IP Library Granted Patent US 7,719,462
Granted Patent B2
US 7,719,462 · App. 12/221,943 · Granted May 18, 2010

Time-of-flight radar calibration system

Assignee: Siemens Milltronics Process Instruments, Inc.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,719,462
App. No.
12/221,943
Granted
May 18, 2010
Kind
B2
Abstract

A time-of-flight calibration system for a radar-based measurement device is provided. The time-of-flight calibration system includes a target antenna and a waveguide, e.g. a coaxial cable. The waveguide is coupled at one end to the target antenna and terminated at its other end by a wave-reflecting impedance.

Claims (17)

1. A time-of-flight calibration system for calibrating a radar measurement device based on an echo signal response comprising:

a radar measurement device configured to transmit a radar signal towards a target system spaced apart from the radar measurement device, wherein the target system comprises:

a target antenna electromagnetically coupled to receive over-the-air the radar signal from the radar measurement device;

a waveguide connected at a first end to the target antenna; and

a wave-reflecting impedance connected at a second end of the waveguide, wherein the wave-reflecting impedance is arranged to reflect the radar signal received from the radar measurement device to form a reflected signal, wherein the target antenna transmits back to the radar measurement device the reflected signal formed by the wave-reflecting impedance, wherein a signal transmitted back to the radar measurement device by the target antenna contains the echo signal response from the target system, wherein a location of the wave-reflecting impedance corresponds to a target distance from the radar measurement device being calibrated based on the echo response from the target system.

2. The calibration system according to claim 1 , wherein a mismatch impedance is inserted in the waveguide at a position between the first and second ends.

3. The calibration system according to claim 2 , wherein a mismatch impedance is inserted in the waveguide at a position between the first and second ends.

4. The calibration system according to claim 3 , wherein the waveguide is wound or folded into a compact shape.

5. The calibration system according to claim 4 , wherein the waveguide comprises a coaxial cable.

6. The calibration system according to claim 2 , wherein the target antenna comprises a coupling member for directly coupling to a probe rod of a time domain reflectrometry device.

7. The calibration system according to claim 1 , wherein for short-range calibration, an impedance matching attenuator is inserted at the first end the waveguide.

8. The calibration system according to claim 7 , wherein the target antenna comprises a coupling member for directly coupling to a probe rod of a time domain reflectrometry device.

9. The calibration system according to claim 1 , wherein the waveguide is wound or folded into a compact shape.

10. The calibration system according to claim 9 , wherein the target antenna comprises a coupling member for directly coupling to a probe rod of a time domain reflectrometry device.

11. The calibration system according to claim 1 , wherein the waveguide comprises a coaxial cable.

12. The calibration system according to claim 1 , wherein the target antenna comprises a horn antenna, a rod antenna, a patch antenna or an array antenna.

13. The calibration system according to claim 1 , wherein the target antenna comprises a coupling member for directly coupling to a probe rod of a time domain reflectrometry device.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 19, 2012
From: SIEMENS CANADA LIMITED
To: SIEMENS AKTIENGESELLSCHAFT
Reel/Frame 027557/0304 →
CERTIFICATE AND ARTICLES OF AMALGAMATION Recorded Jan 13, 2012
From: SIEMENS MILLTRONICS PROCESS INSTRUMENTS, INC.
To: SIEMENS CANADA LIMITED
Reel/Frame 027531/0121 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2008
From: HARWOOD, SHAUN PHILIP; LYON, GEORGE QUINTON
To: SIEMENS MILLTRONICS PROCESS INSTRUMENTS, INC.
Reel/Frame 021934/0882 →
Priority Claims (1)
EP 07015781 · Aug 10, 2007 · regional
Continuity (1)
Related Publication 20090079618A1 · Mar 26, 2009