Related Publication 20090267109A1 · Oct 29, 2009