IP Library Granted Patent US 7,727,778
Granted Patent B2
US 7,727,778 · App. 12/200,181 · Granted Jun 1, 2010

Magnetoresistive element and method of manufacturing the same

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Quick Facts
Patent No.
US 7,727,778
App. No.
12/200,181
Granted
Jun 1, 2010
Kind
B2
Abstract

A magnetoresistive element includes a stack formed by sequentially stacking a first fixed layer in which a magnetization direction is fixed, a first nonmagnetic layer, a free layer in which a magnetization direction is changeable, a second nonmagnetic layer, and a second fixed layer in which a magnetization direction is fixed, a first circumferential wall provided on the second nonmagnetic layer in contact with a circumferential surface of the second fixed layer to surround the second fixed layer, and made of an insulator, and a second circumferential wall provided on the first nonmagnetic layer in contact with a circumferential surface of the free layer to surround the free layer, and made of an insulator.

Claims (15)

1. A magnetoresistive element comprising:

a stack formed by sequentially stacking a first fixed layer in which a magnetization direction is fixed, a first nonmagnetic layer, a free layer in which a magnetization direction is changeable, a second nonmagnetic layer, and a second fixed layer in which a magnetization direction is fixed;

a first circumferential wall provided on the second nonmagnetic layer in contact with a circumferential surface of the second fixed layer to surround the second fixed layer, and made of an insulator; and

a second circumferential wall provided on the first nonmagnetic layer in contact with a circumferential surface of the free layer to surround the free layer, and made of an insulator.

2. The element according to claim 1 , wherein the second circumferential wall is further provided on a circumferential surface of the second nonmagnetic layer.

3. The element according to claim 2 , wherein the second circumferential wall is further provided on a circumferential surface of the first circumferential wall.

4. The element according to claim 1 , wherein an area of the free layer is smaller than that of the first fixed layer.

5. The element according to claim 1 , wherein an area of the second fixed layer is smaller than that of the free layer.

6. The element according to claim 1 , wherein an outer circumferential surface of the first circumferential wall is the same as that of the free layer.

7. The element according to claim 1 , wherein an outer circumferential surface of the second circumferential wall is the same as that of the first fixed layer.

8. The element according to claim 1 , wherein the circumferential surfaces of the first fixed layer, the free layer, and the second fixed layer are substantially perpendicular to film surfaces.

9. The element according to claim 1 , further comprising an upper electrode provided on the second fixed layer, and having the same planar shape as that of the second fixed layer.

10. The element according to claim 1 , further comprising a lower electrode provided below the first fixed layer, and having the same planar shape as that of the first fixed layer.

11. The element according to claim 1 , wherein the first nonmagnetic layer and the second nonmagnetic layer are made of one of a metal oxide and a paramagnetic metal.

12. The element according to claim 1 , wherein a planar shape of each of the first fixed layer, the second fixed layer, and the free layer is one of a circle and an ellipse.

Assignments (4)
DE-MERGER Recorded Dec 12, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051260/0291 →
MERGER Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION; K.K PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051262/0776 →
CHANGE OF NAME AND ADDRESS Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 051262/0881 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 12, 2008
From: IWAYAMA, MASAYOSHI; HOSOTANI, KEIJI; KAJIYAMA, TAKESHI; ASAO, YOSHIAKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 021822/0272 →