Apparatus for testing integrated circuitry

1. A testing apparatus for testing integrated circuits mounted in a carrier, the testing apparatus comprising:

a support assembly;

a controller mounted in the support assembly, the controller programmed to process test signals from the integrated circuits;

a retaining assembly arranged on the support assembly and configured to receive and retain the carrier during testing;

a diagnostic probe assembly including a support plate from which support brackets extend, a controller board received in the support brackets, and a probe interface affixed to the support plate; and

a displacement mechanism arranged on the support assembly for displacing the retaining assembly towards the probe interface of the diagnostic probe assembly to bring the integrated circuits into contact with the probe interface, wherein

the probe interface includes holes for receiving temporary dowels inserted into the retaining assembly.

2. The testing apparatus of claim 1 , wherein the integrated circuits are inkjet printheads.

3. The testing apparatus of claim 1 , wherein the support assembly includes a housing assembly, the controller being in the form of a touch-panel PC mounted in the housing to be accessible by an operator, the housing assembly including a table assembly and the retaining assembly including a test stage displaceable into and out of said operative condition.

4. The testing apparatus of claim 3 , wherein the retaining assembly includes a clamp assembly arranged on the test stage to clamp the carrier in position prior to displacement of the test stage into the operative condition.

5. The testing apparatus of claim 4 , wherein the clamp assembly is pneumatically driven.

6. The testing apparatus of claim 1 , wherein the retaining assembly includes locating formations that are configured to co-operate with locating formations on the carrier to ensure that the carrier is correctly positioned prior to testing.

7. The testing apparatus of claim 1 , wherein the diagnostic probe assembly further includes an adaptor circuitry, the adaptor circuitry including an adaptor board configured to engage the integrated circuits and to provide the electrical and physical interface with the integrated circuits.

8. The testing apparatus of claim 7 , wherein the diagnostic probe assembly further includes a multiplexer board interposed between the controller board and the adaptor board, the multiplexer board for routing test and control signals between the controller board and the integrated circuits.

9. The testing apparatus of claim 8 , wherein the diagnostic probe assembly further includes a reset board for generating reset signals required for multiplexed integrated circuits.

10. The testing apparatus of claim 1 , further comprising a scanner for scanning a code printed on the carrier.

11. The testing apparatus of claim 10 , further comprising a network interface for facilitating data communication with an external remote monitoring system.

12. The testing apparatus of claim 11 , wherein the network interface communicates a code scanned by the scanner, and a corresponding test result provided by the diagnostic probe assembly to the external remote monitoring system.

13. The testing apparatus of claim 1 , wherein the displacement mechanism is pneumatically driven.

14. The testing apparatus of claim 1 , wherein the controller board generates test signals for testing the integrated circuits.