IP Library Granted Patent US 7,701,743
Granted Patent B2
US 7,701,743 · App. 12/222,329 · Granted Apr 20, 2010

Electronic circuit package

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Quick Facts
Patent No.
US 7,701,743
App. No.
12/222,329
Granted
Apr 20, 2010
Kind
B2
Abstract

An electronic apparatus which includes a wiring substrate which includes wiring conductors, and a plurality of semiconductor bare chips that are formed on the wiring substrate. The semiconductor bare chips include a processor for processing data and a circuit having a checking function for detecting faults of the processor.

Claims (16)

1. An electronic apparatus comprising:

a wiring substrate which includes wiring conductors;

a first semiconductor bare chip which has a processing circuit for processing data;

a second semiconductor bare chip which has a checking function for detecting faults of said processing circuit; and

a plurality of semiconductor bare chips, including said first and second semiconductor bare chips, that are formed on said wiring substrate.

2. An electronic apparatus according to claim 1 , wherein said semiconductor bare chips include a processor for processing data and a circuit having a checking function for detecting faults of the processor, and

wherein said processor and said circuit are each formed in a bare chip.

3. An electronic apparatus according to claim 1 , wherein said wiring substrate is a multilayer wiring substrate.

4. An electronic apparatus according to claim 3 , wherein said multilayer wiring substrate is a ceramic substrate.

5. An electronic apparatus according to claim 2 , wherein a semiconductor bare chip corresponding to said circuit are connected respectively with said wiring substrate by wire bonding.

6. An electronic apparatus according to claim 2 , wherein the checking function of said circuit is a watch dog timer for resetting said processor when faults of said processor are detected.

7. An electronic apparatus according to claim 1 , wherein at least one of said semiconductor bare chips is a memory for storing data.

8. An electronic apparatus according to claim 2 , wherein a checking function is also provided for detecting faults in said semiconductor chips.

9. An electronic apparatus according to claim 1 , wherein a semiconductor bare chip corresponding to each of said semiconductor chips is connected to data lines by wire bonding.

10. An electronic apparatus according to claim 1 , further comprising:

a plurality of data lines including first data lines provided exclusively on one side of said wiring substrate and second data lines provided exclusively on another side of said wiring substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2009
From: HITACHI, LTD.
To: RISING SILICON, INCORPORATED
Reel/Frame 023486/0530 →