IP Library Granted Patent US 7,993,453
Granted Patent B2
US 7,993,453 · App. 12/301,383 · Granted Aug 9, 2011

Method for producing silicon carbide single crystal

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,993,453
App. No.
12/301,383
Granted
Aug 9, 2011
Kind
B2
Abstract

A method for the production of an SiC single crystal includes the steps of growing a first SiC single crystal in a first direction of growth on a first seed crystal formed of an SiC single crystal, disposing the first SiC single crystal grown on the first seed crystal in a direction parallel or oblique to the first direction of growth and cutting the disposed first SiC single crystal in a direction of a major axis in a cross section perpendicular to the first direction of growth to obtain a second seed crystal, using the second seed crystal to grow thereon in a second direction of growth a second SiC single crystal to a thickness greater than a length of the major axis in the cross section, disposing the second SiC single crystal grown on the second seed crystal in a direction parallel or oblique to the second direction of growth and cutting the disposed second SiC single crystal in a direction of a major axis in a cross section perpendicular to the second direction of growth to obtain a third seed crystal, using the third seed crystal to grow thereon a third SiC single crystal, and cutting the third SiC single crystal grown on the third seed crystal in such a manner as to expose a {0001} crystal face, thereby obtaining an SiC single crystal. The method enables the crystal to be enlarged efficiently without impairing crystallinity.

Claims (12)

1. A method for the production of an SiC single crystal, comprising the steps of:

growing a first SiC single crystal in a first direction of growth on a first seed crystal formed of an SiC single crystal;

disposing the first SiC single crystal grown on the first seed crystal in a direction parallel or oblique to the first direction of growth and cutting the disposed first SiC single crystal in a direction of a major axis in a cross section perpendicular to the first direction of growth to obtain a second seed crystal;

using the second seed crystal to grow thereon in a second direction of growth a second SiC single crystal to a thickness greater than a length of the major axis in the cross section;

disposing the second SiC single crystal grown on the second seed crystal in a direction parallel or oblique to the second direction of growth and cutting the disposed second SiC single crystal in a direction of a major axis in a cross section perpendicular to the second direction of growth to obtain a third seed crystal;

using the third seed crystal to grow thereon a third SiC single crystal; and

cutting the third SiC single crystal grown on the third seed crystal in such a manner as to expose a {0001} crystal face, thereby obtaining an SiC single crystal.

2. A method for the production of an SiC single crystal according to claim 1 , wherein the first SiC single crystal is grown on the first seed crystal in a thickness greater than a diameter of a surface of the first seed crystal.

3. A method for the production of an SiC single crystal according to claim 1 , wherein the direction parallel or oblique to the first or second direction of growth has an angle of 0° or more and less than 90° from the first or second direction of growth.

4. A method for the production of an SiC single crystal according to claim 1 , wherein the third SiC single crystal grown has a thickness greater than a length of a major axis of a surface of the third seed crystal.

5. A method for the production of an SiC single crystal according to claim 1 , wherein the seed crystal is obtained by any of the steps of growing in the method of claim 1 .

6. A method for the production of an SiC single crystal according to claim 1 , wherein the SiC single crystal is grown by having a temperature of a crystal-growing part of the seed crystal set in a range of 1800° C. to 2300° C. and a temperature of a raw material of SiC single crystal set in a range of 2000° C. to 2400° C. and at a level higher than the temperature of the crystal-growing part.

Assignments (3)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CHANGE OF NAME Recorded Jun 23, 2023
From: SHOWA DENKO K.K.
To: RESONAC CORPORATION
Reel/Frame 064082/0513 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2009
From: OYANAGI, NAOKI; SYOUNAI, TOMOHIRO; SAKAGUCHI, YASUYUKI
To: SHOWA DENKO K.K.
Reel/Frame 022190/0889 →