IP Library Granted Patent US 7,928,453
Granted Patent B2
US 7,928,453 · App. 12/212,176 · Granted Apr 19, 2011

Semiconductor light emitting device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,928,453
App. No.
12/212,176
Granted
Apr 19, 2011
Kind
B2
Abstract

An end face emission type semiconductor light emitting device which include: a substrate; a first conductive type clad layer stacked on the substrate; an active region layer including an active layer stacked on the first conductive type clad layer; a second conductive type clad layer stacked on the active region layer such that a thickness of a portion thereof at least over an emission region of the active region layer in an emission end face adjacent area is thinner than a thickness of the other portion; and a second conductive type regrowth layer stacked on the second conductive type clad layer, which has a higher refractive index than the second conductive type clad layer.

Claims (24)

1. An end face emission type semiconductor light emitting device, comprising:

a substrate;

a first conductive type clad layer stacked on the substrate;

an active region layer including an active layer stacked on the first conductive type clad layer;

a second conductive type clad layer stacked on the active region layer such that a thickness of a portion thereof at least over an emission region of the active region layer in an emission end face adjacent area is thinner than a thickness of the other portion; and

a second conductive type regrowth layer stacked on the second conductive type clad layer, the regrowth layer having a higher refractive index than the second conductive type clad layer.

2. An end face emission type semiconductor light emitting device, comprising:

a substrate;

a first conductive type clad layer stacked on the substrate;

an active region layer including an active layer stacked on the first conductive type clad layer;

a second conductive type clad layer stacked on the active region layer other than on a portion at least over an emission region thereof in an emission end face adjacent area; and

a second conductive type regrowth layer stacked on the second conductive type clad layer and on the portion of the active region layer where the second conductive type clad layer is not stacked, the regrowth layer having a higher refractive index than the second conductive type clad layer.

3. The semiconductor light emitting device according to claim 1 , wherein:

the substrate is formed of GaAs;

the first conductive type clad layer is formed of (Al x1 Ga 1−x1 ) z1 In 1−z1 P (0≦x1≦0.7) or Al x2 Ga 1−x2 As;

the active region layer includes, in the order from the side of the first conductive type clad layer, a non-doped or first conductive type In x3 Ga 1−x3 As 1−y3 P y3 light guide layer (0≦x3≦0.3), an In x4 Ga 1−x4 As 1−y4 P y4 active layer (0≦x4≦0.4, 0≦y4≦0.1), and a non-doped or second conductive type In x5 Ga 1−x5 As 1−y5 P y5 light guide layer (0≦x5≦0.3);

the second conductive type clad layer is formed of (Al x1 Ga 1−x1 ) z2 In 1−z2 P (0≦x1≦0.7) or Al x6 Ga 1−x6 As; and

the second conductive type regrowth layer is formed of Al x7 Ga 1−x7 As with an element ratio selected to have a higher refractive index than that of the second conductive type clad layer.

4. The semiconductor light emitting device according to claim 2 , wherein:

the substrate is formed of GaAs;

the first conductive type clad layer is formed of (Al x1 Ga 1−x1 ) z1 In 1−z1 P (0≦x1≦0.7) or Al x2 Ga 1−x2 As;

the active region layer includes, in the order from the side of the first conductive type clad layer, a non-doped or first conductive type In x3 Ga 1−x3 As 1−y3 P y3 light guide layer (0≦x3≦0.3), an In x4 Ga 1−x4 As 1−y4 P y4 active layer (0≦x4≦0.4, 0≦y4≦0.1), and a non-doped or second conductive type In x5 Ga 1−x5 As 1−y5 P y5 light guide layer (0≦x5≦0.3);

the second conductive type clad layer is formed of (Al x1 Ga 1−x1 ) z2 In 1−z2 P (0≦x1≦0.7) or Al x6 Ga 1−x6 As; and

the second conductive type regrowth layer is formed of Al x7 Ga 1−x7 As with an element ratio selected to have a higher refractive index than that of the second conductive type clad layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 24, 2012
From: FUJIFILM CORPORATION
To: NICHIA CORPORATION
Reel/Frame 028094/0493 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2008
From: OHGOH, TSUYOSHI
To: FUJIFILM CORPORATION
Reel/Frame 021543/0968 →