APPARATUS FOR CONTROLLING SEMICONDUCTOR CHIP CHARACTERISTICS
Apparatus including functional components of circuitry defined on a semiconductor chip, the functional components including a component having modifiable operating characteristics, a performance measuring circuit providing an output indicative of operating characteristics of the circuitry defined on the semiconductor chip during operation of the circuitry, and computer implemented software means for controlling a value for an operating characteristic of the component having modifiable operating characteristics in response to the output provided by the performance measuring circuit.
1 - 2 . (canceled)
3 . An apparatus comprising:
an electronic circuit defined on a semiconductor chip, wherein the electronic circuit includes modifiable operating characteristics;
a performance measuring component configured to provide an output indicative of operating characteristics of the electronic circuit; and
software configured to control a value of at least one of the modifiable operating characteristics of the electronic circuit.
4 . The apparatus of claim 3 , wherein the software is further configured to select clock delays of the electronic circuit so that the timing of data transfer made with respect to a clock signal is controlled.
5 . The apparatus of claim 3 , wherein the performance measuring component comprises ring oscillators.
6 . The apparatus of claim 3 , wherein the modifiable operating characteristics are configured to be modified by selecting clock delays that are managed so that the timing of data transfer made with respect to a clock signal is controlled.
7 . The apparatus of claim 3 , wherein the modifiable operating characteristics are configured to be measured utilizing a ring oscillator.
8 . The apparatus of claim 3 , wherein the electronic circuit is configured to provide an output signal that is provided as input to circuitry located on a different semiconductor chip than the electronic circuit.
9 . The apparatus of claim 8 , wherein the software is further configured to affect interface characteristics of the output signal.
10 . A semiconductor chip, comprising:
an input electronic circuit;
function performing circuitry defined on the semiconductor chip and coupled to the input electronic circuit;
an operating characteristic controlling apparatus coupled to the function performing electronic circuit and including:
a performance measuring component configured to provide an output indicative of operating characteristics of the function performing circuitry; and
a software-implemented component configured to control a value of at least one of a set of modifiable operating characteristics of the function performing circuitry; and
output circuitry coupled to the function performing circuitry.
11 . The semiconductor chip of claim 10 , wherein the software-implemented component is configured to control the value by selecting clock delays that are managed so that the timing of data transfer made with respect to a clock signal is controlled.
12 . The semiconductor chip of claim 10 , wherein the performance measuring component comprises ring oscillators.
13 . The semiconductor chip of claim 10 , wherein the set of modifiable operating characteristics are configured to be modified by selecting clock delays that are managed so that the timing of data transfer made with respect to a clock signal is controlled.
14 . The semiconductor chip of claim 10 , wherein the set of modifiable operating characteristics are configured to be measured utilizing a ring oscillator.
15 . The semiconductor chip of claim 10 , wherein the function performing circuitry is configured to provider an output signal that is provided as input to circuitry located on a different semiconductor chip.
16 . The semiconductor chip of claim 15 , wherein the software-implemented component is configured to affect interface characteristics of the output signal.
17 . An apparatus comprising:
means for providing an output indicative of operating characteristics of circuitry defined on a semiconductor chip; and
means, comprising software-implemented means, for controlling a value of at least one of a set of modifiable operating characteristic.
18 . (canceled)
19 . The apparatus of claim 17 , wherein the means for controlling a value is configured to select clock delays that are managed so that the timing of data transfer made with respect to a clock signal is controlled.
20 . The apparatus of claim 17 , wherein the means for providing an output indicative of operating characteristics comprises ring oscillators.
21 . The apparatus of claim 17 , wherein the set of modifiable operating characteristics are measured utilizing a ring oscillator.
22 . The apparatus of claim 17 , wherein the circuitry is configured to provides an output signal that is provided as input to circuitry located on a different semiconductor chip.