Projection device for patterned illumination and microscopy
A projection and detector device that attaches externally to the photo-port of a widefield microscope. The device includes a light source interface for receiving of illumination from a light source, the illumination defining an illumination path. A pattern mask is located within the illumination path for projecting one or a plurality of objects, structures, or patterns onto a sample located at the object plane of the optical microscope. The pattern mask may be used with structured illumination microscopy (SIM) to project a moving striped optical grid pattern or Ronchi Ruling onto the sample at the object plane in either fluorescence or reflected brightfield imaging. A mechanical or digital diaphragm may also be used, for techniques such as Fluorescence Recovery After Photobleaching (FRAP), fluorescence photoactivation, and targeted illumination. A computer linked with a charged coupled device (CCD) camera may be used to capture images for storage and further post-processing.
1. A projection device for use with an optical microscope, the optical microscope having a lens configuration defining an object plane and projecting the object plane to a detector plane, the optical microscope including a photo-port for receiving of the detector plane, the projection device comprising:
a photo-port interface for attachment to the photo-port of the optical microscope and being optically coupled to the photo-port of the optical microscope;
a light source interface for receiving of illumination from a light source, the illumination defining an illumination path;
a beam splitter located within the illumination path for directing the illumination path through the photo-port interface onto the object plane of the optical microscope and for directing light from the detector plane to a detector interface; and
a pattern mask located within the illumination path for projecting one or a plurality of objects, structures, or patterns directly on a sample located at the object plane of the optical microscope.
2. The projection device of claim 1 , wherein the detector interface is for coupling to a detector.
3. The projection device of claim 2 , wherein the detector is a charged coupled device (CCD) camera.
4. The projection device of claim 1 , wherein the pattern mask is removably insertable into the projection device.
5. The projection device of claim 1 , wherein the pattern mask further comprises a moving grid for projection of a moving grid pattern onto the object plane.
6. The projection device of claim 5 , further comprising a controller for synchronizing operation of the moving grid with controlling of a detector coupled to the detector interface.
7. The projection device of claim 1 , wherein the pattern mask further comprises a digital diaphragm.
8. The projection device of claim 1 , wherein the pattern mask further comprises a DLP (Digital Light Processing).
9. The projection device of claim 1 , wherein the pattern mask further comprises a Ronchi Ruling.
10. The projection device of claim 1 for use in targeted illumination.
11. The projection device of claim 1 for use in FRAP (fluorescence recovery after photobleaching).
12. The projection device of claim 1 , wherein the projection device is removably attachable to the microscope at the photo-port interface.
13. The projection device of claim 1 , wherein the photo-port interface attaches externally to the photo-port of the optical microscope.
14. The projection device of claim 1 , wherein one or more wavelengths of light are selected by means of optical filters.
15. The projection device of claim 1 , wherein the light source includes one or more light emitting diodes or lasers for providing coherent light.
16. The projection device of claim 1 for use in deconvolution microscopy.
17. An optical microscopy system comprising:
an optical microscope having:
a lens configuration defining an object plane and projecting the object plane to a detector plane, and
a photo-port for receiving of the detector plane; and
a projection device having:
a photo-port interface for attachment to the photo-port of the optical microscope and being optically coupled to the photo-port of the optical microscope,
a light source interface for receiving of illumination from a light source, the illumination defining an illumination path,
a beam splitter located within the illumination path for directing the illumination path through the photo-port interface onto the object plane of the optical microscope and for directing light from the detector plane to a detector interface, and
a pattern mask located within the illumination path for projecting one or a plurality of objects, structures, or patterns directly on a sample located at the object plane of the optical microscope.
18. The optical microscopy system of claim 17 , wherein the pattern mask further comprises a moving grid for projection of a moving grid pattern onto the object plane.
19. The optical microscopy system of claim 17 , wherein the optical microscope further includes a second light source for projection onto the object plane.
20. The optical microscopy system of claim 19 , wherein the second light source provides fluorescence or brightfield illumination.
21. The optical microscopy system of claim 19 , wherein the second light source is used for FRAP, photoactivation, or targeted illumination.
22. A method for projection within an optical microscope, the optical microscope having a lens configuration defining an object plane and projecting the object plane to a detector plane, the optical microscope including a photo-port for receiving of the detector plane, the method comprising:
externally projecting an illumination path through the photo-port of the optical microscope and onto the object plane;
externally positioning a pattern mask within the illumination path; and
projecting from the pattern mask one or a plurality of objects, structures, or patterns directly on a sample located at the object plane of the optical microscope.
23. The method of claim 22 , further comprising:
positioning a detector interface for detecting from the detector plane; and
coupling the detector interface to a detector.