IP Library Granted Patent US 8,782,574
Granted Patent B2
US 8,782,574 · App. 12/322,489 · Granted Jul 15, 2014

System for simplifying layout processing

Inventors: Youping Zhang (Fremont, CA); Weinong Lai (Fremont, CA)
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Quick Facts
Patent No.
US 8,782,574
App. No.
12/322,489
Granted
Jul 15, 2014
Kind
B2
Abstract

A system and method for integrated circuit design are disclosed to enhance manufacturability of circuit layouts by applying layout processing to handle imperfections such as jogs in integrated circuit design layouts. The layout processing may be applied to jogs in the original integrated circuit design layout or jogs created post-design by process biases, as well as design rule check and Boolean processes or process compensation.

Claims (48)

1. An integrated circuit design layout processing system having computer software for processing a design layout including a plurality of geometries, the computer software comprising:

code for receiving the design layout;

code for creating a modified layout by applying a first process to a portion of the design layout having one or more geometries of the plurality of geometries of the design layout as a starting point, wherein the first process comprises smoothing at least one geometry of the design layout;

code for sequentially further modifying the portion of the design layout by applying a second process to the modified layout as a starting point to create a further modified layout;

code for effecting correction by applying the second process while targeting the design layout as a target to produce a corrected layout; and

code for outputting the corrected layout.

2. The integrated circuit design layout processing system of claim 1 wherein the first process is a process that removes jogs.

3. The integrated circuit design layout processing system of claim 1 wherein the second process is a process that performs optical proximity correction that dissects the modified layout into at least two segments, and corrects by targeting the design layout.

4. The integrated circuit design layout processing system of claim 1 wherein the second process is a process that performs phase-shifting mask creation based on the modified layout and recovers the design layout by patching phase shifter placements to target the design layout.

5. The integrated circuit design layout processing system of claim 1 wherein the second process is a process that performs layer operations based on the modified layout and recovers the design layout by patching the layer operation outputs to target the design layout.

6. The integrated circuit design layout processing system of claim 1 wherein the design layout is a design tape-out in the form of a GDS or OASIS file.

7. An integrated circuit design layout processing method for processing a design layout including a plurality of geometries, comprising:

receiving the design layout;

creating a modified layout by applying a first process to a portion of the design layout having one or more geometries of the plurality of geometries of the design layout as a starting point, wherein the first process comprises smoothing at least one geometry of the design layout;

sequentially further modifying the portion of the design layout by applying a second process to the modified layout as a starting point to create a further modified layout;

effecting correction by applying the second process while targeting the design layout as a target to produce a corrected layout; and

outputting the corrected layout.

8. The integrated circuit design layout processing method of claim 7 wherein the first process is a process that removes jogs.

9. The integrated circuit design layout processing method of claim 7 wherein the second process is a process that performs optical proximity correction that dissects the modified layout into at least two segments, and corrects by targeting the design layout.

10. The integrated circuit design layout processing method of claim 7 wherein the second process is a process that performs phase-shifting mask creation based on the modified layout and recovers the design layout by patching phase shifter placements to target the design layout.

11. The integrated circuit design layout processing method of claim 7 wherein the second process is a process that performs layer operations based on the modified layout and recovers the design layout by patching the layer operation outputs to target the design layout.

12. The integrated circuit design layout processing method of claim 7 wherein the design layout is a design tape-out in the form of a GDS or OASIS file.

13. An integrated circuit design layout processing system having computer software for processing a design layout including a plurality of geometries, the computer software comprising:

code for receiving the design layout;

code for creating a modified layout by applying a first process to a portion of the design layout having one or more geometries of the plurality of geometries of the design layout as a starting point, wherein the first process comprises smoothing at least one geometry of the design layout;

code for sequentially modifying the modified layout by applying a second process to the modified layout using the design layout as a starting point to create a further modified layout;

code for effecting correction by applying the second process while targeting the modified layout as a target to produce a corrected layout; and

code for outputting the corrected layout.

14. The integrated circuit design layout processing system of claim 13 wherein the first process is rule-based optical proximity correction.

15. The integrated circuit design layout processing system of claim 13 wherein the second process is model-based optical proximity correction.

16. The integrated circuit design layout processing system of claim 13 wherein the first process is process bias.

17. The integrated circuit design layout processing system of claim 13 wherein the first process is DRC or Boolean operations.

18. The integrated circuit design layout processing system of claim 13 wherein the second process is a process that performs phase-shifting mask creation based on the design layout and further comprising code for recovering the modified layout by patching phase shifter placements to target the modified layout.

19. The integrated circuit design layout processing system of claim 13 wherein the second process is a process that performs layer operations based on the design layout and further comprising code for recovering the modified layout by, patching the layer operation outputs to target the modified layout.

20. The integrated circuit design layout processing system of claim 13 wherein the design layout is a design tape-out in the form of a GDS or OASIS file.

21. An integrated circuit design layout processing method for processing a design layout including a plurality of geometries, comprising:

receiving the design layout;

creating a modified layout by applying a first process to a portion of the design layout having one or more geometries of the plurality of geometries of the design layout as a starting point, wherein the first process comprises smoothing at least one geometry of the design layout;

sequentially modifying the modified layout by applying a second process to the modified layout using the design layout as a starting point to create a further modified layout;

effecting correction by applying the second process while targeting the modified layout as a target to produce a corrected layout; and

outputting the corrected layout.

22. The integrated circuit design layout processing method of claim 21 wherein the first process is rule-based optical proximity correction.

23. The integrated circuit design layout processing method of claim 21 wherein the second process is model-based optical proximity correction.

24. The integrated circuit design layout processing method of claim 21 wherein the first process is process bias.

25. The integrated circuit design layout processing method of claim 21 wherein the first process is DRC or Boolean operations.

26. The integrated circuit design layout processing method of claim 21 wherein the second process is a process that performs phase-shifting mask creation based on the design layout and recovers the modified layout by patching phase shifter placements to target the modified layout.

27. The integrated circuit design layout processing method of claim 21 wherein the second process is a process that performs layer operations based on the design layout and recovers the modified layout by patching the layer operation outputs to target the modified layout.

28. The integrated circuit design layout processing method of claim 21 wherein the design layout is a design tape-out in the form of a GDS or OASIS file.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 10, 2021
From: APPLIED MATERIALS SOUTH EAST ASIA PTE. LTD.
To: APPLIED MATERIALS, INC.
Reel/Frame 057131/0770 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2021
From: SAGANTEC ISRAEL LTD.; TAKUMI TECHNOLOGY CORPORATION
To: APPLIED MATERIALS SOUTH EAST ASIA PTE. LTD.
Reel/Frame 057010/0059 →
Continuity (3)
Division 11091067 · Mar 28, 2005
Provisional Application 60557809 · Mar 30, 2004
Related Publication 20090241087A1 · Sep 24, 2009