IP Library Granted Patent US 7,727,795
Granted Patent B2
US 7,727,795 · App. 12/187,454 · Granted Jun 1, 2010

Exponentially doped layers in inverted metamorphic multijunction solar cells

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,727,795
App. No.
12/187,454
Granted
Jun 1, 2010
Kind
B2
Abstract

A method of forming a multijunction solar cell including an upper subcell, a middle subcell, and a lower subcell, including providing first substrate for the epitaxial growth of semiconductor material; forming a first solar subcell on the substrate having a first band gap; forming a second solar subcell over the first solar subcell having a second band gap smaller than the first band gap; forming a grading interlayer over the second subcell, the grading interlayer having a third band gap greater than the second band gap; and forming a third solar subcell over the grading interlayer having a fourth band gap smaller than the second band gap such that the third subcell is lattice mis-matched with respect to the second subcell, wherein at least one of the bases of a solar subcell has an exponentially doped profile.

Claims (26)

1. A method of forming a multijunction solar cell comprising an upper subcell, a middle subcell, and a lower or bottom subcell, the method comprising:

providing a first substrate for an epitaxial growth of a semiconductor material;

forming a first solar subcell having a first base and a first emitter on said substrate, wherein said first solar subcell has a first band gap;

forming a second solar subcell having a second base and a second emitter over said first solar subcell, wherein said second solar subcell has a second band gap smaller than said first band gap;

forming a grading interlayer over said second solar subcell, said grading interlayer having a third band gap greater than said second band gap; and

forming a third solar subcell having a third base and a third emitter over said grading interlayer, said third solar subcell having a fourth band gap smaller than said second band gap such that said third solar subcell is lattice mis-matched with respect to said second solar subcell,

wherein at least one of the bases has an exponentially doped profile.

2. A method as defined in claim 1 , wherein the first base in said first solar subcell has an exponential gradation in doping from 1×10 16 per cubic centimeter adjacent the first-base-first-emitter junction to 1×10 18 per cubic centimeter adjacent the adjoining layer.

3. A method as defined in claim 1 , wherein the second base in said second solar subcell has an exponential gradation in doping from 1×10 16 per cubic centimeter adjacent the second-base-second-emitter junction to 1×10 18 per cubic centimeter adjacent the adjoining layer.

4. A method as defined in claim 1 , wherein the third base in said third solar subcell has an exponential gradation in doping from 1×10 16 per cubic centimeter adjacent the third-base-third-emitter junction to 1×10 18 per cubic centimeter adjacent the adjoining layer.

5. A method as defined in claim 4 , wherein said third solar subcell is the bottom subcell and the exponential gradation in doping results in radiation hardness at end-of-life of the solar cell.

6. A method as defined in claim 1 , wherein one of first, second and third emitters has an increasing gradation in doping from 5×10 17 per cubic centimeter adjacent the base-emitter junction to 5×10 18 per cubic centimeter adjacent the adjoining layer.

7. A method as defined in claim 1 , wherein said first substrate is composed of GaAs.

8. A method as defined in claim 1 , wherein said first solar subcell is composed of an InGa(Al)P emitter region and an InGa(Al)P base region.

9. A method as defined in claim 1 , wherein said second solar subcell is composed of an InGaP emitter region and an GaAs base region.

10. A method as defined in claim 1 , wherein said grading interlayer is composed of InGaAlAs.

11. A method as defined in claim 10 , wherein said grading interlayer is composed of nine steps of layers with monotonically changing lattice constant.

12. A method as defined in claim 1 , wherein said third solar subcell is composed of InGaAs.

13. A method as defined in claim 1 , further comprising depositing a barrier layer about one micron in thickness adjacent said grading interlayer for preventing threading dislocations from propagating.

14. A method of forming a multijunction solar cell comprising an upper subcell, a middle subcell, and a lower or bottom subcell, the method comprising:

providing a first substrate for an epitaxial growth of a semiconductor material;

forming a first solar subcell having a first base and a first emitter on said substrate, wherein said first solar subcell has a first band gap with the first base in said first solar subcell having an exponential gradation in doping from 1×10 16 per cubic centimeter in a region adjacent to the first-base-first-emitter junction to 1×10 18 per cubic centimeter in a region adjacent to an adjoining layer formed adjacent the first base;

forming a second solar subcell having a second base and a second emitter over said first solar subcell, wherein said second solar subcell has a second band gap smaller than said first band gap; and

forming a third solar subcell having a third base and a third emitter over said second solar subcell, wherein said third solar subcell has a third band gap smaller than said second band gap.

15. A method as defined in claim 14 , wherein one of the first, second and third emitters has an increasing gradation in doping from 5×10 17 per cubic centimeter adjacent the base-emitter junction to 5×10 18 per cubic centimeter adjacent the adjoining layer.

16. A method as defined in claim 14 , wherein said second solar subcell is composed of an InGaP emitter region and a GaAs base region.

Assignments (11)
SECURITY INTEREST Recorded Apr 17, 2019
From: SOLAERO TECHNOLOGIES CORP.
To: CITIZENS BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 048930/0952 →
NOTICE OF RELEASE OF SECURITY INTEREST IN PATENTS Recorded Apr 12, 2019
From: CITIZENS BANK, N.A. (SUCCESSOR BY MERGER TO CITIZENS BANK OF PENNSYLVANIA), AS ADMINISTRATIVE AGENT
To: SOLAERO SOLAR POWER INC. (F/K/A EMCORE SOLAR POWER, INC)
Reel/Frame 049455/0179 →
NOTICE OF RELEASE OF SECURITY INTEREST IN PATENTS Recorded Apr 12, 2019
From: CITIZENS BANK, N.A. (SUCCESSOR BY MERGER TO CITIZENS BANK OF PENNSYLVANIA), AS ADMINISTRATIVE AGENT
To: SOLAERO TECHNOLOGIES CORP.
Reel/Frame 048877/0802 →
SECURITY INTEREST Recorded Oct 17, 2018
From: SOLAERO TECHNOLOGIES CORP.
To: CITIZENS BANK OF PENNSYLVANIA, AS ADMINISTRATIVE AGENT FOR THE SECURED PARTIES
Reel/Frame 047246/0418 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 12, 2015
From: EMCORE SOLAR POWER, INC.
To: SOLAERO TECHNOLOGIES CORP.
Reel/Frame 034750/0211 →
SECURITY INTEREST Recorded Dec 12, 2014
From: EMCORE SOLAR POWER, INC.
To: CITIZENS BANK OF PENNSYLVANIA, AS ADMINISTRATIVE AGENT
Reel/Frame 034612/0961 →
RELEASE OF SECURITY INTEREST Recorded Dec 10, 2014
From: WELLS FARGO BANK, N.A.
To: EMCORE SOLAR POWER, INC.
Reel/Frame 034590/0761 →
RELEASE OF SECURITY INTEREST Recorded Oct 12, 2011
From: BANK OF AMERICA, N.A.
To: EMCORE CORPORATION; EMCORE SOLAR POWER, INC.
Reel/Frame 027050/0880 →
SECURITY AGREEMENT Recorded May 18, 2011
From: EMCORE CORPORATION; EMCORE SOLAR POWER, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 026304/0142 →
SECURITY AGREEMENT Recorded Nov 12, 2008
From: EMCORE CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 021824/0019 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 12, 2008
From: EMCORE CORPORATION
To: EMCORE SOLAR POWER, INC.
Reel/Frame 021817/0929 →