IP Library Patent Application 12242622
Patent Application
App. No. 12/242,622

METHOD OF PACKAGING A SEMICONDUCTOR DIE

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Quick Facts
Patent No.
US None
App. No.
12/242,622
Abstract

A method of packaging a semiconductor die includes the steps of providing a flange ( 110 ), coupling one or more active die ( 341 ) to the flange with a lead-free die attach material ( 350 ), staking a leadframe ( 120 ) to the flange after coupling the one or more active die to the flange, electrically interconnecting the one or more active die and the leadframe with an interconnect structure ( 470 ), and applying a plastic material ( 130 ) over the flange, the one or more active die, the leadframe, and the interconnect structure.

Claims (70)

1 . A method of packaging a semiconductor die comprising the steps of:

providing a flange;

coupling one or more active die to the flange with a lead-free die attach material;

after coupling the one or more active die to the flange, staking a leadframe to the flange;

electrically interconnecting the one or more active die and the leadframe with an interconnect structure; and

applying a plastic material over the flange, the one or more active die, the leadframe, and the interconnect structure.

2 . The method of claim 1 wherein:

the step of coupling the leadframe to the flange and the step of electrically interconnecting the one or more active die and the leadframe occur simultaneously with each other.

3 . The method of claim 1 wherein:

the step of coupling the leadframe to the flange further comprises keeping the leadframe and the flange electrically isolated from each other.

4 . The method of claim 1 wherein:

the step of providing the flange further comprises providing multiple flanges coupled together in a leadframe-type structure; and

after applying the plastic material, further comprising:

singulating leads of the leadframe; and

singulating the flange.

5 . The method of claim 1 wherein:

the step of coupling the one or more active die to the flange further comprises providing the lead-free die attach material with a melting temperature greater than approximately 250 degrees Celsius.

6 . The method of claim 1 wherein:

the step of coupling the leadframe to the flange further comprises coupling the leadframe to the flange such that a bottom surface of the leadframe is not co-planar with a bottom surface of the flange and such that a top surface of the leadframe is not co-planar with a top surface of the flange.

7 . The method of claim 1 wherein:

the step of coupling one or more active die to the flange further comprises coupling two or more high power, active die to the flange.

8 . The method of claim 1 further comprising:

coupling one or more passive die to the flange with an other lead-free die attach material, wherein the other lead-free die attach material is different from the lead-free die attach material.

9 . The method of claim 1 wherein:

the step of electrically interconnecting the one or more active die and the leadframe further comprises electrically interconnecting the one or more active die to the flange.

10 . A method of packaging a high power and high frequency semiconductor die comprising the steps of:

providing a heatsink;

providing at least two semiconductor die, wherein at least a first one of the at least two semiconductor die has at least one high power, active device and wherein at least a second one of the at least two semiconductor die has at least one passive device;

using a lead-free, gold silicon die attach to couple the at least two semiconductor die to the heatsink;

after the step of using a gold silicon die attach, mechanically staking a leadframe and the heatsink together;

using wire bonds to electrically interconnect the at least two semiconductor die to the leadframe;

overmolding a plastic material over the at least two semiconductor die, the gold silicon die attach, the wire bonds, and at least a portion of the leadframe; and

singulating leads of the leadframe.

11 . The method of claim 10 wherein:

the step of providing the heatsink further comprises providing the heatsink comprised of a first material and a second material;

the first material is more ductile and thermally conductive than the second material;

the second material is more rigid than the first material; and

the first material is closer to the at least two semiconductor die than the second material.

12 . The method of claim 11 wherein:

the step of mechanically staking further comprises mechanically staking the first and second materials of the heatsink together; and

after the step of mechanically staking, the leadframe and the heatsink are non-coplanar with each other.

13 . The method of claim 10 wherein:

the step of providing the heatsink further comprises providing the heatsink with at least one feature; and

the step of mechanically staking further comprises mechanically staking the leadframe to the at least one feature of the heatsink.

14 . The method of claim 13 wherein:

the at least one feature of the heatsink is a through-hole in the heatsink; and

the step of overmolding the plastic material further comprises using the through-hole in the heatsink as a mold lock for the plastic material.

15 . The method of claim 10 wherein:

the step of providing the at least two semiconductor die further comprises:

providing the at least the first one of the at least two semiconductor die without a passive device; and

providing the at least the second one of the at least two semiconductor die without an active device.

16 . The method of claim 15 wherein:

the step of providing the at least two semiconductor die further comprises providing an additional semiconductor die;

the additional semiconductor die has a first high power transistor and is devoid of a passive device; and

the at least one high power, active device of the first one of the at least two semiconductor die is a second high power transistor.

17 . The method of claim 10 wherein:

the step of providing the heatsink further comprises selectively plating the heatsink.

18 . The method of claim 10 wherein:

the step of using the lead-free, gold silicon die attach further comprises using a heated scrubbing process to attach the at least two semiconductor die to the heatsink.

19 . The method of claim 10 wherein:

the step of providing the heatsink further comprises providing a recess at a perimeter of a bottom surface of the heatsink;

the step of using the lead-free, gold silicon die attach further comprises coupling the at least two semiconductor die to a top surface of the heatsink;

the step of overmolding the plastic material further comprises overmolding the plastic material under the heatsink and in the recess of the bottom surface of the heatsink; and

further comprising bending the leads to form a surface mount package for the high power semiconductor die.

20 . A semiconductor component comprising:

a flange;

two or more active die coupled to the flange with a lead-free die attach material;

a leadframe and the flange staked together;

an interconnect structure electrically coupling together the two or more active die and the leadframe; and

a plastic packaging material over the flange, the two or more active die, the leadframe, and the interconnect structure.

Assignments (15)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0757 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Mar 15, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 024085/0001 →
SECURITY AGREEMENT Recorded Dec 9, 2008
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 021936/0772 →