IP Library Granted Patent US 7,947,991
Granted Patent B2
US 7,947,991 · App. 12/181,916 · Granted May 24, 2011

High efficiency lighting device

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Quick Facts
Patent No.
US 7,947,991
App. No.
12/181,916
Granted
May 24, 2011
Kind
B2
Abstract

A high efficiency lighting device comprising a light emitting diode structure, an eutectic layer and a distributed-Bragg reflecting layer (DBR) therebetween is disclosed. The distributed-Bragg reflecting layer is attached to said light emitting diode structure by vapor deposition and comprises a plurality of high refraction layers, a plurality of low refraction layers and a micro-contact layer array. The high refraction layers and said low refraction layers are arranged in an alternating manner, so as to form a stacked thin film having an alternate high/low refraction pattern. The micro-contact layers are in said stacked thin film and extend vertically through the stacked thin film, therefore connecting said light emitting diode structure and said eutectic layer.

Claims (11)

1. A high efficiency lighting device, comprising:

a light emitting diode structure;

an eutectic layer; and

a distributed-Bragg reflecting layer (DBR) between said light emitting diode structure and said eutectic layer, said distributed-Bragg reflecting layer being attached to said light emitting diode structure by vapor deposition, wherein said distributed-Bragg reflecting layer comprises:

a plurality of high refraction layers;

a plurality of low refraction layers, wherein said high refraction layers and said low refraction layers are arranged in an alternating manner, so as to form a stacked thin film having an alternate high/low refraction pattern; and

a micro-contact layer array in said stacked thin film and including at least one micro-contact layer, wherein said eutectic layer is made of heat dissipation materials and in direct contact with said distributed-Bragg reflecting layer, and wherein said micro-contact layer array extends vertically through the stacked thin film and connects said light emitting diode structure and said eutectic layer.

2. The device of claim 1 , wherein said high refraction layers are titanium dioxide layers, and said low refraction layers are silicon dioxide layers.

3. The device of claim 1 , wherein said micro-contact layers are formed by using metal materials.

4. The device of claim 1 , wherein said eutectic layer is made from gold/tin alloy.

5. The device of claim 1 , wherein the thickness of said eutectic layer is around 1.5 micrometers.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 13, 2016
From: HUGA OPTOTECH INC.
To: EPISTAR CORPORATION
Reel/Frame 040350/0699 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 29, 2008
From: WANG, WEI-KAI; LIN, SU-HUI; SHIH, WEN-CHUNG
To: HUGA OPTOTECH INC.
Reel/Frame 021309/0237 →