Apparatus for obtaining planarity measurements with respect to a probe card analysis system
View Patent ↗A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.
1. A computer readable medium encoded with data and instructions for obtaining planarity measurements with respect to a probe card analysis system; said data and said instructions causing an apparatus executing said instructions to:
measure a planarity of a probe card;
compute planarity effects due to fiducial plate deflection;
combine planarity effects due to probe card deflection and due to probe card fixture deflection; and
calculate a load compensated planarity for said probe card by applying to the measured planarity of a probe card the computed planarity effects due to fiducial plate deflection and the combined planarity effects due to probe card deflection and probe card fixture deflection.
2. The computer readable medium of claim 1 further encoded with data and instructions; said data and said instructions further causing an apparatus executing said instructions to account for planarity effects due to stage deflection.
3. The computer readable medium of claim 1 further encoded with data and instructions; said data and said instructions further causing an apparatus executing said instructions to compute said planarity effects due to fiducial plate deflection utilizing an optical metrology data processing technique.
4. The computer readable medium of claim 3 further encoded with data and instructions; said data and said instructions further causing an apparatus executing said instructions to execute said optical metrology data processing technique by:
acquiring image data of a fiducial on said fiducial plate;
responsive to said acquiring, identifying deflection data values representative of a deflection of said fiducial plate; and
responsive to said identifying, providing correction data values enabling a first order correction of said deflection.
5. The computer readable medium of claim 4 further encoded with data and instructions; said data and said instructions further causing an apparatus executing said instructions to execute said optical metrology data processing technique by:
further identifying rate data values representative of a rate of deflection of said fiducial plate; and
responsive to said further identifying, providing additional correction data values enabling a second order correction of said deflection.