IP Library Granted Patent US 8,487,884
Granted Patent B2
US 8,487,884 · App. 12/145,004 · Granted Jul 16, 2013

Touch screen detection and diagnostics

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Quick Facts
Patent No.
US 8,487,884
App. No.
12/145,004
Granted
Jul 16, 2013
Kind
B2
Abstract

A method includes driving a current through a touch screen that is based on contact of the touch screen, generating a proportional second current, and detecting contact of the touch screen from the second current. Another method includes providing a touch screen with parallel plates, disabling contact detection when a plate voltage is lower than a threshold voltage, and enabling contact detection when the plate voltage is at least equal to the threshold voltage. A device includes a first node and a second node coupled to a touch screen, a third node, a first current mirror coupled to the second node and the third node configured to generate a current at the third node that is proportional to a second current at the second node, and a detection circuit that provides a signal based on the first current that indicates contact of the touch screen.

Claims (46)

1. A method comprising:

driving a first current at a touch screen in response to a contact event to the touch screen, a magnitude of the first current based on a presence of the contact event to the touch screen;

generating a second current proportional to the first current via a first current mirror;

generating a voltage at a detection node based on the second current;

detecting the contact event based on the voltage at the detection node; and

determining whether the touch screen is shorted to a reference voltage based on whether the voltage at the detection node changes in response to a presence of the contact event at the touch screen.

2. The method of claim 1 , further comprising generating the first current via a second current mirror and a reference current.

3. The method of claim 1 , further comprising:

determining whether the touch screen is in one of a persistent open-circuit state or a persistent closed-circuit state based on whether the voltage at the detection node changes in response to a presence of the contact event at the touch screen.

4. The method of claim 1 , wherein the touch screen comprises a pair of parallel conductive plates, the method further comprising:

disabling detection of the contact event responsive to a select plate of the pair of parallel conductive plates having a voltage lower than a threshold voltage; and

enabling detection of the contact event responsive to the select plate having a voltage at least equal to the threshold voltage.

5. A method comprising:

providing a touch screen comprising a pair of parallel conductive plates;

disabling detection of a contact event to the touch screen responsive to a select plate of the pair of parallel conductive plates having a voltage lower than a threshold voltage, wherein the contact event results in an electrical contact between the pair of parallel conductive plates; and

enabling detection of a contact event to the touch screen responsive to the select plate having a voltage at least equal to the threshold voltage.

6. The method of claim 5 , further comprising:

driving a current to the touch screen, the current having a magnitude based on whether a contact event is present at the touch screen, wherein the current is a direct current;

generating a voltage at a detection node based on the current; and

in response to enabling detection of a contact event, detecting a contact event based on the voltage at the detection node.

7. The method of claim 6 , further comprising:

determining whether the touch screen is shorted to a supply voltage based on whether the voltage at the detection node changes in response to a presence of the contact event at the touch screen.

8. The method of claim 6 , further comprising:

determining whether the touch screen is in one of a persistent open-circuit state or a persistent closed-circuit state based on whether the voltage at the detection node changes in response to a presence of the contact event at the touch screen.

9. A device comprising:

a first node adapted to be coupled to an interface of a touch screen;

a second node adapted to be coupled to the interface of the touch screen;

a third node;

a first current mirror coupled to the second node and the third node, the first current mirror configured to generate a first current at the third node that is proportional to a second current flowing through the touch screen from the first node to the second node; and

a detection circuit adapted to provide a signal based on the first current, the signal indicating whether a contact event is present at the touch screen.

10. The device of claim 9 , further comprising:

a second current mirror coupled to the first node, the second current mirror configured to generate the second current at the first node based on a reference current.

11. The device of claim 10 , further comprising:

a third current mirror coupled to the third node, the third current mirror configured to generate the first current at the third node in conjunction with the first current mirror and based on the reference current.

12. The device of claim 9 , wherein the touch screen comprises a pair of parallel capacitive plates, the device further comprising:

a pre-charge circuit adapted to pre-charge the pair of parallel capacitive plates based on the second current.

13. The device of claim 12 , further comprising:

a false touch detect circuit adapted to:

configure the first logic to disable detection of a contact event to the touch screen responsive to a select plate of the pair of parallel conductive plates having a voltage lower than a threshold voltage; and

configure the first logic to enable detection of a contact event to the touch screen responsive to the select plate having a voltage at least equal to the threshold voltage.

14. The device of claim 9 , further comprising:

diagnostic logic adapted to determine whether the touch screen is shorted to a supply voltage based on whether a voltage at the third node changes in response to a presence of a contact event at the touch screen.

15. The device of claim 9 , further comprising:

diagnostic logic adapted to determine whether the touch screen is in one of a persistent open-circuit state or a persistent closed-circuit state based on whether a voltage at the third node changes in response to a presence of a contact event at the touch screen.

16. The method of claim 1 , wherein the first current is a direct current.

17. The device of claim 9 , wherein the first current is a direct current.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
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Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Mar 15, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 024085/0001 →
SECURITY AGREEMENT Recorded Sep 24, 2008
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 021570/0449 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 24, 2008
From: DE GOES, MARCOS AUGUSTO; OLMOS, ALFREDO; PIETRI, STEFANO
To: FREESCALE SEMICONDUCTOR, INC.
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