Patent Assignment
Reel/Frame 025214/0304
Change of Name
Recorded: 2010-10-28
Received: 2010-10-28
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, JPX, 211-8668, JAPAN
Covered Properties
(92)
Method of Manufacturing Interconnect Substrate and Semiconductor Device
Application:
12/212,690 →
Host Controller Device and Data Transfer Control Method
Application:
12/212,965 →
Semiconductor Device and Dram Controller
Application:
12/212,159 →
Method for Forming Interlayer Dielectric Film, Interlayer Dielectric Film, Semiconductor Device and Semiconductor Manufacturing Apparatus
Application:
12/212,396 →
Semiconductor Device Having a Through Electrode, Semiconductor Module Employing Thereof and Method for Manufacturing Semiconductor Device Having a Through Electrode
Application:
12/210,551 →
Semiconductor Device and Method of Manufacturing Same
Application:
12/210,702 →
Semiconductor Device
Application:
12/207,098 →
Electronic Device Having Transformer
Application:
12/206,262 →
Method of Fabricating Semiconductor Device
Application:
12/205,950 →
Solid Imaging Device
Application:
12/204,912 →
Segmented Photodiode
Application:
12/204,078 →
Method of Manufacturing Semiconductor Device Having Plural Dicing Steps
Application:
12/203,189 →
Lead Frame, Semiconductor Device, and Method of Manufacturing Semiconductor Device
Application:
12/203,374 →
Semiconductor Device Including Fuse and Method for Testing the Same Capable of Suppressing Erroneous Determination
Application:
12/202,903 →
Semiconductor Device
Application:
12/202,467 →
Semiconductor Device
Application:
12/200,940 →
Reference Voltage Generating Circuit and Timer Circuit
Application:
12/200,351 →
Lead Cutter and Method of Fabricating Semiconductor Device
Application:
12/200,574 →
Data Processing Device and Power Supply Voltage Generator That Control a Power Supple Voltage During an Auxiliary Period, and Method of Controlling the Power Supply Voltage Thereof During an Auxiliary Period
Application:
12/199,183 →
Microprocessor
Application:
12/194,559 →
Differential Transmitter, Differential Receiver, Signal Transmitter, and Signal Transmitting System
Application:
12/194,578 →
Semiconductor Device
Application:
12/193,385 →
Video Signal Processing Device, Video Signal Processing Method and Display Device
Application:
12/193,418 →
Branch Prediction Device,Branch Prediction Method, and Microprocessor
Application:
12/191,071 →
Semiconductor Device Using Logic Chip
Application:
12/190,196 →
Vacuum Processor
Application:
12/190,045 →
Semiconductor Device and Method for Manufacturing Same
Application:
12/187,619 →
Exposure Equipment, Exposure Method, and Manufacturing Method for a Semiconductor Device
Application:
12/186,761 →
Fuse Circuit
Application:
12/185,837 →
Fuse Circuit
Application:
12/185,183 →
Packet Communication Apparatus and Communication Line Quality Analyzing Method
Application:
12/182,198 →
Carbon Containing Silicon Oxide Film Having High Ashing Tolerance and Adhesion
Application:
12/180,652 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/180,597 →
Current Drive Circuit
Application:
12/179,673 →
Semiconductor Device and Offset Voltage Adjusting Method
Application:
12/179,666 →
Semiconductor Device and Method of Manufacturing Same
Application:
12/178,683 →
Method for Manufacturing Semiconductor Device
Application:
12/177,902 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/178,151 →
Semiconductor Device Having External Connection Terminals and Method of Manufacturing the Same
Application:
12/177,458 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/175,725 →
Multiplexing Commands from Processors to Tightly Coupled Coprocessor Upon State Based Arbitration for Coprocessor Resources
Application:
12/175,882 →
Multiprocessor Apparatus
Application:
12/175,700 →
Semiconductor Storage Device and Test Method Therefor
Application:
12/174,656 →
Method of Manufacturing Semiconductor Device with Connecting via and Dummy Via
Application:
12/174,330 →
Evaluation Device Consisting of a Logic Simulator and a Simulation Result Table
Application:
12/172,346 →
Charge Pump Drive Circuit
Application:
12/172,565 →
Microcontroller and Control Method Therefor
Application:
12/216,769 →
Audio Processor Having Dynamic Automatic Control Function of Operating Frequency
Application:
12/170,521 →
Semiconductor Device Having a Sealing Resin and Method of Manufacturing the Same
Application:
12/169,930 →
Semiconductor Memory Device and Data Storage Method Including Address Conversion Circuit to Convert Coordinate Information of Data into One-Dimensional Information to Amplifier
Application:
12/216,673 →
Video Signal Processing Apparatus Performing Gamma Correction by Cubic Interpolation Computation, and Method Thereof
Application:
12/216,672 →
Semiconductor Device
Application:
12/216,671 →
Semiconductor device and method for manufacturing same
Application:
12/216,665 →
Flat Panel Display Device and Data Processing Method for Video Data
Application:
12/216,608 →
Semiconductor Device Including Capacitor Element Provided Above Wiring Layer That Includes Wiring with an Upper Surface Having Protruding Portion
Application:
12/216,601 →
Semiconductor Device and Method of Controlling the Same
Application:
12/168,986 →
Display Device Driving Circuit of Which Power Consumption Is Reduced, Control Method Thereof, and Display Device Using the Same
Application:
12/216,612 →
Data Driver for Display Device, Test Method and Probe Card for Data Driver
Application:
12/216,611 →
Dual Damascene Multilayer Interconnect Structure Having Film Density of the Wiring Groove Sidewall Portion Away from via Hole Contact Lower Than the Sidewall Portion Directly Above the via Hole Contact.
