Method and apparatus for measuring medium layers and interfaces between them using a multi-sensor probe
View Patent ↗For measuring the filling level of a measuring medium, including detecting multiple medium layers and interfaces between them, a multi-sensor probe can be dipped into the measuring medium and longitudinally segmented into a plurality of segments, each segment comprising a sensor for measuring a predetermined physical parameter of the surrounding medium. To provide an accurate, reliable and robust measurement of multiple medium layers a measurement model is defined for modeling signals of the sensors as a function of positions of a number of interfaces between the medium layers and the physical parameters of the medium layers. Prior distributions of the number of the interfaces, the positions of the interfaces and the physical parameters of the medium layers are defined. Based on the measurement model and the prior distributions a joint posterior distribution of the number of the interfaces and the positions of the interfaces is determined. The joint posterior distribution of the number of the interfaces and the positions of the interfaces is evaluated based on Markov Chain Monte Carlo methods.
1. A method for measuring different medium layers of a measuring medium using a multi-sensor probe to be dipped into the measuring medium, comprising:
providing the probe which is longitudinally segmented into a plurality of segments, each segment comprising a sensor for measuring a predetermined physical parameter of the surrounding medium;
defining a measurement model, said model modeling signals of the sensors as a function of positions of a number of interfaces between the medium layers and the physical parameters of the medium layers;
defining prior distributions of the number of the interfaces, the positions of the interfaces and the physical parameters of the medium layers;
based on the measurement model and the prior distributions determining a joint posterior distribution of the number of the interfaces and the positions of the interfaces; and
evaluating a joint posterior distribution of the number of the interfaces and the positions of the interfaces based on Markov Chain Monte Carlo methods.
2. An apparatus for measuring different medium layers of a measuring medium, comprising:
a multi-sensor probe to be dipped into the measuring medium and longitudinally segmented into a plurality of segments, each segment comprising a sensor for measuring a predetermined physical parameter of the surrounding medium;
a measuring circuit for generating a plurality of measuring signals in dependence on the physical parameters measured by the individual sensors; and
a controller for determining the layers and the positions of the interfaces between them by evaluating the measuring signals, wherein the controller has:
a measurement model modeling signals of the sensors as a function of positions of a number of interfaces between the medium layers and the physical parameters of the medium layers,
prior distributions of the number of the interfaces, the positions of the interfaces and the physical parameters of the medium layers, wherein
the controller determines a joint posterior distribution of the number of the interfaces and the positions of the interfaces the based on the measurement model and the prior distributions, and evaluates the joint posterior distribution of the number of the interfaces and the positions of the interfaces based on Markov Chain Monte Carlo methods.
3. The apparatus of claim 2 , wherein the sensors comprises sensor electrodes to form electrical capacitors to a common ground electrode, and wherein the predetermined physical parameters are the dielectric constants of the medium layers.
4. The apparatus of claim 3 , wherein the sensor electrodes and the measuring circuit are adapted to successively and separately measure the dielectric constants between the sensor electrodes and the common ground electrode, and wherein the common ground electrode is formed by at least one of those of the sensor electrodes which, at the moment, are not used for the measurement.
5. The apparatus of claim 2 , wherein the sensor electrodes and the measuring circuit are adapted to successively and separately measure the dielectric constants between the sensor electrodes and the common ground electrode, and wherein the common ground electrode is formed by at least one of those of the sensor electrodes which, at the moment, are not used for the measurement.