IP Library Granted Patent US 9,532,454
Granted Patent B2
US 9,532,454 · App. 12/159,809 · Granted Dec 27, 2016

Monolithic ceramic component and production method

Inventors: Christian Block (Stainz, AT); Pavol Dudesek (Bad Gams, AT); Thomas Feichtinger (Graz, AT); Christian Hoffmann (Deutschlandsberg, AT); Guenter Pudmich (Köflach, AT)
Assignee: EPCOS AG
H05K1/162B32B18/00H01C1/14H01C7/18H01G4/232H01G4/30H01G4/40H01L21/4857H01L23/49822H01L23/552C04B2235/6562C04B2235/6565C04B2235/6567C04B2237/341C04B2237/343C04B2237/346C04B2237/348C04B2237/366C04B2237/564C04B2237/62C04B2237/68C04B2237/702C04B2237/704H01F10/20H01F10/265H01F17/0013H01L25/16H01L2924/0002H01L2924/09701H01L2924/3011H03H2001/0085H05K1/0306H05K1/165H05K1/167H05K3/4611H05K3/4629H05K3/4688Y10T428/265
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Quick Facts
Patent No.
US 9,532,454
App. No.
12/159,809
Granted
Dec 27, 2016
Kind
B2
Abstract

A film stack made from compacted green films and capable of being sintered to form a ceramic component with monolithic multi-layer structure is disclosed. The film stack includes a functional layer comprising a green film comprising a functional ceramic and a tension layer comprising a green film comprising a dielectric material. The tension layer is directly adjacent to the functional layer in the multi-layer structure. The multilayer structure also includes a first metallization plane and a second metallization plane. The functional layer is between the first metallization plane and the second metallization plane.

Claims (28)

1. A monolithic sintered component with monolithic multi-layer structure, comprising:

a functional layer comprising a functional ceramic,

a tension layer comprising a dielectric material directly adjacent to the functional layer in the multi-layer structure, the tension layer including a plurality of crystalline domains disposed in a matrix, the matrix including a recrystallized material,

a first metallization plane and a second metallization plane, the functional layer being between the first metallization plane and the second metallization plane,

electrically conductive structures, which form a component function together with the functional layer, in the first and second metallization planes, and

wherein the functional ceramic has a sintering temperature which lies above a phase-change temperature of the dielectric material.

2. The monolithic sintered component of claim 1 , wherein the functional layer comprises several metallization planes with electrically conductive structures.

3. The monolithic sintered component of claim 2 , wherein the multi-layer structure comprises solderable electrical contact surfaces including via contacts on a bottom side of the multi-layer structure, the via contacts being configured to electrically connect the solderable electrical contacts to the electrically conductive structures in the interior or on the surface of the multi-layer structure.

4. The monolithic sintered component of claim 1 , wherein the recrystallized material comprises a glass ceramic.

5. The monolithic sintered component of claim 4 , wherein the tension layer comprises a glass ceramic made from alkali borosilicate, alumoborosilicate, alumosilicate, lanthanum borate titanate, or alkaline earth lanthanum borate.

6. The monolithic sintered component of claim 1 , wherein the component function includes a function of a component type selected from the group consisting of a resistor, a capacitor, an inductor, a varistor, and a thermistor, and

the functional ceramic is selected based on the component type from a group of materials consisting of a resistor material, a capacitor ceramic, a ferrite, a varistor material, and PTC or NTC ceramic.

7. The monolithic sintered component of claim 6 , further comprising a discrete electrical component mounted on a surface of the film stack and electrically connected to the component.

8. The monolithic sintered component of claim 1 , wherein the phase-change or recrystallization temperature of the dielectric material is at least 50 kelvin less than the sintering temperature of the functional ceramic.

9. The monolithic sintered component of claim 1 , further comprising a plurality of tension layers, and

wherein functional layer and the plurality of tension layers are arranged in an alternating sequence.

10. The monolithic sintered component of claim 9 , wherein the multi-layer structure is symmetrical in the stack direction with respect to the layer sequence and layer thicknesses.

11. The monolithic sintered component of claim 1 , wherein a thickness of the tension layer is between 15 and 300 μm.

12. The monolithic sintered component of claim 1 , wherein the multi-layer structure further comprises additional layers or comprises multiple functional layers.

13. The monolithic sintered component of claim 1 , wherein the crystalline domains are insulated phases that include a material selected from the group consisting of Al 2 O 3 , TiO 2 , and ZrO 2 .

14. The monolithic sintered component of claim 1 , wherein the functional ceramic has a sintering temperature above 950° C.

15. The monolithic sintered component of claim 1 , wherein:

the functional layer comprises a green film;

the tension layer comprises a green film; and

the green film for the tension layer has a phase-change temperature below a sintering temperature of the functional ceramic and at which the green film transitions into a recrystallized phase that remains in a solid phase above the sintering temperature of the functional ceramic.

16. The monolithic sintered component of claim 1 , wherein the crystalline domains include a mineral oxide.

17. The monolithic sintered component of claim 1 , wherein the functional ceramic has a sintering temperature greater than or equal to about 1000° C.

18. The monolithic sintered component of claim 1 , wherein the tension layer has a thickness sufficient to tension the functional layer during sintering of the functional layer.

Assignments (2)
CHANGE OF NAME Recorded Oct 26, 2022
From: EPCOS AG
To: TDK ELECTRONICS AG
Reel/Frame 061774/0102 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 29, 2008
From: BLOCK, CHRISTIAN; DUDESEK, PAVOL; FEICHTINGER, THOMAS; HOFFMANN, CHRISTIAN; PUDMICH, GUENTER
To: EPCOS AG
Reel/Frame 021609/0474 →
Priority Claims (1)
DE 10 2006 000 935 · Jan 5, 2006 · national
Continuity (1)
Related Publication 20090035560A1 · Feb 5, 2009