Automatic delay adjusting method for semiconductor integrated circuit by using dummy wiring

1. An automatic delay adjusting method of a semiconductor integrated circuit, said method comprising:

placing a dummy wiring to a layout data, as executed by a processing unit on a computer; and

connecting the dummy wiring to a target wiring which produces a timing violation, the target wiring being connected between first and second cells in the layout data,

the dummy wiring connection comprising:

replacing the dummy wiring with a dummy wiring cell having first and second pins respectively corresponding to first and second ends of the dummy wiring;

cutting the target wiring to generate first and second target wirings;

connecting the first and second target wirings to the first and second pins, respectively; and

replacing the dummy wiring cell with the dummy wiring to provide a wiring that is connected between the first and second cells through the dummy wiring and the target wiring.

2. The automatic delay adjusting method according to claim 1 , wherein said dummy wiring placing comprises:

placing a plurality of dummy wirings in a coordinate area, and

wherein said dummy wiring connection further comprises:

searching the dummy wiring closest to the target wiring among the plurality of dummy wirings when the timing violation occurs for the target wiring.

3. The automatic delay adjusting method according to claim 1 , wherein the layout data further includes a plurality of wirings, and

wherein the method further comprises searching a target wiring for which the timing violation occurs among the plurality of wirings.

4. The automatic delay adjusting method according to claim 3 , wherein the timing search further includes:

calculating respective delay times of the plurality of wirings with reference to a delay information file that associates wiring lengths with delay times thereof;

searching information whether a delay time is longer than first and second hold violation setting times, when a delay time of a hold violation occurs for the target wiring among the plurality of wirings, a second hold violation setting time being longer than a first hold violation setting time; and

executing the dummy wiring connection when a delay time of the target wiring is longer than the first hold violation setting time and equal to or shorter than the second hold violation setting time as the timing violation.

5. The automatic delay adjusting method according to claim 4 , further comprising:

placing a hold buffer cell to repair hold for making the delay time longer than a delay time of the dummy wiring on the target wiring, to generate a wiring connected to the hold buffer cell, when the delay time of the target wiring exceeds the second hold violation setting time;

again executing the timing search with the wiring connected to the hold buffer cell as the target wiring, when the wiring connected to a hold buffer cell is generated; and

executing the dummy wiring connection when the delay time of the target wiring is longer than the first hold violation setting time, and equal to or shorter than the second hold violation setting time as the timing violation, when the timing search is again executed.

6. The automatic delay adjusting method according to claim 4 , further comprising:

again executing the timing search with the modified wiring as the target wiring, when the dummy wiring connection is executed; and

again executing the dummy wiring connection when the delay time of the target wiring is longer than the first hold violation setting time, and equal to or shorter than the second hold violation setting time as the timing violation, when the timing search is again executed.

7. The automatic delay adjusting method according to claim 6 , further comprising:

again executing the timing search with the modified wiring as the target wiring, when the dummy wiring connection is executed; and

outputting the layout data to an output device when the timing violation does not occur for the target wiring, when the timing search is again executed.

8. The automatic delay adjusting method according to claim 1 , further comprising:

outputting the layout data to an output device, when the dummy wiring connection is executed.

9. The automatic delay adjusting method according to claim 1 , further comprising:

connecting the first and second pins to the first and second target wirings, respectively.

10. The automatic delay adjusting method according to claim 1 , wherein the first cell is connected through the target wiring and the dummy wiring to the second cell.

11. The automatic delay adjusting method according to claim 1 , further comprising:

placing a hold buffer cell to repair hold for making a delay time longer than a delay time of the dummy wiring on the target wiring, to generate a wiring connected to the hold buffer cell, when a delay time of the target wiring exceeds a hold violation setting time.

12. A program product comprising a non-transitory computer readable medium storing a program to adjust a timing of a semiconductor integrated circuit, the program product comprising:

placing a dummy wiring to layout data; and

connecting the dummy wiring to a target wiring which produces a timing violation, the target wiring being connected between first and second cells in the layout data,

wherein the dummy wiring connection comprises:

replacing the dummy wiring with a dummy wiring cell having first and second pins respectively corresponding to first and second ends of the dummy wiring;

cutting the target wiring to generate first and second target wirings;

connecting the first and second target wirings to the first and second pins, respectively; and

replacing the dummy wiring cell with the dummy wiring to provide a wiring that is connected between the first and second cells through the dummy wiring and the target wiring.

13. The program product according to claim 12 , wherein the placing of the dummy wiring comprises placing a plurality of dummy wirings in a coordinate area, and

wherein the dummy wiring connection further comprises searching the dummy wiring closest to the target wiring among the plurality of dummy wirings when the timing violation occurs for the target wiring.

14. The program product according to claim 12 , wherein the layout data further comprises a plurality of wirings, and

wherein the program makes a computer execute searching the target wiring for which the timing violation occurs among the plurality of wirings.

15. The program product according to claim 14 , wherein the timing search further comprises:

calculating respective delay times of the plurality of wirings with reference to a delay information file that associates wiring lengths with delay times thereof; and

searching information whether the delay time is longer than first and second hold violation setting times, when a delay time of the target wiring among the plurality of wirings for which a hold violation occurs, a second hold violation setting time being longer than a first hold violation setting time,

wherein the program makes the computer execute the dummy wiring connection when the delay time of the target wiring is longer than the first hold violation setting time, and equal to or shorter than the second hold violation setting time as the timing violation.

16. The program product according to claim 15 , wherein the program makes the computer further execute:

placing a hold buffer cell for making the delay time longer than the delay time of the dummy wiring on the target wiring, to generate a wiring connected to a hold buffer cell, when the delay time of the target wiring exceeds the second hold violation setting time;

again executing the timing search with the wiring connected to a hold buffer cell as the target wiring when the wiring connected to a hold buffer cell is generated; and

executing the dummy wiring connection when the delay time of the target wiring is longer than the first hold violation setting time, and equal to or shorter than the second hold violation setting time as the timing violation, when the timing search is again executed.

17. The program product according to claim 12 , wherein the program makes a computer execute outputting the layout data to an output device, when the dummy wiring connection is executed.

18. The program product according to claim 15 , wherein the program makes the computer execute:

again executing the timing search with the modified wiring as the target wiring when the dummy wiring connection is executed; and

again executing the dummy wiring connection when the delay time of the target wiring is longer than the first hold violation setting time, and equal to or shorter than the second hold violation setting time as the timing violation, when the timing search is again executed.

19. The program product according to claim 12 , wherein the program makes the computer execute:

again executing the timing search with the modified wiring as the target wiring, when the dummy wiring connection is executed; and

outputting the layout data to an output device when the timing violation does not occurs for the target wiring, when the timing search is again executed.

20. A computer in which the computer program product according to claim 12 is installed, said computer comprising:

a processor for executing the program to adjust the timing of the semiconductor integrated circuit.