Patent Assignment
Reel/Frame 023957/0816
Assignment of Assignor's Interest
Recorded: 2010-02-19
Pages: 6
Assignor
NEC LABORATORIES AMERICA, INC.
Executed: 2010-02-16
Assignee
NEC CORPORATION
7-1 SHIBA 5-CHOME, MINATU-KU, TOKYO, 108-8001, JAPAN
Covered Properties
(26)
Method and System for Extending the Capabilities of Handheld Devices Using Local Resources
Apparatus for Public Access Mobility Lan and Method of Operation Thereof
Re-Configurable Embedded Core Test Protocol for System-on-Chips (Soc) and Circuit Boards
Estimating Facial Pose from a Sparse Representation
Dynamic Content-Aware Memory Compression and Encryption Architecture
Reduced-Complexity Multiple-Input Multiple-Output (Mimo) Channel Detection via Sequential Monte Carlo
Transform Coding System and Method
System and Method for Dynamically Changing the Power Mode of Storage Disks Based on Redundancy and System Load
Multi-Layer Coded Modulation for Non-Ergodic Block Fading Channels
Nonlinear Precoding in Code-Division Multiple Access Communication System
Automated Modeling and Tracking of Transaction Flow Dynamics for Fault Detection in Complex Systems
Triplexer Transceiver Using Parallel Signal Detection
Information Retrieval Architecture for Packet Classification
Method and Apparatus for Medium Access Control for a Decentralized Network with Adapted Beamforming and Power Control
Test Output Compaction with Improved Blocking of Unknown Values
Superimposed Training for Multiple Antenna Communications
Measurement-Based Admission Control for Wireless Packet Data Services
Method and Apparatus for Cross Layer Resource Allocation for Wireless Backhaul Networks
Method and Apparatus for Testing Logic Circuit Designs
Method and Apparatus for Structured Asic Test Point Insertion
Method and System Usable in Sensor Networks for Handling Memory Faults
Voice-Based Multimodal Speaker Authentication Using Adaptive Training and Applications Thereof
Flexible Wrapper Architecture for Tiled Networks on a Chip
On-Off Keying - 7-Phase Shift Keying Modulation System and Method for Fiber Communication
Method for Generating, from a Test Cube Set, a Generator Configured to Generate a Test Pattern
Method and Apparatus for Testing Logic Circuit Designs
Related Assignments
(20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 29, 2002
From: ZHANG, JUNBIAO
To: NEC USA, INC.
Reel/Frame 012740/0151 →
Assignment of Assignor's Interest
Apr 12, 2002
From: WEINSTEIN, STEPHEN B.; ZHANG, JUNBIAO; LI, JUN; TU, NAN
To: NEC USA, INC.
Reel/Frame 012784/0015 →
Assignment of Assignor's Interest
Jul 19, 2002
From: WANG, SEONGMOON; CHAKRADHAR, SRIMAT T.; BALAKRISHNAN, KEDARNATH J.
To: NEC USA, INC.
Reel/Frame 013115/0579 →
Assignment of Assignor's Interest
Apr 11, 2003
From: NEC USA, INC.
To: NEC CORPORATION
Reel/Frame 013926/0288 →
Assignment of Assignor's Interest
Jun 23, 2004
From: MOON, HANKYU; MILLER, MATTHEW L
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 014766/0186 →
Assignment of Assignor's Interest
Aug 11, 2004
From: LEKATSAS, HARIS; HENKEL, JOERG; CHAKRADHAR, SRIMAT T; JAKKULA, VENKATA
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 014973/0040 →
Assignment of Assignor's Interest
Mar 15, 2005
From: WANG, XIAODONG; MADIHIAN, MOHAMMAD
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 015777/0853 →
Assignment of Assignor's Interest
Mar 30, 2005
From: MILLER, MATTHEW L.
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 016464/0244 →
Assignment of Assignor's Interest
Nov 28, 2005
From: DUBNICKI, CEZARY
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 016820/0357 →
Assignment of Assignor's Interest
Nov 28, 2005
From: PINHEIRO, EDUARDO; BIANCHINI, RICARDO
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 016820/0363 →
Assignment of Assignor's Interest
Dec 5, 2005
From: LU, BEN; WANG, XIAODONG; MADIHIAN, MOHAMMAD
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 016853/0306 →
Assignment of Assignor's Interest
Dec 5, 2005
From: WANG, XIAODONG; MADIHIAN, MOHAMMAD
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 016853/0314 →
Assignment of Assignor's Interest
Mar 1, 2006
From: JIANG, GUOFEI; CHEN, HAIFENG; UNGUREANU, CRISTIAN; YOSHIHIRA, KENJI
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 017232/0364 →
Assignment of Assignor's Interest
Apr 17, 2006
From: XU, LEI; ZONG, LEI; JI, PHILIP NAN; WANG, TING
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 017479/0356 →
Assignment of Assignor's Interest
Apr 17, 2006
From: ABE, YUJI
To: NEC CORPORATION
Reel/Frame 017479/0016 →
Assignment of Assignor's Interest
Apr 18, 2006
From: WANG, SEONGMOON; BALAKRISHNAN, KEDARNATH; CHAKRADHAR, SRIMAT T
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 017488/0109 →
Assignment of Assignor's Interest
Apr 18, 2006
From: CADAMBI, SRIHARI; CHAKRADHAR, SRIMAT T
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 017488/0137 →
Assignment of Assignor's Interest
Apr 18, 2006
From: KIM, SEUNG-JUN; WANG, XIAODONG; MADIHIAN, MOHAMMAD
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 017494/0530 →
Assignment of Assignor's Interest
Jun 13, 2006
From: SANG, AIMIN; WANG, XIAODONG; MADIHIAN, MOHAMMAD
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 017772/0240 →
Assignment of Assignor's Interest
Jul 26, 2006
From: WANG, JIBING; WANG, XIAODONG; MADIHIAN, MOHAMMAD
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 017999/0453 →