IP Library Granted Patent US 8,327,709
Granted Patent B2
US 8,327,709 · App. 12/251,164 · Granted Dec 11, 2012

Method and apparatus for nondestructive evaluation and monitoring of materials and structures

Assignees: University of Pittsburgh; California Institute of Technology
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Quick Facts
Patent No.
US 8,327,709
App. No.
12/251,164
Granted
Dec 11, 2012
Kind
B2
Abstract

A method and apparatus for nondestructive evaluation (NDE) of structures and materials using a highly nonlinear medium for the generation and detection of one or multiple highly nonlinear pulses (or highly nonlinear waves) impinging on a material or structure. The apparatus includes pulse exciters that induce the propagation of highly nonlinear, weakly nonlinear or linear stress waves in the material, system, or structure to be inspected and/or detectors for the observation and the detection of the output waves from the material/structure being tested. The NDE method includes the use of the tunable highly nonlinear apparatus as impulse exciter alone, or in combination with an accelerometer or a nonlinear sensor to detect the outgoing pulse.

Claims (16)

1. A method for performing an inspection of an element or structure comprising:

generating an inspection pulse;

directing the inspection pulse into the element or structure to be inspected;

directing the inspection pulse after it has propagated through at least a portion of the element or structure to be inspected into a nonlinear receiver; and

detecting the inspection pulse after it has propagated through at least a portion of the nonlinear receiver,

wherein the nonlinear receiver comprises a chain of spherical particles, wherein each particle in the chain of spherical particles is in linear contact with adjacent particles in the chain.

2. The method according to claim 1 , wherein the particles in the chain of particles are linearly constrained and are compressed in the linear direction.

3. The method according to claim 1 , wherein detecting the inspection pulse comprises detecting the inspection pulse with at least one particle in the chain of particles comprising at least one of the following detection elements: a wave detection element; a pressure detection element; an acceleration detection element, or a displacement detection element.

4. The method according to claim 1 , wherein detecting the inspection pulse comprises directing the inspection pulse into an end of the chain of particles adjacent to the element or structure to be inspected and detecting the inspection pulse at an end of the chain of particles opposite to the end adjacent to the element or structure to be inspected.

5. A system for inspecting an element or structure comprising:

a pulse actuator, wherein the actuator is configurable to apply pulses to the element or structure to be inspected, and

a nonlinear receiver configurable to detect pulses from the actuator propagating through at least a portion of the element or structure to be inspected,

wherein the nonlinear receiver comprises a chain of spherical particles, wherein each particle in the chain of spherical particles is in linear contact with adjacent particles in the chain.

6. The system according to claim 5 , wherein the particles in the chain of are linearly constrained and are compressed in the linear direction.

7. The system according to claim 5 , wherein at least one particle in the chain of particles comprises at least one of the following detection elements: a wave detection element; a pressure detection element; an acceleration detection element, or a displacement detection element.

8. The system according to claim 5 , wherein the nonlinear receiver comprises at least one detection element disposed at an end of the chain of particles, wherein the detection element comprises at least one of the following detection elements: a wave detection element; a pressure detection element; an acceleration detection element, or a displacement detection element.

Assignments (3)
CONFIRMATORY LICENSE Recorded Dec 29, 2011
From: CALIFORNIA INSTITUTE OF TECHNOLOGY
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 027463/0976 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 24, 2008
From: DARAIO, CHIARA
To: CALIFORNIA INSTITUTE OF TECHNOLOGY
Reel/Frame 022029/0849 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 24, 2008
From: RIZZO, PIERVINCENZO
To: UNIVERSITY OF PITTSBURGH
Reel/Frame 022029/0907 →
Continuity (3)
Provisional Application 61063903 · Feb 7, 2008
Provisional Application 61124920 · Apr 21, 2008
Related Publication 20090204344A1 · Aug 13, 2009