Semiconductor device with welded leads and method of manufacturing the same
View Patent ↗A semiconductor device and a manufacturing method for preventing mechanical and thermal damage to the semiconductor chip. A laser beam welds a first connection pad formed on a first external lead to a first electrode formed on the surface of the semiconductor chip. A first connection hole is formed in the first connection pad, and the first connection hole overlaps the first connection electrode. A laser beam irradiates an area including the first connection hole, and the first connection pad in a portion around the first connection hole is melted to form a melting section, that is welded to the first connection electrode to easily form a semiconductor device with more excellent electrical characteristics.
1. A semiconductor device comprising:
a semiconductor chip containing a first connection electrode formed on a top surface thereof; and
a first external lead including a first connection pad formed with a first connection hole,
wherein the first connection hole overlaps the first connection electrode, and a melting section which is a melted portion of the first connection pad is welded to the first connection electrode in a portion around the first connection hole, and
the melting point of the first connection pad is lower than that of the first connection electrode so that the first connection electrode is not melted,
wherein the first connection electrode includes an underlayer and a melt prevention layer formed above that underlayer.
2. A semiconductor device comprising:
a semiconductor chip containing a first connection electrode formed on a top surface thereof; and
a first external lead including a first connection pad formed with a first connection hole,
wherein the first connection hole overlaps the first connection electrode, and a melting section which is a melted portion of the first connection pad is welded to the first connection electrode in a portion around the first connection hole, and
the melting point of the first connection pad is lower than that of the first connection electrode so that the first connection electrode is not melted,
wherein the first connection pad contains a base material and a melt accelerator layer formed on a top surface of the base material.