IP Library › Granted Patent US 8,337,960
Granted Patent B2
US 8,337,960 · App. 12/282,475 · Granted Dec 25, 2012

Seasoning method for film-forming apparatus

Assignee: Mitsubishi Heavy Industries, Ltd.
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Quick Facts
Patent No.
US 8,337,960
App. No.
12/282,475
Granted
Dec 25, 2012
Kind
B2
Abstract

A seasoning method for a film-forming apparatus configured to form a silicon nitride film on a substrate placed in a process chamber. The method is conducted for reducing particles in the apparatus. The method comprises executing the plasma cleaning of the process chamber to remove a film deposited on the inner wall thereof (step S 1 ), subsequently depositing an amorphous silicon film (step S 2 ), depositing thereon a silicon nitride film in which the nitrogen content gradually increases in the thickness direction (step S 3 ), and keeping the inside of the process chamber being filled with a rare-gas plasma until film formation on the substrate is initiated (step S 4 ).

Claims (7)

1. A seasoning method for a silicon nitride film-forming apparatus configured to make an electromagnetic wave incident on a processing chamber of the silicon nitride film-forming apparatus from an antenna of a circular ring shape disposed outside the processing chamber through an electromagnetic wave transmissive window provided on the processing chamber and thus to convert a silicon-containing gas and a nitrogen-containing gas supplied into the processing chamber into a plasma state, thereby forming a silicon nitride film on a substrate placed in the processing chamber, characterized by comprising the steps of:

supplying a cleaning gas into the processing chamber, and etching the silicon nitride film attached to an inner wall of the processing chamber while converting the cleaning gas into a plasma state;

supplying the silicon-containing gas into the processing chamber, and depositing an amorphous silicon film on the inner wall of the processing chamber while converting the silicon-containing gas into a plasma state;

supplying the silicon-containing gas into the processing chamber, while supplying the nitrogen-containing gas in a gradually increasing manner up to a predetermined flow rate, and thus depositing, on the amorphous silicon film, a silicon nitride film with the nitrogen content gradually increasing in a thickness direction, while converting the silicon-containing gas and the nitrogen-containing gas into a plasma state; and

supplying a rare gas into the processing chamber and maintaining a plasma state of the rare gas until film formation of the silicon nitride film on the substrate is initiated including a period of conveying the substrate to the processing chamber.

2. The seasoning method for a silicon nitride film-forming apparatus according to claim 1 ,

characterized in that the nitrogen-containing gas is supplied in a gradually increasing manner up to the predetermined flow rate gently in the beginning and more rapidly thereafter when depositing the silicon nitride film on the amorphous silicon film.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2009
From: SHIMAZU, TADASHI; KAWANO, YUICHI
To: MITSUBISHI HEAVY INDUSTRIES, LTD.
Reel/Frame 022637/0884 →
Priority Claims (1)
JP 2006-065415 · Mar 10, 2006 · national
Continuity (1)
Related Publication 20090242511A1 · Oct 1, 2009