Magnetic random access memory and method of manufacturing the same
View Patent ↗A magnetic random access memory includes, a lower electrode, a magnetoresistive element which is arranged above the lower electrode and has side surfaces, and a protective film which covers the side surfaces of the magnetoresistive element, has a same planar shape as the lower electrode, and is formed by one of sputtering, plasma CVD, and ALD.
1. A method of manufacturing a magnetic random access memory, comprising:
forming a material layer to be processed into a magnetoresistive element;
processing at least part of the material layer in a process apparatus to form the magnetoresistive element; and
forming a first protective film which covers side surfaces of the magnetoresistive element,
wherein the processing of the at least part of the material layer and the forming of the first protective film are performed in a consistently vacuum state in the process apparatus.
2. The method according to claim 1 , wherein the first protective film is formed by one of sputtering, plasma CVD, and ALD.
3. The method according to claim 1 , further comprising
before formation of the material layer, forming a lower electrode below the magnetoresistive element, and
after formation of the first protective film, processing the first protective film and the lower electrode at once.
4. The method according to claim 1 , further comprising forming, on the first protective film, a second protective film essentially formed of a material different from a material of the first protective film.
5. The method according to claim 4 , wherein the second protective film is formed by one of sputtering, plasma CVD, and ALD.
6. The method according to claim 4 , wherein the second protective film is formed in the consistently vacuum state in the process apparatus.
7. The method according to claim 4 , wherein the second protective film is formed only on the first protective film at an upper portion of the side surfaces of the magnetoresistive element.