Method for generating, from a test cube set, a generator configured to generate a test pattern
Disclosed is a logic testing system that includes a decompressor and a tester in communication with the decompressor. The tester is configured to store a seed and locations of scan inputs and is further configured to transmit the seed and the locations of scan inputs to the decompressor. The decompressor is configured to generate a test pattern from the seed and the locations of scan inputs. The decompressor includes a first test pattern generator, a second test pattern generator, and a selector configured to select the test pattern generated by the first test pattern generator or the test pattern generated by the second test pattern generator using the locations of scan inputs.
1. A method for generating, from a test cube set, a generator configured to generate a test pattern for testing a circuit, the method comprising:
fault simulating said circuit with at least one test cube in said test cube set;
selecting a test cube that has the largest number of faults in a target fault list;
relaxing at least one bit in said selected test cube;
moving said selected test cube to a current test cube subset;
generating said generator from said current test cube subset;
generating a decompressed test pattern from said generator;
fault simulating said circuit with said decompressed test pattern; and
dropping at least one fault after said fault simulating with said decompressed test pattern.
2. The method of claim 1 further comprising relaxing additional bits in said selected test cube after dropping said at least one fault.
3. The method of claim 1 further comprising determining whether said test cube set is empty.
4. The method of claim 3 further comprising determining, after determining that said test cube set is not empty, whether there is at least one test cube in said test cube set that can be added into said current test cube subset without making a number of conflicting bits in said generator greater than a first predetermined number or a number of care bits in said generator greater than a second predetermined number.
5. The method of claim 4 further comprising selecting, after determining that there is at least one test cube that can be added, a test cube from said test cube set that causes a minimum number of new conflicting bits in said generator and that does not make said number of care bits in said generator greater than said second predetermined number.
6. The method of claim 5 further comprising adding said test cube into said subset of test cubes after relaxing over-specified bits in said selected test cube.
7. The method of claim 6 further comprising updating said generator after said adding step.
8. The method of claim 4 further comprising determining, after determining that there is not at least one test cube that can be added, whether there is at least one unmarked test cube in said test cube set that does not make the number of conflicting bits in said generator greater than a third predetermined number or the number of care bits in said generator greater than a fourth predetermined number when it is added into said current test cube subset.
9. The method of claim 8 further comprising selecting, after determining that there is at least one unmarked test cube in said test cube set, a test cube randomly from said test cube set and relaxing overspecified bits in said randomly selected test cube.
10. The method of claim 9 further comprising determining, after said selecting step, whether said relaxed test cube can be added to said current test cube subset without making the number of conflicting bits greater than said first predetermined number or the number of care bits in said generator greater than said second predetermined number.
11. The method of claim 10 further comprising adding, after determining that said relaxed test cube can be added, said relaxed test cube into said current test cube subset and updating said generator.