Dual emission microscope

1. A microscope device, comprising: means for creating a collimated beam of light collected from a sample and comprising at least a first spectral range and a second spectral range, means for separating the collimated beam into a first beam containing a higher percentage of light of the first spectral range than light of the second spectral range and a second beam containing a lower percentage of light of the first spectral range than light of the second spectral range, means for reflecting the first beam, means for reflecting the second beam, means for combining the first beam and the second beam, a detector, and means for imaging the combined first and second beam onto the detector in order to create an image of the sample derived from said first beam and an image of the sample from said second beam on the detector, wherein the means for reflecting the first beam and the means for reflecting the second beam are arranged in such a manner that the image created by the first beam and the image created by the second beam are shifted relative to each other on the detector, wherein the means for reflecting the first beam is adapted to invert handedness of the first beam, and wherein the means for reflecting the second beam is adapted to preserve handedness of the second beam.

2. The microscope device of claim 1 , wherein the means for reflecting the first beam is for providing for a single reflection of the first beam.

3. The microscope device of claim 2 , wherein the means for reflecting the first beam is a plane mirror.

4. The microscope device of one of the preceding claims, wherein the means for reflecting the second beam is for providing for two reflections of the second beam.

5. The microscope device of claim 1 , wherein the means for reflecting the second beam is a retroreflector with regard to one dimension.

6. The microscope device of claim 5 , wherein the means for reflecting the second beam is a roof prism.

7. The microscope device of claim 6 , wherein a ridge of the roof prism is located in a plane defined by an incoming portion the second beam and a reflected portion of the second beam.

8. The microscope device of claim 1 , wherein the means for separating the collimated beam is a first dichroic beamsplitter and wherein the means for combining the first and second beam is a second dichroic beamsplitter having a same spectral characteristics as the first dichroic beamsplitter.

9. The microscope device of claim 8 , wherein the means for reflecting the second beam is arranged to reflect the second beam coming from the first dichroic beamsplitter onto the second dichroic beamsplitter, and wherein the means for reflecting the first beam is arranged to reflect the first beam coming from the first dichroic beamsplitter onto the second dichroic beamsplitter.

10. The microscope device of claim 1 , wherein the means for separating the collimated beam and the means for combining the first and second beam is formed by a single dichroic beamsplitter.

11. The microscope device of claim 10 , wherein the means for reflecting the second beam is arranged to reflect the second beam coming from the single dichroic beamsplitter back onto the single dichroic beamsplitter, and wherein the means for reflecting the first beam is arranged to reflect the first beam coming from the single dichroic beamsplitter back onto the single dichroic beamsplitter.

12. The microscope device of claim 1 , wherein the means for creating a collimated beam comprise a projection lens and means for creating an intermediate image of the sample in a focal plane of the projection lens.

13. The microscope device of claim 12 , wherein the means for imaging the combined first and second beam onto the detector comprises the projection lens and wherein the means for creating a collimated beam comprise a means for confining the intermediate image to half a size of an active area of the detector or less.

14. The microscope device of claim 13 , wherein both dimensions of the intermediate image are radially shifted relative to an optical axis of the projection lens, and wherein the combined first and second beam as imaged by the projecting lens is radially shifted relative to the optical axis of the projecting lens and relative to the intermediate image.

15. The microscope device of claim 14 , wherein in the combined first and second beam the first beam and the second beam are divergent relative to each other in a dimension perpendicular to that dimension of the intermediate image which is radially shifted relative to the optical axis of the projecting lens.

16. A microscope device, comprising: means for creating a collimated beam of light collected from a sample comprising at least a first spectral range and a second spectral range, means for separating the collimated beam into a first beam containing a higher percentage of light of the first spectral range than light of the second spectral range, which first beam is reflected by said separating means, and a second beam containing a lower percentage of light of the first spectral range than light of the second spectral range, which second beam is transmitted by said separating means, means for reflecting the second beam back to the means for separating the collimated beam in order to combine the first beam and the second beam, a detector, and means for imaging the combined first and second beam onto the detector in order to create an image of the sample on the detector, wherein the separating means and the means for reflecting the second beam are arranged in such a manner that the image created by the first beam and the image created by the second beam are shifted relative to each other on the detector, wherein the separating means is adapted to invert handedness of the first beam, and wherein the means for reflecting the second beam is adapted to preserve handedness of the second beam.

17. The microscope device of claim 16 , wherein the means for reflecting the second beam and the beam separating means are integrated within a single member.

18. The microscope device of claim 17 , wherein the means for reflecting the second beam is a retroreflector.

19. The microscope device of claim 18 , wherein the means for reflecting the second beam is a roof prism, and wherein the separating means is a front face of the roof prism provided with dichroic coating.

20. The microscope device of claim 19 , wherein the roof prism is arranged such that the first beam is reflected at an angle by the coated front face of the roof prism whereas the second beam is back-reflected within the plane formed by that angle in order to make the first beam and the second beam divergent relative to each other and relative to an optical axis of the projecting lens.

21. The microscope device of claim 16 , wherein the means for creating a collimated beam comprise a projection lens and means for creating an intermediate image of the sample in a focal plane of the projection lens.

22. The microscope device of claim 21 , wherein the means for imaging the combined first and second beam onto the detector comprises the projecting lens.

23. The microscope device of claim 22 , wherein the means for creating a collimated beam comprise means for confining the intermediate image to half a size of an active area of the detector or less.

24. The microscope device of claim 23 , wherein both dimensions of the intermediate image are radially shifted relative to the optical axis of the projecting lens, and wherein the combined first and second beam as imaged by the projecting lens is radially shifted relative to the optical axis of the projecting lens and relative to the intermediate image.

25. A microscope device, comprising: means for creating a collimated beam of light collected from a sample and comprising at least a first polarisation and a second polarisation, means for separating the collimated beam into a first beam containing a higher percentage of light of the first polarisation than light of the second polarisation and a second beam containing a lower percentage of light of the first polarisation than light of the second polarisation, means for reflecting the first beam, means for reflecting the second beam, means for combining the first beam and the second beam, a detector, and means for imaging the combined first and second beam onto the detector in order to create an image of the sample derived from said first beam and an image of the sample from said second beam on the detector, wherein the means for reflecting the first beam and the means for reflecting the second beam are arranged in such a manner that the image created by the first beam and the image created by the second beam are shifted relative to each other on the detector, wherein the means for reflecting the first beam is adapted to invert handedness of the first beam, and wherein the means for reflecting the second beam is adapted to preserve handedness of the second beam.

26. A microscope device, comprising: means for creating a collimated beam of light collected from a sample comprising at least a first polarisation and a second polarisation, means for separating the collimated beam into a first beam containing a higher percentage of light of the first polarisation than light of the second polarisation, which first beam is reflected by said separating means, and a second beam containing a lower percentage of light of the first polarisation than light of the second polarisation, which second beam is transmitted by said separating means, means for reflecting the second beam back to the means for separating the collimated beam in order to combine the first beam and the second beam, a detector, and means for imaging the combined first and second beam onto the detector in order to create an image of the sample on the detector, wherein the separating means and the means for reflecting the second beam are arranged in such a manner that the image created by the first beam and the image created by the second beam are shifted relative to each other on the detector, wherein the separating means is adapted to invert handedness of the first beam, and wherein the means for reflecting the second beam is adapted to preserve handedness of the second beam.