IP Library Granted Patent US 8,092,606
Granted Patent B2
US 8,092,606 · App. 12/334,135 · Granted Jan 10, 2012

Deposition apparatus

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Quick Facts
Patent No.
US 8,092,606
App. No.
12/334,135
Granted
Jan 10, 2012
Kind
B2
Abstract

A deposition apparatus configured to form a thin film on a substrate includes: a reactor wall; a substrate support positioned under the reactor wall; and a showerhead plate positioned above the substrate support. The showerhead plate defines a reaction space together with the substrate support. The apparatus also includes one or more gas conduits configured to open to a periphery of the reaction space at least while an inert gas is supplied therethrough. The one or more gas conduits are configured to supply the inert gas inwardly toward the periphery of the substrate support around the reaction space. This configuration prevents reactant gases from flowing between a substrate and the substrate support during a deposition process, thereby preventing deposition of an undesired thin film and impurity particles on the back side of the substrate.

Claims (28)

1. A deposition apparatus, comprising:

a reactor wall;

a substrate support positioned under the reactor wall, the substrate support being configured to support a substrate and comprising a gas blocking clamp positioned over a periphery of the substrate support, the gas blocking clamp being vertically movable, wherein the gas blocking clamp defines one or more openings between the substrate support and gas blocking clamp when moved up;

a reaction space defined over the substrate support; and

one or more gas conduits configured to open to a periphery of the reaction space at least while an inert gas is supplied therethrough, the one or more gas conduits being configured to supply the inert gas inwardly toward the substrate around the periphery of the substrate support, wherein the inert gas exits outwardly soon after passing over the periphery of the substrate.

2. The apparatus of claim 1 , wherein the one or more gas conduits include one or more peripheral openings that open to the periphery of the reaction space, the one or more peripheral openings together substantially surrounding all sides of the reaction space.

3. The apparatus of claim 1 , wherein the gas blocking clamp is configured to be moved up by the inert gas, and to be moved down when the inert gas is not supplied.

4. The apparatus of claim 1 , wherein the reactor wall comprises an inner wall and an outer wall surrounding the inner wall, and wherein the inner wall and the outer wall have a gap therebetween, the gap forming a portion of the one or more gas conduits.

5. The apparatus of claim 4 , wherein the gas blocking clamp comprises a portion positioned under the inner wall, and wherein the portion of the gas blocking clamp is configured to contact a bottom surface of the inner wall when the gas blocking clamp is moved up, and to be spaced apart from the bottom surface of the inner wall when the gas blocking clamp is moved down.

6. The apparatus of claim 1 , wherein the gas blocking clamp comprises a portion positioned over the substrate, and wherein the portion of the gas blocking clamp is spaced apart from the substrate when the gas blocking clamp is moved up such that the one or more conduits are open to the periphery of the reaction space.

7. The apparatus of claim 6 , wherein the gas blocking clamp is configured to contact the substrate when the inert gas is not supplied.

8. The apparatus of claim 1 , further comprising a gas blocking clamp rim laterally surrounding the gas blocking clamp, the gas blocking clamp rim being interposed between a bottom surface of the reactor wall and a top surface of the substrate support.

9. The apparatus of claim 8 , wherein the gas blocking clamp rim is configured to contact the bottom surface of the reactor wall and the top surface of the substrate support.

10. The apparatus of claim 8 , wherein the gas blocking clamp rim has a first height, and wherein the gas blocking clamp has a second height, the second height being smaller than the first height.

11. The apparatus of claim 10 , wherein the second height is smaller than the first height by about 0.1 mm to about 5 mm.

12. The apparatus of claim 1 , wherein the gas blocking clamp is vertically movable between a first vertical level and a second vertical level, a distance between the first and second vertical levels being about 0.1 mm to about 5 mm.

13. The apparatus of claim 1 , wherein the gas blocking clamp is configured to be spaced apart from the substrate support by about 0.1 mm to about 5 mm when moved up.

14. The apparatus of claim 2 , further comprising a showerhead plate positioned above the substrate support, the showerhead plate defining the reaction space together with the substrate support.

15. The apparatus of claim 14 , further comprising an exhaust passage open to the reaction space above the one or more peripheral openings, wherein the gas blocking clamp and the showerhead plate together define a portion of the exhaust passage.

16. The apparatus of claim 2 , further comprising a gas blocking clamp positioned over the periphery of the substrate support, the gas blocking clamp being vertically spaced apart from the substrate support to define the one or more openings.

17. The apparatus of claim 16 , wherein the gas blocking clamp is mechanically fixed to the reactor wall.

18. A deposition apparatus, comprising:

a reactor wall;

a substrate support positioned under the reactor wall, the substrate support being configured to support a substrate;

a reaction space defined over the substrate support;

one or more gas conduits configured to open to a periphery of the reaction space at least while an inert gas is supplied therethrough, the one or more gas conduits being configured to supply the inert gas inwardly toward the substrate around the periphery of the substrate support, wherein the inert gas exits outwardly soon after passing over the periphery of the substrate, wherein the one or more gas conduits include one or more peripheral openings that open to the periphery of the reaction space, the one or more peripheral openings together substantially surrounding all sides of the reaction space; and

a gas blocking clamp positioned over the periphery of the substrate support, the gas blocking clamp being vertically spaced apart from the substrate support to define the one or more openings, wherein the gas blocking clamp is formed integrally with the reactor wall.

19. The apparatus of claim 1 , wherein the inert gas has a flow rate of about 10 sccm to about 3,000 sccm.

Assignments (2)
CHANGE OF NAME Recorded Mar 21, 2019
From: ASM GENITECH KOREA, LTD.
To: ASM KOREA LTD.
Reel/Frame 048658/0249 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2008
From: PARK, HYUNG SANG; CHOI, SEUNG WOO; KIM, JONG SU; JUNG, DONG RAK; LEE, JEONG HO; LEE, CHUN SOO
To: ASM GENITECH KOREA LTD.
Reel/Frame 022017/0330 →