IP Library Granted Patent US 7,855,379
Granted Patent B2
US 7,855,379 · App. 12/123,103 · Granted Dec 21, 2010

Electron device using oxide semiconductor and method of manufacturing the same

Assignee: Canon Kabushiki Kaisha
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,855,379
App. No.
12/123,103
Granted
Dec 21, 2010
Kind
B2
Abstract

In an electron device in which plural thin film transistors each having at least a source electrode, a drain electrode, a semiconductor region including a channel, a gate insulation film and a gate electrode are provided on a substrate, a device separation region provided between the plural thin film transistors and the semiconductor region are constituted by a same metal oxide layer, and resistance of the semiconductor region is formed to be lower than resistance of the device separation region.

Claims (11)

1. An electron device in which plural thin film transistors each having at least a source electrode, a drain electrode, a semiconductor region including a channel, a gate insulation film and a gate electrode are provided on a substrate, wherein

a device separation region provided between the plural thin film transistors and the semiconductor region are constituted by a same metal oxide layer, and resistance of the semiconductor region is formed to be lower than resistance of the device separation region.

2. An electron device according to claim 1 , wherein the thin film transistor has top gate structure, and the source electrode and the drain electrode are constituted by the same metal oxide layer as that constituting the device separation region and the semiconductor region, and resistance of the source electrode and resistance of the drain electrode are lower than the resistance of the semiconductor region.

3. An electron device according to claim 1 , wherein the thin film transistor has bottom gate structure.

4. An electron device according to claim 1 , wherein the metal oxide layer includes Zn and O.

5. An electron device according to claim 4 , wherein the metal oxide layer is amorphous metal oxide further including at least one kind selected from In, Ga, Al, Fe, Sn, Mg, Ca, Si and Ge.

6. An electron device according to claim 1 , wherein the device separation region has resistivity of 10 8 Ω·cm or more.

7. An electron device according to claim 1 , wherein the semiconductor region has resistivity of 10 3 Ω·cm or more and 10 7 Ω·cm or less.

8. A display apparatus in which the source electrode or the drain electrode described in claim 1 is connected to an electrode of a display device.

9. A display apparatus according to claim 8 , wherein the display device is an electroluminescent device.

10. A display apparatus according to claim 9 , wherein the display device is a liquid crystal cell or an electrophoretic particle cell.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 11, 2008
From: HAYASHI, RYO; SANO, MASAFUMI
To: CANON KABUSHIKI KAISHA
Reel/Frame 021075/0592 →
Priority Claims (1)
JP 2007-136697 · May 23, 2007 · national
Continuity (1)
Related Publication 20080291350A1 · Nov 27, 2008