Application:
12/160,149 →
Boosting Circuit and Boosting Method
Application:
12/216,487 →
Boosting Circuit and Integrated Circuit Having the Same
Application:
12/167,287 →
Display Driver Circuit and Dac of a Display Device with Partially Overlapping Positive and Negative Voltage Ranges and Reduced Transistor Breakdown Voltage
Application:
12/167,263 →
Method of Manufacturing a Semiconductor Device Having a Trench Surrounding Plural Unit Cells
Application:
12/165,991 →
Method and Apparatus for Inspection and Fault Analysis
Application:
12/164,594 →
Failure Analysis Method and Failure Analysis Apparatus
Application:
12/164,437 →
Method of Designing a Semiconductor Device
Application:
12/164,391 →
Semiconductor Integrated Circuit Device
Application:
12/164,507 →
Semiconductor Device with Three-Dimensional Field Effect Transistor Structure
Application:
12/216,061 →
Semiconductor Device with Welded Leads and Method of Manufacturing the Same
Application:
12/163,055 →
Electronic Device and Method for Manufacturing Electronic Device
Application:
12/213,967 →
A/D Converter
Application:
12/213,966 →
Test circuit and test method
Application:
12/213,961 →
Reconfigurable Device
Application:
12/213,959 →
Liquid crystal display device and control driver for a liquid crystal display device
Application:
12/213,968 →
Layout Design Method for a Semiconductor Integrated Circuit
Application:
12/213,963 →
Data line driving circuit, display device and method of driving data line
Application:
12/213,774 →
Spread Spectrum Clock Generator
Application:
12/213,781 →
Semiconductor Device Having Transfer Gate Between Pre-Buffer and Main Buffer
Application:
12/213,780 →
Display Device
Application:
12/213,663 →
Capacitive load driving circuit, capacitive load driving method, and driving circuit for liquid crystal display device
Application:
12/213,666 →
Semiconductor Device Including Semiconductor Evaluation Element, and Evaluation Method Using Semiconductor Device
Application:
12/213,664 →
Step-Up Power Supply Circuit and Stepping-Up Method
Application:
12/213,662 →
Display Control Device and Method of Controlling Same
Application:
12/213,561 →
Successive Approximation Type a/D Converter
Application:
12/213,560 →
Apparatus and Method for Integrated Circuit Design with Improved Delay Variation Calculation Based on Power Supply Variations
Application:
12/213,557 →
Power Supply Voltage Detection Circuit and Semiconductor Integrated Circuit Device
Application:
12/213,512 →
Software Product for Semiconductor Device Design
Application:
12/213,412 →
Power-residue calculating unit and method of controlling the same
Application:
12/213,319 →
Voltage-Controlled Oscillator Circuit and Phase Locked Loop Circuit Using the Same
Application:
12/213,369 →
Automatic Delay Adjusting Method for Semiconductor Integrated Circuit by Using Dummy Wiring
Application:
12/213,372 →
Data Line Drive Circuit and Method for Driving Data Lines
Application:
12/213,279 →
Digital-To-Analog Converter and Distortion Correction Circuit
Application:
12/213,196 →