IP Library Granted Patent US 8,378,504
Granted Patent B2
US 8,378,504 · App. 12/165,465 · Granted Feb 19, 2013

Microelectronic package with self-heating interconnect

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,378,504
App. No.
12/165,465
Granted
Feb 19, 2013
Kind
B2
Abstract

A microelectronic package is provided. The microelectronic package includes a substrate having a plurality of solder bumps disposed on a top side of the substrate and a die disposed adjacent to the top side of the substrate. The die includes a plurality of glassy metal bumps disposed on a bottom side of the die wherein the plurality of glassy metal bumps are to melt the plurality of solder bumps to form a liquid solder layer. The liquid solder layer is to attach the die with the substrate.

Claims (37)

1. A method of forming a microelectronic package, comprising:

providing a substrate having a plurality of solder bumps on a top side of the substrate;

disposing a die adjacent to the top side of the substrate;

forming a plurality of glassy metal bumps on a bottom side of the die, wherein each of the plurality of glassy metal bumps is to contact with a corresponding solder bump on the substrate;

crystallizing the plurality of glassy metal bumps to melt the plurality of solder bumps and form a liquid solder layer, wherein the liquid solder layer attaches the die with the substrate.

2. The method of claim 1 , further comprising attaching the die to the substrate at a pre-determined temperature to crystallize the plurality of glassy metal bumps.

3. The method of claim 2 , wherein the pre-determined temperature is greater than a glass transition temperature of the plurality of glassy metal bumps.

4. The method of claim 1 , further comprising disposing an insulating layer between adjacent glassy metal bumps.

5. The method of claim 4 , further comprising disposing a wettable metal on each of the plurality of glassy metal bumps.

6. The method of claim 5 , further comprising disposing a noble metal on the wettable metal.

7. A method of forming a microelectronic package, comprising:

forming a plurality of glassy metal bumps on a bottom side of a die;

disposing the die adjacent to the top side of a substrate, wherein the a substrate includes a plurality of solder bumps on a top side thereof;

contacting the plurality of glassy metal bumps to the plurality of solder bumps; and

crystallizing the plurality of glassy metal bumps to melt the plurality of solder bumps and form a liquid solder layer, wherein the liquid solder layer attaches the die with the substrate.

8. The method of claim 7 , wherein forming the plurality of glassy metal bumps includes chemical-mechanical polishing of a glassy metal layer that is imprinted over a patterned insulation layer.

9. The method of claim 7 , further including:

photoresist patterning and etching an insulation layer to form a patterned insulation layer;

chemical-mechanical polishing of a glassy metal layer that is imprinted over the patterned insulation layer to form the plurality of glassy metal bumps.

10. The method of claim 7 , further comprising attaching the die to the substrate at a pre-determined temperature to crystallize the plurality of glassy metal bumps.

11. The method of claim 10 , wherein the pre-determined temperature is greater than a glass transition temperature of the plurality of glassy metal bumps.

12. The method of claim 7 , further comprising disposing an insulating layer between adjacent glassy metal bumps.

13. The method of claim 12 , further comprising disposing a wettable metal on each of the plurality of glassy metal bumps.

14. The method of claim 13 , further comprising disposing a noble metal on the wettable metal.

15. The method of claim 7 , wherein forming the plurality of glassy metal bumps includes forming a layer of Au 49.2 Cu 27 Ag 5.5 Pd 2.35 Si 16 .

16. The method of claim 7 , wherein forming the plurality of glassy metal bumps includes forming a layer of Au 49.2 Cu 27 Ag 5.5 Pd 2.35 Si 16 , the method further including disposing a copper wettable metal on each of the plurality of glassy metal bumps.

17. A method of forming a microelectronic package, comprising:

imprinting a glassy metal layer upon a die under pressure to cause superplastic deformation and to fill a pattern that results in a plurality of glassy metal bumps on a bottom side of the die;

disposing the die adjacent to the top side of a substrate, wherein the substrate includes a plurality of solder bumps on a top side thereof;

contacting the plurality of glassy metal bumps to the plurality of solder bumps; and

crystallizing the plurality of glassy metal bumps to melt the plurality of solder bumps and form a liquid solder layer, wherein the liquid solder layer attaches the die with the substrate.

18. The method of claim 17 , further comprising disposing a wettable metal on each of the plurality of glassy metal bumps.

19. The method of claim 18 , further comprising disposing a noble metal on the wettable metal.

20. The method of claim 17 , wherein the plurality of glassy metal bumps includes Au 49.2 Cu 27 Ag 5.5 Pd 2.35 Si 16 .

21. The method of claim 17 , wherein the plurality of glassy metal bumps includes Mg 54 Cu 28 Ag 7 Y 11 .

22. The method of claim 17 , wherein the plurality of glassy metal bumps includes La 57.6 Al 17.5 Cu 12.45 Ni 12.45 .

23. The method of claim 17 , wherein the plurality of glassy metal bumps includes Au 49.2 Cu 27 Ag 5.5 Pd 2.35 Si 16 , the method further including disposing a copper wettable metal on each of the plurality of glassy metal bumps.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2022
From: INTEL CORPORATION
To: TAHOE RESEARCH, LTD.
Reel/Frame 061175/0176 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 18, 2009
From: SUH, DAEWOONG
To: INTEL CORPORATION
Reel/Frame 022415/0507 →