Optical detection and analysis of particles
View Patent ↗Method and apparatus for the single particle detection of submicron structures such as biological molecules and viruses utilises an optical element ( 100 ) comprising an optically transparent substrate ( 1 ) partially coated with a thin film of metal ( 2 ) illuminated with an optical beam ( 4 ) incident on a non-metal coated region ( 3 ) of the surface of the optical element at a point adjacent or close to the metal coated region of the optical element such that the beam propagates above but close and substantially parallel to the metal surface defining a measurement zone from within which submicron particles ( 7 ) contained in a sample ( 6 ) placed in contact with the optical element scatter or emit light which can be detected in the far field by conventional photodetection systems. The apparatus can be configured in a flow cell or optical microscope configuration.
1. Apparatus for the optical detection and/or analysis of individual sub-micron particles, the apparatus comprising: a substrate, part of one surface of which is coated with a film comprising an optically opaque metal, and part of which surface is left uncoated, such that the surface has a coated portion and an uncoated portion; means for illuminating said substrate with a focussed beam of radiation from a source, such that a focussed optical beam is caused to be incident on the substrate at a point on the uncoated portion of the surface adjacent to, but not coincident with, the metal film coated portion of the surface, such that the optical beam is caused to propagate above but substantially parallel or at an angle of less than 5° and close to the surface of the metal film; and means for individually detecting, by a lens and detector arrangement situated in the far field at the normal or high angle to the plane of the metal film, the optical radiation individually scattered by, or otherwise caused to emanate from, individual particles in a sample placed on the coated portion of the substrate surface through their interaction with the optical beam.
2. Apparatus according to claim 1 , wherein the source is a laser.
3. Apparatus according to claim 1 , wherein the substrate is part of a larger assembly designed and constructed for purposes other than particle detection.
4. Apparatus according to claim 1 , wherein the lens and detector arrangement comprises a conventional microscope.
5. Apparatus according to claim 1 , in combination with a flow cytometer instrument.
6. Apparatus according to claim 1 , wherein the substrate comprises or is formed from a wholly or partially optically transparent material.
7. Apparatus according to claim 1 , wherein the focussed optical beam is incident upon one surface of the substrate, is refracted during passage through the substrate, and emerges at the opposite surface at a slight angle adjacent or close to the metal film coated portion of said surface.
8. A microscope or flow cytometer comprising apparatus in accordance with claim 1 .
9. Apparatus according to claim 1 , wherein the focused optical beam is caused to be incident on the substrate at a point on the uncoated portion of the surface within 5 mm of the metal film coated portion of the surface.