Phase-change memory element
A phase-change memory cell is proposed. The phase-change memory includes a bottom electrode; a phase-change spacer formed to contact the bottom electrode; an electrical conductive layer having a vertical portion and a horizontal portion, wherein the electrical conductive layer electrically connects to the phase-change spacer via the horizontal portion; and a top electrode electrically connected to the electrical conductive layer via the vertical portion of the electrically conductive layer.
1. A phase-change memory element, comprising:
a bottom electrode;
a phase-change spacer formed to contact the bottom electrode;
an electrically conductive layer having a vertical portion and a horizontal portion, wherein the electrically conductive layer electrically connects to the phase-change spacer via the horizontal portion; and
a top electrode electrically connected to the electrical conductive layer via the vertical portion of the electrically conductive layer.
2. The phase-change memory element as claimed in claim 1 , wherein the bottom electrode is separated from the electrical conductive layer by a dielectric layer.
3. The phase-change memory element as claimed in claim 1 , wherein the thickness of the horizontal portion of the electrically conductive layer is 10˜100 nm.
4. The phase-change memory element as claimed in claim 1 , wherein the top electrode does not contact with the phase-change spacer.
5. The phase-change memory element as claimed in claim 1 , wherein the phase-change spacer comprises In, Ge, Sb, Te, Ga, Sn or combinations thereof.
6. The phase-change memory element as claimed in claim 1 , wherein the electrically conductive layer comprises a transition metal, aluminum, silicon, aluminum nitride, a transition metal nitride, or combinations thereof.
7. The phase-change memory element as claimed in claim 1 , wherein the top and bottom electrodes respectively comprise a transition metal, aluminum, silicon, aluminum nitride, a transition metal nitride, or combinations thereof.
8. The phase-change memory element as claimed in claim 1 , wherein the phase-change spacer directly contacts with at least one of the top surface and the side-wall of the horizontal portion of the electrically conductive layer.
9. The phase-change memory element as claimed in claim 1 , wherein the phase-change spacer is L-shaped, I-shaped, or ladder-shaped.
10. The phase-change memory element as claimed in claim 1 , wherein the electrical conductive layer is L-shaped, I-shaped, or ladder-shaped.