Lead frame based semiconductor package and a method of manufacturing the same
View Patent ↗A method of manufacturing a semiconductor package, where the package includes a surface for attachment of the package to a device by a joint formed of a connective material in a joint area of the surface. The method is characterised in that it comprises the step of patterning one or more channels on the surface which channels extend away from the joint area towards an edge of the surface. Also the method has the step of applying a compound to one or more channels which compound interacts with the connective material, such that when the semiconductor package is attached to the device the interaction defines one or more paths in the connective material. These correspond to the one or more channels on the surface and allow the passage of waste material away from the joint area to the outer edge of the surface.
1. A method of manufacturing a semiconductor package, the package including a surface for attachment of the package to a device by a joint formed of a connective material in a joint area of the surface, the method comprising the steps of:
patterning one or more channels on the surface, which channels extend away from the joint area towards an edge of the surface, the joint area to be disposed between the surface of package and the device;
applying a compound into said one or more channels which compound interacts with the connective material, such that when the semiconductor package is attached to the device the interaction defines one or more paths in the connective material which correspond to the one or more channels on the surface and which allow the passage of waste material away from the joint area to the outer edge of the surface; and
introducing a strengthening element into the or each channel, wherein the channel has two elongate sides and the strengthening element is introduced at a point between the two sides to prevent relative movement thereof.
2. The method of claim 1 , further comprising forming the strengthening element to be substantially arcuate in cross-section and substantially bow shaped in plan view.
3. The method of claim 2 , wherein the method further comprises applying a compound having a wettability less than that of the surface, such that the paths are formed by the none-wetting of the connective material and the compound.
4. The method of claim 2 , further comprising:
forming a fluid layer of the connective material between the package and the device which fluid layer flows away from the compound in the channels to define the paths in the connective material;
causing said fluid layer to solidify to form said joint; and
venting any waste products formed during the steps through the paths.
5. The method of claim 2 , further comprising applying said compound as part of the step of applying a mold compound to the package to encapsulate the same.
6. The method of claim 2 , further comprising attaching one or more devices to the package.
7. The method of claim 1 , wherein the method further comprises applying a compound having a wettability less than that of the surface, such that the paths are formed by the none-wetting of the connective material and the compound.
8. The method of claim 7 , further comprising:
forming a fluid layer of the connective material between the package and the device which fluid layer flows away from the compound in the channels to define the paths in the connective material;
causing said fluid layer to solidify to form said joint; and
venting any waste products formed during the steps through the paths.
9. The method of claim 7 , further comprising applying said compound as part of the step of applying a mold compound to the package to encapsulate the same.
10. The method of claim 7 , further comprising:
patterning one or more further channels on a surface of any device;
applying a compound to said one or more further channels which compound interacts with the connective material, such that when the semiconductor package is attached to the device the connective material has defined therein one or more further paths which correspond to the one or more further channels on the surface of the device and which allow the passage of waste material away from the joint.
11. The method of claim 1 , further comprising:
forming a fluid layer of the connective material between the package and the device which fluid layer flows away from the compound in the channels to define the paths in the connective material;
causing said fluid layer to solidify to form said joint; and
venting any waste products formed during the steps through the paths.
12. The method of claim 1 , further comprising applying said compound as part of the step of applying a mold compound to the package to encapsulate the same.
13. The method of claim 12 , further comprising pattering an indent at one or more edges of the package surface to provide a surface to which the mold compound can affix to provide an overlapping seal at the edge of the surface.
14. The method of claim 1 , further comprising attaching one or more devices to the package.
15. The method of claim 1 , further comprising:
patterning one or more further channels on a surface of any device;
applying a compound into said one or more further channels which compound interacts with the connective material, such that when the semiconductor package is attached to the device the connective material has defined therein one or more further paths which correspond to the one or more further channels on the surface of the device and which allow the passage of waste material away from the joint.
16. The method of claim 15 , further comprising forming the channels and further channels to substantially correspond with one another, such that the path and further paths form an augmented path.
17. A method of manufacturing a semiconductor package, the package including a surface for attachment of the package to a device by a joint formed of a connective material in a joint area of the surface, the method comprising the steps of:
patterning one or more channels on the surface, which channels extend away from the joint area towards an edge of the surface and having two elongated sides, the channels including a strengthening element at a point between the two sides, the joint area to be disposed between the surface of the package and the device; and
applying a compound into said one or more channels which compound interacts with the connective material, such that when the semiconductor package is attached to the device the interaction defines one or more paths in the connective material which correspond to the one or more channels on the surface and which allow the passage of waste material away from the joint area to the outer edge of the surface, the compound having a wettability less than that of the surface.
18. The method of claim 17 , wherein the strengthening element is substantially arcuate in cross-section and substantially bow shaped in plan view.
19. A method of manufacturing a semiconductor package, the package including a surface for attachment of the package to a device by a joint formed of a connective material in a heat transfer joint area of the surface, the method comprising the steps of:
patterning one or more channels in the heat transfer joint area of the surface, the heat transfer joint area to be disposed between the surface of the package and the device, the surface further including a plurality of connector joint areas, which channels have two elongated sides, the channels including a strengthening element at a point between the two sides, the strengthening element being substantially arcuate in cross-section and substantially bow shaped in plan view;
applying a compound into said one or more channels which compound interacts with the connective material, such that when the semiconductor package is attached to the device the interaction defines one or more paths in the connective material which correspond to the one or more channels in the heat transfer joint area of the surface and which allow the passage of waste material away from the heat transfer joint area to the outer edge of the surface;
forming a fluid layer of the connective material between the package and the device which fluid layer flows away from the compound in the channels to define the one or more paths in the connective material;
causing said fluid layer to solidify to form said joint; and
venting any waste products formed during the steps through the one or more paths.
20. The method of claim 19 , wherein the compound has a wettability less than that of the surface, such that the paths are formed by the none-wetting of the connective material and the compound.