Methods for determining resistance of phase change memory elements
View Patent ↗Methods for measuring the resistance of multiple memory elements are disclosed. The memory elements may be multi-bit memory and through precise measurement of resistance of the multi-bit memory elements, determination of how many and which memory elements fall into specific memory ranges can be accomplished. Furthermore, storage and/or display of this information may allow for the creation of resistance distribution histograms for modeling of one or more memory arrays.
1. A method for testing a memory device comprising:
selecting a memory element coupleable to a quantizing circuit;
initializing the quantizing circuit;
activating the quantizing circuit, wherein activating the quantizing circuit activates a pull up device to allow voltage to charge a capacitance coupled to the memory element and to an op amp, wherein an output of the op amp switches to active high when a voltage across the capacitance exceeds a HIGH voltage supplied to the op amp; and
monitoring an output of the quantizing circuit.
2. A method for testing a memory device comprising:
selecting a memory element coupleable to a quantizing circuit;
initializing the quantizing circuit, wherein initializing the quantizing circuit comprises:
pre-charging a capacitance coupled between the memory element and an op amp; and
setting a multiplexer coupled to the op amp to active high;
activating the quantizing circuit; and
monitoring an output of the quantizing circuit.
3. The method of claim 2 , wherein initializing the quantizing circuit drives an output of the op amp to active low and activates a pull up device coupled to the op-amp.
4. A method for testing a memory device comprising:
selecting a memory element coupleable to a quantizing circuit;
initializing the quantizing circuit;
activating the quantizing circuit;
monitoring an output of the quantizing circuit; and
activating a pull down device, wherein activating the pull down device provides a path for a capacitance coupled to a memory element and an op amp to discharge a stored voltage, and wherein discharge of the stored voltage causes an output of the op amp to be active low when the stored voltage across the capacitance falls below a LOW voltage supplied to the op amp.
5. The method of claim 4 , comprising activating a pull up device and deactivating the pull down device, wherein activating the pull up device provides a path for charging the capacitance coupled to a memory element and an op amp, and wherein charging the capacitance causes the output of the op amp to be active high when the stored voltage across the capacitance exceeds a HIGH voltage supplied to the op amp.
6. The method of claim 1 , wherein monitoring the output of the quantizing circuit includes monitoring switches of an op amp output in the quantizing circuit from active low to active high.
7. The method of claim 6 , further comprising determining a number of switches of the op amp output in the quantizing circuit from active low to active high.
8. The method of claim 7 , comprising storing the monitored output of the quantizing circuit by transferring the determined number of switches of the op amp output in the quantizing circuit from active low to active high from the pulse counter to a storage device.
9. The method of claim 8 , comprising determining a resistance of the memory element based on the determined number of switches of the op amp output in the quantizing circuit from active low to active high.
10. A method for testing a memory device comprising:
selecting a memory element coupleable to a quantizing circuit;
initializing the quantizing circuit, wherein initializing the quantizing circuit comprises pre-charging a capacitance coupled to the memory element and to a clocked comparator to a reference voltage;
activating the quantizing circuit; and
monitoring an output of the quantizing circuit.
11. The method of claim 10 , wherein initializing the quantizing circuit drives an output of the clocked comparator to active high to disable a pull up device coupled to the clocked comparator.
12. The method of claim 10 , wherein activating the quantizing circuit activates a pull down device to provide a path for the capacitance to discharge through the memory element.
13. The method of claim 12 , wherein the discharge through the memory circuit occurs for at least one clock cycle of the clocked comparator.
14. The method of claim 13 , wherein an output of the clocked comparator switches to active low after at least one clock cycle to enable a pull up device coupled to the clocked comparator.
15. The method of claim 1 , wherein monitoring the output of the quantizing circuit includes determining a number of switches of an output of a clocked comparator in the quantizing circuit from active low to active high.
16. The method of claim 15 , comprising storing the determined number of switches of the output of the clocked comparator in the quantizing circuit from active low to active high from in a storage device.
17. The method of claim 16 , comprising determining a resistance of the memory element based on the stored number of switches of the output of the clocked comparator.